GS71116ATP/J/U
SOJ, TSOP, FP-BGA
Commercial Temp
Industrial Temp
Features
• Fast access time: 7, 8, 10, 12 ns
• CMOS low power operation: 145/125/100/85 mA at
minimum cycle time
• Single 3.3 V power supply
• All inputs and outputs are TTL-compatible
• Byte control
• Fully static operation
• Industrial Temperature Option:
–40°
to 85°C
• Package line up
J:
400 mil, 44-pin SOJ package
GJ: RoHS-compliant 400 mil, 44-pin SOJ package
TP: 400 mil, 44-pin TSOP Type II package
GP: RoHS-compliant 400 mil, 44-pin TSOP Type II
package
U: 6 mm x 8 mm Fine Pitch Ball Grid Array package
GU: RoHS-compliant 6 mm x 8 mm Fine Pitch Ball Grid
Array package
A
4
A
3
A
2
A
1
A
0
CE
DQ
1
DQ
2
DQ
3
DQ
4
V
DD
V
SS
DQ
5
DQ6
DQ7
DQ
8
WE
A
15
A
14
A
13
A
12
NC
64K x 16
1Mb Asynchronous SRAM
7, 8, 10, 12 ns
3.3 V V
DD
Center V
DD
and V
SS
SOJ 64K x 16-Pin Configuration
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
A
5
A
6
A
7
OE
UB
LB
DQ
16
DQ
15
DQ
14
DQ
13
V
SS
V
DD
DQ
12
DQ
11
DQ
10
DQ
9
NC
A
8
A
9
A
10
A
11
NC
Top view
44-pin
SOJ
Description
The GS71116A is a high speed CMOS static RAM organized
as 65,536-words by 16-bits. Static design eliminates the need
for external clocks or timing strobes. Operating on a single
3.3 V power supply and all inputs and outputs are TTL-
compatible. The GS71116A is available in a 6 mm x 8 mm
Fine Pitch BGA package, as well as in 400 mil SOJ and 400
mil TSOP Type-II packages
.
Package J
Fine Pitch BGA 64K x 16-Bump Configuration
1
2
3
4
5
6
Pin Descriptions
Symbol
A
0
–A
15
DQ
1
–DQ
16
CE
LB
UB
WE
OE
V
DD
V
SS
NC
Description
Address input
Data input/output
Chip enable input
Lower byte enable input
(DQ1 to DQ8)
Upper byte enable input
(DQ9 to DQ16)
Write enable input
Output enable input
+3.3 V power supply
Ground
No connect
A
B
C
D
E
F
G
H
LB
DQ
16
OE
UB
A
0
A
3
A
5
NC
NC
A
8
A
10
A
13
A
1
A
4
A
6
A
7
NC
A
9
A
11
A
14
A
2
CE
DQ
2
DQ
4
DQ
5
DQ
7
WE
A
15
NC
DQ
1
DQ
3
DQ
14
DQ
15
V
SS
DQ
13
V
DD
DQ
12
DQ
11
DQ
10
DQ
9
NC
NC
A
12
V
DD
V
SS
DQ
6
DQ
8
NC
6 mm x 8 mm, 0.75 mm Bump Pitch (Package U)
Top View
1/15
© 2001, GSI Technology
Rev: 1.09 10/2007
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS71116ATP/J/U
Truth Table
CE
H
OE
X
WE
X
LB
X
L
UB
X
L
H
L
L
H
L
X
H
DQ
1
to DQ
8
Not Selected
Read
Read
High Z
Write
Write
Not Write, High Z
High Z
High Z
DQ
9
to DQ
16
Not Selected
Read
High Z
Read
Write
Not Write, High Z
Write
High Z
High Z
V
DD
Current
ISB
1
, ISB
2
L
L
H
L
H
L
L
X
L
L
H
I
DD
L
L
Note:
X: “H” or “L”
H
X
H
X
X
H
Absolute Maximum Ratings
Parameter
Supply Voltage
Input Voltage
Output Voltage
Allowable power dissipation
Storage temperature
Symbol
V
DD
V
IN
V
OUT
PD
T
STG
Rating
–0.5 to +4.6
–0.5 to V
DD
+0.5
(≤ 4.6 V max.)
–0.5 to V
DD
+0.5
(≤ 4.6 V max.)
0.7
–55 to 150
Unit
V
V
V
W
o
C
Note:
Permanent device damage may occur if Absolute Maximum Ratings are exceeded. Functional operation shall be restricted to Recommended
Operating Conditions. Exposure to higher than recommended voltages for extended periods of time could affect device reliability.
Rev: 1.09 10/2007
3/15
© 2001, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS71116ATP/J/U
Recommended Operating Conditions
Parameter
Supply Voltage for -7/-8/-10/-12
Input High Voltage
Input Low Voltage
Ambient Temperature,
Commercial Range
Ambient Temperature,
Industrial Range
Symbol
V
DD
V
IH
V
IL
T
Ac
T
A
I
Min
3.0
2.0
–0.3
0
–40
Typ
3.3
—
—
—
—
Max
3.6
V
DD
+0.3
0.8
70
85
Unit
V
V
V
o
C
C
o
Notes:
1. Input overshoot voltage should be less than V
DD
+2 V and not exceed 20 ns.
2. Input undershoot voltage should be greater than –2 V and not exceed 20 ns.
Capacitance
Parameter
Input Capacitance
Output Capacitance
Symbol
C
IN
C
OUT
Test Condition
V
IN
= 0 V
V
OUT
= 0 V
Max
5
7
Unit
pF
pF
Notes:
1. Tested at T
A
= 25°C, f = 1 MHz
2. These parameters are sampled and are not 100% tested.
DC I/O Pin Characteristics
Parameter
Input Leakage Current
Output Leakage
Current
Output High Voltage
Output Low Voltage
Symbol
I
IL
I
LO
V
OH
V
OL
Test Conditions
V
IN
= 0 to V
DD
Output High Z
V
OUT
= 0 to V
DD
I
OH
= –4 mA
I
LO
= +4 mA
Min
–1 uA
–1 uA
2.4
Max
1uA
1uA
0.4V
Rev: 1.09 10/2007
4/15
© 2001, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
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