3535 LCR HiTESTER
Component measuring instruments
HEAD AMP UNIT
Measure across the broad frequency range of 100kHz to 120MHz
with the new Model
3535 LCR HiTESTER.
The 6ms high-
speed measurement capability is particularly useful with the built-
in comparator and load functions, and for BIN (classification)
measurements, to suit a wide range of applications such as chip
inductor and high speed magnetic head testing, as well as other
related research needs. Achieve ultimate measurement flexibility
by detaching the head amp unit from the main unit and placing
it in proximity to the test object so as to minimize the effect of
test leads on measurements. The 3535's low price, ideal size and
light weight are all achieved by incorporating an automatically
balanced bridge circuit with digital control. Never before has
such an advanced precision instrument coupled with economical
features been placed on the test and measurement market.
1
Detachable Head Amp
Detach the Head Amp Unit from the 3535 and
extend its reach to the measurement object
using a dedicated cable so as to minimize the
effect of measurement leads.
3535 MAIN UNIT
9678 CONNECTION CABLE
HEAD AMP UNIT
Broad Frequency Measurement Range
The measurement frequency is set with four-digit resolution
from 100 kHz to 120 MHz.
BIN (Classification) Measurement
Using up to ten classifications of two measurements, measurement
values can be easily classified by rank.
6-millisecond Minimum Measurement Time
Four sampling rates can be selected: FAST, NORMAL, SLOW
and SLOW2. The minimum measurement time of about 6
ms (displaying |Z|) provides rapid sampling for optimum
production line efficiency.
(The measurement frequency range depends on the measured
parameter type).
Continuous Measurements
Store up to 30 sets of measurement conditions. Of multiple
conditions stored in memory, up to five measurements can
be made sequentially per condition saved on the screen.
With the comparator function, the results of a sequence of
measurements can be logically ANDed and output from a
single instrument.
14 Parameter Types
The following parameters can be measured, and selected
parameters can be captured using a PC. |Z|, |Y|,
θ,
Rp, Rs
(ESR), G, X, B, Lp, Ls, Cp, Cs, D (tanδ) and Q.
Load Compensation Function
A standard component can be measured to obtain a compensation
amount to be applied to subsequent measurement values.
This function is useful for matching measurement values
between different instruments.
Adjust for Conditions While Measuring
Measurement frequency, signal level and other conditions can
be changed while monitoring measurement values, showing the
effects of trial measurements and test condition settings.
For Changing Production Lines
Utilize the ability to store up to 30 sets of measurement conditions,
including comparator values, to provide rapid response to frequent
component changes on flexible production lines.
Store Measurement Data
Up to 200 measurement values can be stored in the main unit.
Saved values can be transferred to a computer or printed all at
once.
Simultaneously Measure up to 4 Parameters
Any four of fourteen parameter types can be selected for
simultaneous measurement and display.
Zoom Display
Up to four parameters can be displayed enlarged, for easy
observation of the measurement values on production lines and
in other situations where the display has to be monitored from
a distance.
Correlation Compensation Function
The constants a and b can be set in the following compensation
function expression:
Compensation value = a
×
measurement value + b
Printer Output
With the optional
9442 PRINTER,
measurement values,
comparator results and screen data can be printed.
2
Automatically Balanced Bridge Circuit with Digital Control
■
EXT I/O
Externally control triggering and loading of measurement
conditions, and for automated lines, configure output signals
including comparator results and end-of-measurement signals
at the touch of a button.
EXT I/O Signals
●
Outputs
• Internal DC Power (+5 V output)
• Comparator Results
• BIN (Classification) Measurement Results
• End-of-Measurement Signal
●
Inputs
• External DC Power Supply (+5 to 24 V can be provided by
an external source)
• External Trigger Signal
• Selection of Panels for Loading
Timing Chart for EXT I/O Sequencing
The following chart shows the timing sequence of the trigger
(TRIG), end-of-measurement (EOM) signals and comparator
result signals from the EXT I/O connector.
Minimum trigger time
Minimum time from measurement
completion to next trigger
Circuit response time
Measurement time: 6 ms∗2
Previous test result
Clear previous test result
Test result
∗
1.
α
depends on the component and trigger delay.
* 2. Reference value with FAST measurement speed, Averaging OFF and Z measurement selected.
External Control using a PC
Both RS-232C and GP-IB interfaces are included for external
control of all functions (except Power ON/OFF of the 3535
main unit) from a computer.
■
RS-232C Interface
Transfer Method:
Communications Method:Full Duplex,
Synchronization Method:Start-Stop Asynchronous
Transfer Speed:
9,600 or 19,200 bps
Data Length:
8 bits
Parity:
none
Stop Bit:
1 bit
Delimiter:
CR+LF or CR
Flow Control:
none
Connector:
9-pin D-sub male, reverse wired
Any voltage from 100 to 240 VAC
Keylock key prevents unintended operations
from inadvertent touching of display panel
■
GP-IB Interface
Supported Standard: IEEE-488.1 1987
IEEE-488.2 1987 common (required) commands can be used.
GP-IB Interface
EXT.I/O
RS-232C Interface
3535 Rear View
Measurement Principle
Automatically Balanced Bridge Circuit with Digital Control
The measurement signal is generated by a primary oscillator and applied to the component (DUT). The LOW terminal
voltage is measured and used to control the phase and amplitude of a secondary oscillator so as to maintain a balanced
condition (LOW terminal voltage being zero). The impedance Z and phase angle
θ
of the DUT
are determined according to the amplitude and
phase required to maintain the secondary
Rout HIGH
LOW
Rf
oscillator in its balanced condition.
Zdut
Primary Oscillator
Secondary Oscillator
CPU Bridge Circuit
CPU
Amplitude and Phase Control
3
Changing Settings While Measuring
Simple Touch Panel Operation
Make all measurement condition settings from
the easy-to-use touch panel. Active keys appear
in reverse video, providing simple, dialog-type
operation by lightly touching the item or number
to be set. Real-time display of measurement
data on the settings screen provide convenient
monitoring while changing test signal settings.
Zoom display up to 4 parameters for enhanced
visibility at a distance on production lines.
Note: The screens show typical examples on the 3535.
Initial Screen
Shows measurement values for any four selected
parameters, and the current setting conditions.
Parameter Setting Screen
Select any four of the fourteen parameter
types for display.
Menu Screen
Select an item to display the corresponding
setting screen.
Measurement Frequency Setting Screen
Measurement Level Setting Screen
Use the numeric keypad or digit keys to enter values for changing the test frequency or
level while monitoring the measurement. Choose from open-circuit voltage or constant
current mode for the level setting.
Load Compensation Setting Screen
Set up five compensation constants for
the function to correct measurement
values.
4
Multiple Functions for a Broad Range of Applications
Comparator
Compare two measurement items using the Comparator
function. Input can be either the absolute value, percentage
of standard value or its deviation percentage (Δ%).
BIN (Classification) Measurement
Classify 2 measurement items in up to 10 categories.
Application
Setting Screen
Continuous Measurements
Measurement conditions saved by the Panel Save function
can be used to continuously measure up to five conditions
per page.
Scaling
Set constants a and b to apply compensation
to measurement values.
Numeric Digit Display
The number of significant digits of
measured values of each parameter
can be set to three, four or five digits.
Zoom Display
Enlarge the display of measurement
data and comparator results.
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