2N3725
MECHANICAL DATA
Dimensions in mm (inches)
8.51 (0.34)
9.40 (0.37)
7.75 (0.305)
8.51 (0.335)
HIGH VOLTAGE, HIGH CURRENT, HIGH
SPEED, NPN SWITCHING TRANSISTOR IN
A HERMETICALLY SEALED
TO-39 METAL PACKAGE FOR HIGH
RELIABILITY APPLICATIONS
FEATURES
6.10 (0.240)
6.60 (0.260)
12.70
(0.500)
min.
0.89
max.
(0.035)
0.41 (0.016)
0.53 (0.021)
dia.
• SILICON PLANAR EPITAXIAL NPN
TRANSISTOR
• HERMETIC METAL PACKAGE
• CECC SCREENING OPTIONS
5.08 (0.200)
typ.
• SPACE QUALITY LEVELS OPTIONS
2.54
(0.100)
• JAN LEVEL SCREENING OPTIONS
• HIGH SPEED SATURATED SWITCHING
2
1
0.74 (0.029)
1.14 (0.045)
0.71 (0.028)
0.86 (0.034)
3
APPLICATIONS:
45°
TO-39 METAL
(TO205AD)
PIN 1 – Emitter
PIN OUTS
PIN 2 – Base
PIN 3 – Collector
Hermetically sealed 2N3725 for high
reliability applications. Suitable for
memory application.
ABSOLUTE MAXIMUM RATINGS
(T
amb
= 25°C unless otherwise stated)
V
CBO
V
CES
V
CEO
V
EBO
I
C
P
tot
T
j
T
stg
Collector-base Voltage (I
E
= 0)
Collector-emitter Voltage (V
BE
= 0)
Collector-emitter Voltage (I
B
= 0)
Emitter-base Voltage (I
C
= 0)
Collector Current
Total Power Dissipation at T
amb
≤
25 °C
at T
case
≤
25 °C
Junction Temperature
Storage Temperature
80V
80V
50V
6V
1A
0.8W
3.5W
– 65 to 200 °C
– 65 to 200 °C
Semelab Plc reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed
to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use.
Semelab encourages customers to verify that datasheets are current before placing orders.
Semelab plc.
Telephone +44(0)1455 556565. Fax +44(0)1455 552612.
E-mail: sales@semelab.co.uk Website: http://www.semelab.co.uk
Document Number 4303
Issue 1
2N3725
ELECTRICAL CHARACTERISTICS
(T
amb
= 25°C unless otherwise stated)
Parameter
I
CBO
V
(BR)CBO
V
(BR)CES
V
(BR)CEO
*
V
(BR)EBO
V
CE(sat )
*
Collector Cutoff Current (I
E
= 0)
Collector-Base Breakdown Voltage (IE = 0)
Collector-Emitter Breakdown
Voltage (V
BE
= 0)
Collector-Emitter Breakdown Voltage (I
B
= 0)
Test Conditions
V
CB
= 60 V
V
CB
= 60 V
I
C
= 10
µA
I
C
= 10
µA
I
C
= 10 mA
I
E
= 10
µA
I
C
= 10 mA
I
C
= 100 mA
I
C
= 300 mA
I
C
= 500 mA
I
C
= 800 mA
I
C
=
1000 mA
I
B
= 1 mA
I
B
= 10 mA
I
B
= 30 mA
I
B
= 50 mA
I
B
= 80 mA
I
B
= 100 mA
I
B
= 1 mA
I
B
= 10 mA
I
B
= 30 mA
I
B
= 50 mA
I
B
= 80 mA
I
B
= 100 mA
V
CE
= 1 V
V
CE
= 1 V
V
CE
= 1 V
V
CE
= 5 V
V
CE
= 2 V
V
CE
= 1 V
V
CE
= 10 V
V
CB
= 10 V
V
CB
= 0.5 V
T
amb
= 100 `C
Min.
Typ.
Max.
1.7
120
Unit
µA
V
V
V
V
80
80
50
6
0.19
0.21
0.31
0.4
0.5
0.6
0.64
0.75
0.89
0.9
1.0
1.1
30
60
40
25
20
35
3
10
55
35
60
60
90
60
65
40
150
0.25
0.26
0.4
0.52
0.8
0.95
0.76
0.86
1.1
1.2
1.5
1.7
Emitter-Base Breakdown Voltage (I
C
= 0)
Collector-Emitter Saturation Voltage
V
V
BE(sat )
*
Base-Emitter Saturation Voltage
I
C
= 10 mA
I
C
= 100 mA
I
C
= 300 mA
I
C
= 500 mA
I
C
= 800 mA
I
C
=
1000 mA
V
hFE*
DC Current Gain
I
C
= 10 mA
I
C
= 100 mA
I
C
= 300 mA
I
C
=
1000 mA
I
C
= 800 mA
I
C
= 500 mA
hfe
C
CBO
C
EBO
t
on
t
off
High Frequency Current Gain (f = 100Mhz)
Collector-Base Capacitance (f = 1Mhz)
Emitter-Base Capacitance (f = 1Mhz)
Turn-on Time
Turn off Time
I
C
= 50 mA
I
E
= 0
I
C
= 0
pF
pF
ns
ns
V
CC
= 30 V
I
C
= 500 mA
I
B
= 50 mA
V
CC
= 30 V
I
C
= 500 mA
I
B1
= – I
B2
= 50 mA
* Pulsed : pulse duration = 300µs, duty cycle = 1%
THERMAL DATA
(T
case
= 25°C unless otherwise stated)
Parameter
R
th j-case
R
th j-amb
Test Conditions
Min.
Typ.
Max.
50
220
Unit
°C/W
°C/W
Thermal Resistance Junction-Case
Thermal Resistance Junction-Ambient
Semelab Plc reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed
to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use.
Semelab encourages customers to verify that datasheets are current before placing orders.
Semelab plc.
Telephone +44(0)1455 556565. Fax +44(0)1455 552612.
E-mail: sales@semelab.co.uk Website: http://www.semelab.co.uk
Document Number 4303
Issue 1
Embedded System
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