REVISIONS
LTR
A
B
C
D
E
DESCRIPTION
Added device type 02. Made corrections to paragraph 1.3 and table I.
Added waveform distortion test to table I. Rewrote entire document.
Added vendor cage number 57363. Added device types 03, 04, 05, and
06. Added case outlines M, N, T, and U.
Added case outlines 4 and 5.
Remove vendor cage 8K957. Added vendor cage 88379. Added device
types 07, 08, 09, and 10. Updated requirements to MIL-PRF-38534.
Table I; For the t
DT
test changed the max limit for device types 07 and 08
from 150 ns to 250 ns. For the t
DI-L
test changed the max limit for device
types 07 and 08 from 250 ns to 450 ns. For the I
CC4
test under the
conditions block added for device types 07-10 to use 100% duty cycle at 1
MHz, see note 11. Changed the max limit for the I
CC4
test, device types
07-10 from 650 mA to 750 mA. -sld
Case outline N, dimension Q maximum, change .122" to .135".
Paragraph 1.2.4, case outline Z, correct terminals from 36 to 24. -gz
Table I, I
CC5
test for device types 03 through 06, change test condition
from 80% duty cycle at 1 MHz to 75% duty cycle at 1 MHz. -gz
Updated drawing paragraphs. -sld
Add case outline 6. -gc
DATE (YR-MO-DA)
93-06-15
93-10-08
95-01-13
95-12-06
01-06-22
APPROVED
K. A. Cottongim
K. A. Cottongim
K. A. Cottongim
K. A. Cottongim
Raymond Monnin
F
G
H
J
K
03-12-19
08-11-07
10-07-20
12-05-07
13-01-22
Raymond Monnin
Robert M. Heber
Charles F. Saffle
Charles F. Saffle
Charles F. Saffle
THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED.
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
PMIC N/A
K
15
K
16
K
17
K
18
REV
SHEET
PREPARED BY
Gary Zahn
CHECKED BY
Michael C. Jones
K
19
K
20
K
21
K
1
K
22
K
2
K
23
K
3
K
24
K
4
K
25
K
5
K
26
K
6
K
27
K
7
K
8
K
9
K
10
K
11
K
12
K
13
K
14
STANDARD
MICROCIRCUIT
DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.landandmaritime.dla.mil/
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
APPROVED BY
Gregory A. Lude
DRAWING APPROVAL DATE
92-07-08
MICROCIRCUIT, HYBRID, DIGITAL,
MULTICHIP, DUAL CHANNEL,
DRIVER-RECEIVER
SIZE
A
SHEET
CAGE CODE
AMSC N/A
REVISION LEVEL
K
67268
1 OF
27
5962-92061
DSCC FORM 2233
APR 97
5962-E100-13
1. SCOPE
1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A
choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When
available, a choice of radiation hardness assurance levels are reflected in the PIN.
1.2 PIN. The PIN shall be as shown in the following example:
5962
Federal
stock class
designator
\
-
RHA
designator
(see 1.2.1)
\/
Drawing number
1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA
levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device types. The device types identify the circuit function as follows:
Device type
01
02
03
04
05
06
07
08
09
10
Generic number
MR63147M
MR63147M-2
NHI-1559, NHI-1567,
NHI-1573, NHI-1579
NHI-1560, NHI-1568,
NHI-1574, NHI-1580
NHI-1563, NHI-1569,
NHI-1578, NHI-1593
NHI-1570, NHI-1577,
NHI-1581, NHI-1594
ACT4458-201
ACT4464-201
ACT4460-201
ACT4454-201
Circuit function
+5 V, dual channel, MIL-STD-1553 transceiver (Harris interface)
+5 V, dual channel, MIL-STD-1553 transceiver (Smith interface)
+5 V, dual channel, MIL-STD-1553 transceiver (standby low)
+5 V, dual channel, MIL-STD-1553 transceiver (standby high)
+5 V, dual channel, MacAir transceiver (standby low)
+5 V, dual channel, MacAir transceiver (standby high)
+5 V, dual channel, MIL-STD-1553 transceiver (standby low)
+5 V, dual channel, MIL-STD-1553 transceiver (standby high)
+5 V, dual channel, MacAir transceiver (standby low)
+5 V, dual channel, MacAir transceiver (standby high)
92061
01
Device
type
(see 1.2.2)
/
H
Device
class
designator
(see 1.2.3)
X
Case
outline
(see 1.2.4)
X
Lead
finish
(see 1.2.5)
1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level.
All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K,
and E) or QML Listing (Class G and D). The product assurance levels are as follows:
Device class
K
Device performance documentation
Highest reliability class available. This level is intended for use in space
applications.
Standard military quality class level. This level is intended for use in applications
where non-space high reliability devices are required.
Reduced testing version of the standard military quality class. This level uses the
Class H screening and In-Process Inspections with a possible limited temperature
range, manufacturer specified incoming flow, and the manufacturer guarantees (but
may not test) periodic and conformance inspections (Group A, B, C, and D).
H
G
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
K
5962-92061
SHEET
2
DSCC FORM 2234
APR 97
E
Designates devices which are based upon one of the other classes (K, H, or G)
with exception(s) taken to the requirements of that class. These exception(s) must
be specified in the device acquisition document; therefore the acquisition document
should be reviewed to ensure that the exception(s) taken will not adversely affect
system performance.
Manufacturer specified quality class. Quality level is defined by the manufacturers
internal, QML certified flow. This product may have a limited temperature range.
D
1.2.4 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows:
Outline letter
M
N
T
U
X
Y
Z
6
4
5
Descriptive designator
See figure 1
See figure 1
See figure 1
See figure 1
See figure 1
See figure 1
See figure 1
See figure 1
See figure 1
See figure 1
Terminals
20
20
36
36
36
36
24
24
36
36
Package style
Dual-in-line
Flat pack
Dual-in-line
Flat pack
Dual-in-line
Flat pack
Micro flat pack
Micro flat pack
Dual-in-line (ceramic)
Flat pack (ceramic)
1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.
1.3 Absolute maximum ratings. 1/
Supply voltage range (V
CC
) ........................................................
Logic input voltage range ..........................................................
Receiver differential input voltage ..............................................
Driver peak output current .........................................................
Power dissipation (P
D
), device types 01 and 02:
Hottest die (100% duty cycle) .................................................
Total hybrid (standby) .............................................................
Total hybrid (100% duty cycle) ...............................................
Power dissipation (P
D
), device types 03 through 06:
Hottest die (100% duty cycle) .................................................
Total hybrid (standby) .............................................................
Total hybrid (100% duty cycle) ...............................................
Power dissipation (P
D
), device types 07 through 10:
Total hybrid (standby) .............................................................
Total hybrid (100% duty cycle) ...............................................
Storage temperature range ........................................................
Lead temperature (soldering, 10 seconds) ................................
Junction temperature (T
J
) ..........................................................
Thermal resistance, junction-to-case (θ
JC
):
Device types 01 through 06 ....................................................
Device types 07 through 10 ....................................................
Thermal resistance, junction-to-air (θ
CA
) ....................................
-0.3 V dc to +7.0 V dc
-0.3 V dc to +5.5 V dc
10 V
P-P
+1.0 A
2.2 W
500 mW
2.46 W
500 mW
450 mW
950 mW
100 mW
2W
-65°C to +150°C
+300°C
+135°C
4°C/W (hottest die)
5°C/W
20°C/W (still air)
1/
Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
K
5962-92061
SHEET
3
DSCC FORM 2234
APR 97
1.4 Recommended operating conditions.
Supply voltage range (V
CC
):
Device types 01, 02, 07, 08, 09, and 10 ..............................
Device types 03, 04, 05, and 06 ..........................................
Logic input voltage range ......................................................
Receiver differential voltage ...................................................
Driver peak output current ......................................................
Maximum serial data rate .......................................................
Case operating temperature range (T
C
)..................................
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at
https://assist.dla.mil/quicksearch/
or from the Standardization Document
Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in
accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as
designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class. The
manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as
defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not
affect the form, fit, or function of the device for the applicable device class.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38534 and herein.
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.2.3 Timing waveforms. The timing waveforms shall be as specified on figure 3.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full specified operating temperature range.
+4.75 V dc to +5.25 V dc
+4.5 V dc to +5.5 V dc
0 V dc to +5.0 V dc
8.0 V
P-P
+700 mA
0 Hz to 1.0 MHz
-55°C to +125°C
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
K
5962-92061
SHEET
4
DSCC FORM 2234
APR 97
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
3.5 Marking of devices. Marking of devices shall be in accordance with MIL-PRF-38534. The device shall be marked with
the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked.
3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample,
for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those
which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be
made available to the preparing activity (DLA Land and Maritime -VA) upon request.
3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this
drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the
manufacturer's product meets the performance requirements of MIL-PRF-38534 and herein.
3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of
microcircuits delivered to this drawing.
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form,
fit, or function as described herein.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
K
5962-92061
SHEET
5
DSCC FORM 2234
APR 97
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