REVISIONS
LTR
A
DESCRIPTION
Table I: Output voltage
±V
OUT
test, for subgroups 2 and 3 (non-RHA)
change min value from 11.82 V to 11.76 V and max value from 12.18
V to 12.24 V. Table I: Output response to step load transient
±V
OUT
test, for subgroup 4 (non-RHA) change max value from 300 mV pk to
400 mV pk, for subgroups 5 and 6 (non-RHA) change max. value from
350 mV pk to 450 mV pk, for subgroups 4,5, 6 (RHA) change max
value from 400 mV pk to 500 mV pk. Figure 1 case outline X: Correct
dimensions
θb,
D, D1, E2, L,
θP,
and Q in table. gc
Table I: For power dissipation test, change max limit of non-RHA
subgroup 1 from “18” W to “20” W. Table II, add note to Group C end-
point test parameters to include subgroups 2 and 3. In paragraph
4.3.5, correct units in table for Single event upset survival level (LET)
2
from “MeV” to “MeV-cm /mg”. Update drawing paragraphs. gc
Paragraph 1.3; Correct Power dissipation (P
D
) from “20 W” to “22 W”
for RHA devices. Table I; Power dissipation test (P
D
), correct
maximum power dissipation for RHA devices from”20 W” to “22 W”gc
Update to current RHA format. -gc
DATE (YR-MO-DA)
07-10-23
APPROVED
Robert M. Heber
B
12-03-01
Charles F. Saffle
C
12-06-25
Charles F. Saffle
D
13-06-12
Charles F. Saffle
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
PMIC N/A
D
15
D
16
REV
SHEET
PREPARED BY
Greg Cecil
CHECKED BY
Greg Cecil
D
1
D
2
D
3
D
4
D
5
D
6
D
7
D
8
D
9
D
10
D
11
D
12
D
13
D
14
STANDARD
MICROCIRCUIT
DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.landandmaritime.dla.mil
THIS DRAWING IS
AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
AMSC N/A
APPROVED BY
Robert M. Heber
MICROCIRCUIT, HYBRID, 12 VOLT, DUAL
CHANNEL, DC/DC CONVERTER
DRAWING APPROVAL DATE
07-07-09
REVISION LEVEL
D
SIZE
A
SHEET
CAGE CODE
67268
1 OF
16
5962-07202
5962-E417-13
DSCC FORM 2233
APR 97
1. SCOPE
1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A
choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When
available, a choice of radiation hardness assurance levels are reflected in the PIN.
1.2 PIN. The PIN shall be as shown in the following example:
5962
Federal
stock class
designator
\
-
RHA
designator
(see 1.2.1)
\/
Drawing number
1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA
levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
01
Generic number
SMRT2812D
Circuit function
DC/DC converter, 35 W,
±12
V output
07202
01
Device
type
(see 1.2.2)
/
H
Device
class
designator
(see 1.2.3)
X
Case
outline
(see 1.2.4)
X
Lead
finish
(see 1.2.5)
1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level.
All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K,
and E) or QML Listing (Class G and D). The product assurance levels are as follows:
Device class
K
H
G
Device performance documentation
Highest reliability class available. This level is intended for use in space
applications.
Standard military quality class level. This level is intended for use in applications
where non-space high reliability devices are required.
Reduced testing version of the standard military quality class. This level uses the
Class H screening and In-Process Inspections with a possible limited temperature
range, manufacturer specified incoming flow, and the manufacturer guarantees (but
may not test) periodic and conformance inspections (Group A, B, C, and D).
Designates devices which are based upon one of the other classes (K, H, or G)
with exception(s) taken to the requirements of that class. These exception(s) must
be specified in the device acquisition document; therefore the acquisition document
should be reviewed to ensure that the exception(s) taken will not adversely affect
system performance.
Manufacturer specified quality class. Quality level is defined by the manufacturers
internal, QML certified flow. This product may have a limited temperature range.
E
D
1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
X
Descriptive designator
See figure 1
Terminals
12
Package style
Flanged Package
1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
D
5962-07202
SHEET
2
DSCC FORM 2234
APR 97
1.3 Absolute maximum ratings. 1/
Supply voltage (V
CC
) .................................................................................
Power dissipation (P
D
):
Device type 01 (non-RHA) ................................................ ...............
Device type 01 (RHA levels P and R)............................ ...... .............
Output power ............................................................................................
Lead temperature (soldering, 10 seconds) ...............................................
Storage temperature .................................................................................
1.4 Recommended operating conditions.
Supply voltage (V
CC
) .................................................................................
Case operating temperature range (T
C
) ....................................................
1.5 Radiation features. 2/ 3/
Maximum total dose available (dose rate = 50 - 300 rads(Si)/s)...............
Maximum total dose available (dose rate ≤ 10 mrads(Si)/s) .....................
Single event phenomenon (SEP) effective linear energy transfer (LET):
No SEL, SEB, SEFI, SEGR ...................................................................
SEU .......................................................................................................
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines.
MIL-STD-461 - Requirements for the Control of Electromagnetic Interference Characteristics of Subsystems and
Equipment.
100 krads(Si) 4/
100 krads(Si) 4/
< 78.2 MeV-cm
2
/mg 5/
< 78.2 MeV-cm /mg 6/
2
-0.5 V dc to +80 V dc
20 W
22 W
35 W
+300°C
-65°C to +150°C
+19 V dc to +56 V dc
-55°C to +125°C
1/
2/
3
4/
5/
6/
Stresses above the absolute maximum ratings may cause permanent damage to the device. Input voltage transients
between 56 and 80 volts are allowed for no more than 120 milliseconds. Extended operation at the maximum levels may
degrade performance and affect reliability.
See 4.3.5 for the manufacturer’s radiation hardness assurance analysis and testing.
Bipolar device types may degrade from displacement damage from radiation which could affect RHA levels. These device
types have not been characterized for displacement damage.
This device was initially High Dose Rate (HDR) tested using Condition A of Method 1019 or MIL-STD-883 to 300 krads(Si)
to ensure RHA designator level “R” (100 krads(Si)). This device has also been Low Dose Rate (LDR) tested using
Condition D of Method 1019 of MIL-STD-883 to 100 krads(Si). This device will be re-tested after design or process changes
that can affect RHA response of this device.
2
Single event was performed to 78.2 MeV-cm /mg with no latch-up, burn-out, functional interrupts, or gate ruptures exhibited.
Single event upsets (transient voltages) were exhibited to the limit specified. See table IB.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
D
5962-07202
SHEET
3
DSCC FORM 2234
APR 97
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at
http://quicksearch.dla.mil
or from the Standardization Document Order
Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Non-Government publications. The following documents form a part of this document to the extent specified herein.
AMERICAN SOCIETY FOR TESTING AND MATERIALS (ASTM)
ASTM F 1192
- Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by
Heavy Ion Irradiation of Semiconductor Devices.
2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in
accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as
designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class. The
manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as
defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not
affect the form, fit, or function of the device for the applicable device class.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38534 and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document
revision level control and shall be made available to the preparing and acquiring activity upon request.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full specified operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with
the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked.
3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample,
for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those
which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be
made available to the preparing activity (DLA Land and Maritime-VA) upon request.
3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this
drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime-VA shall affirm that the
manufacturer's product meets the performance requirements of MIL-PRF-38534 and herein.
3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of
microcircuits delivered to this drawing.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
D
5962-07202
SHEET
4
DSCC FORM 2234
APR 97
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form,
fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:
a.
Burn-in test, method 1015 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DLA Land and Maritime-VA, or the acquiring activity upon request.
Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance
with the intent specified in method 1015 of MIL-STD-883.
T
A
as specified in accordance with table I of method 1015 of MIL-STD-883.
(2)
b.
Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
D
5962-07202
SHEET
5
DSCC FORM 2234
APR 97
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