INTEGRATED CIRCUITS
74F640
Octal bus transceiver, inverting (3-State)
Product specification
IC15 Data Handbook
1989 Nov 27
Philips
Semiconductors
Philips Semiconductors
Product specification
Octal bus transceiver, inverting (3-State)
74F640
FEATURES
•
High-impedance NPN base inputs for reduced loading
(70µA in High and Low states)
PIN CONFIGURATION
T/R 1
A0
A1
A2
A3
A4
A5
A6
2
3
4
5
6
7
8
9
20 V
CC
19 OE
18 B0
17 B1
16 B2
15 B3
14 B4
13 B5
12 B6
11 B7
•
Ideal for applications which require high-output drive and minimal
bus loading
•
Inverting version of 74F245
•
Octal bidirectional bus interface
•
3-State outputs sink 64mA and source 15mA
DESCRIPTION
The 74F640 is an octal transceiver featuring inverting 3-State bus
compatible outputs in both transmit and receive directions. The B
port outputs are capable of sinking 64mA and sourcing 15mA,
providing very good capacitive drive characteristics. The device
features an Output Enable (OE) input for easy cascading and
Transmit/Receiver (T/R) input for direction control. The 3-State
outputs, B0–B7, have been designed to prevent output bus loading if
the power is removed from the device.
A7
GND 10
SF00198
TYPE
74F640
TYPICAL
PROPAGATION
DELAY
3.5ns
TYPICAL SUPPLY CURRENT
(TOTAL)
78mA
ORDERING INFORMATION
DESCRIPTION
20-pin plastic DIP
20-pin plastic SOL
COMMERCIAL RANGE
V
CC
= 5V
±10%,
T
amb
= 0°C to +70°C
N74F640N
N74F640D
PKG DWG #
SOT146-1
SOT163-1
INPUT AND OUTPUT LOADING AND FAN-OUT TABLE
PINS
A0 - A7, B0 - B7
OE
T/R
A0 - A7
B0 - B7
Data inputs
Output Enable input (active Low)
Transmit/Receive input
A port outputs
B port outputs
DESCRIPTION
74F(U.L.)
HIGH/LOW
3.5/0.115
2.0/0.067
2.0/0.067
150/40
750/106.7
LOAD VALUE
HIGH/LOW
70µA/70µA
40µA/40µA
40µA/40µA
3.0mA/24mA
15mA/64mA
NOTE:
One (1.0) FAST unit load is defined as: 20µA in the High state and 0.6mA in the Low state.
1989 Nov 27
2
853–0381 98171
Philips Semiconductors
Product specification
Octal bus transceiver, inverting (3-State)
74F640
LOGIC SYMBOL
2
3
4
5
6
7
8
9
LOGIC SYMBOL (IEEE/IEC)
19
G3
3EN1(BA)
1
3EN2(AB)
A0
19
1
A1
A2
A3
A4
A5
A6
A7
1
OE
T/R
2
3
4
B0
B1
B2
B3
B4
B5
B6
B7
5
18
17
16
15
14
13
12
11
6
7
2
18
17
16
15
14
13
12
11
V
CC
= Pin 20
GND = Pin 10
SF01140
8
9
SF01141
FUNCTION TABLE
INPUTS
OUTPUTS
OE
L
L
H
H
L
X
Z
=
=
=
=
T/R
L
H
X
Bus B data to Bus A
Bus A data to Bus B
Z
High voltage level
Low voltage level
Don’t care
High impedance “off” state
LOGIC DIAGRAM
A0
2
A1
3
A2
4
A3
5
A4
6
A5
7
A6
8
A7
9
OE 19
1
T/R
18
V
CC
=
GND =
Pin 20
Pin 10
B0
17
B1
16
B2
15
B3
14
B4
13
B5
12
B6
11
B7
SF01142
1989 Nov 27
3
Philips Semiconductors
Product specification
Octal bus transceiver, inverting (3-State)
74F640
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL
V
CC
V
IN
I
IN
V
OUT
I
O
OUT
T
amb
T
stg
Supply voltage
Input voltage
Input current
Voltage applied to output in High output state
A0–A7
Current applied to output in Low output state
B0–B7
Operating free-air temperature range
Storage temperature range
128
0 to +70
–65 to +150
mA
°C
°C
PARAMETER
RATING
–0.5 to +7.0
–0.5 to +7.0
–30 to +5
–0.5 to +V
CC
48
UNIT
V
V
mA
V
mA
RECOMMENDED OPERATING CONDITIONS
LIMITS
SYMBOL
V
CC
V
IH
V
IL
I
IK
I
O
OH
Supply voltage
High-level input voltage
Low-level input voltage
Input clamp current
A0–A7
High-level
High level output current
B0–B7
A0–A7
I
O
OL
T
amb
Low-level
Low level output current
B0–B7
Operating free-air temperature range
0
64
70
mA
°C
–15
24
mA
mA
PARAMETER
MIN
4.5
2.0
0.8
–18
–3
NOM
5.0
MAX
5.5
V
V
V
mA
mA
UNIT
1989 Nov 27
4
Philips Semiconductors
Product specification
Octal bus transceiver, inverting (3-State)
74F640
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
LIMITS
SYMBOL
PARAMETER
TEST
CONDITIONS
NO TAG
±10%V
CC
±5%V
CC
±10%V
CC
±5%V
CC
±10%V
CC
±5%V
CC
±10%V
CC
±5%V
CC
0.42
–0.73
MIN
2.4
2.7
2.0
2.0
0.35
0.35
0.50
0.50
0.55
0.55
–1.2
100
1.0
40
–40
70
–70
–60
V
CC
= MAX
T/R = An = 4.5V,
OE = GND
V
CC
= MAX
T/R = Bn = OE = GND
T/R = Bn = GND,
OE = 4.5V
–100
66
91
78
–150
–225
85
120
102
3.3
TYP
NO TAG
MAX
UNIT
V
V
V
V
V
V
V
V
V
µA
mA
µA
µA
µA
µA
mA
µA
mA
mA
mA
A0–A7
B0–B7
V
O
OH
High level output voltage
High-level
B0–B7
B0 B7
V
CC
= MIN,
V
IL
= MAX
MAX,
V
IH
= MIN
I
O
= –3mA
3mA
OH
I
O
= –15mA
15mA
OH
A0–A7
A0 A7
V
O
OL
Low-level
Low level output voltage
B0–B7
B0 B7
V
IK
Input clamp voltage
Input current at maximum
input voltage
High-level input current
Low-level input current
Off-state output current,
High level of voltage applied
Off-state output current,
Low level of voltage applied
Short-circuit output cur-
rent
NO TAG
A0–A7
B0–B7
I
CCH
I
CC
Supply current (total)
I
CCL
I
CCZ
OE,
T/R
A0–A7,
B0–B7
OE,
T/R
only
V
CC
= MIN,
V
IL
= MAX
MAX,
V
IH
= MIN,
I
O
= 24mA
OL
I
O
= MAX
OL
V
CC
= MIN, I
I
= I
IK
V
CC
= 0.0V, V
I
= 7.0V
V
CC
= 5.5V, V
I
= 5.5V
V
CC
= MAX, V
I
= 2.7V
V
CC
= MAX, V
I
= 0.5V
V
CC
= MAX, V
I
= 2.7V
V
CC
= MAX, V
I
= 0.5V
I
I
I
IH
I
IL
I
OZH
+I
IH
I
OZL
+I
IL
I
OS
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25°C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
1989 Nov 27
5
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