FERRITE CHIP BEADS 4 LINE ARRAY (NORMAL USAGE)
A4K SERIES
1. PART NO. EXPRESSION :
A4K300-RE-10
(a)(b)(c) (d)
(e) (f)
(g)
(a) Series code
(b) Dimension code
(c) Material code
(d) Impedance code : 300 = 30
(e) R : Reel
(f) Current code : E = 500mA
(g) 10 : Lead Free
2. CONFIGURATION & DIMENSIONS :
A
J
D2
G
I
L
C
H
PCB Pattern
D1
P
B
Unit:m/m
D2
P
G
0.80 Ref.
H
0.40 Ref.
I
0.80 Ref.
J
2.80 Ref.
L
2.20~2.60
A
B
C
D1
3.20±0.20 1.60±0.20 0.90±0.20 0.40±0.15 0.20±0.10 0.80±0.10
3. SCHEMATIC :
4. MATERIALS :
b
a
Ag(100%)
Ni(100%)-1.5um(min.)
Sn(100%)-3.0um(min.)
(a) Body : Ferrite
(b) Termination : Ag/Ni/Sn
5. GENERAL SPECIFICATION :
a) Temp. rise : 30°C Max.
b) Rated current : Base on temp. rise
c) Storage temp. : -55°C to +125°C
d) Operating temp. : -55°C to +125°C
e) Resistance to solder heat : 260°C.10secs
NOTE : Specifications subject to change without notice. Please check our website for latest information.
18.06.2008
SUPERWORLD ELECTRONICS (S) PTE LTD
PG. 1
FERRITE CHIP BEADS 4 LINE ARRAY (NORMAL USAGE)
A4K SERIES
6. ELECTRICAL CHARACTERISTICS :
Part Number
A4K300-RE-10
A4K600-RD-10
A4K121-RD-10
A4K301-RC-10
A4K601-RB-10
A4K102-RB-10
Impedance
( )
30 ±25%
60 ±25%
120 ±25%
300 ±25%
600 ±25%
1000 ±25%
Test
Frequency
( MHz )
100
100
100
100
100
100
DC Resistance
( )
Max.
0.20
0.25
0.30
0.40
0.50
0.75
Rated Current
( mA )
Max.
500
400
350
250
200
150
NOTE : Specifications subject to change without notice. Please check our website for latest information.
18.06.2008
SUPERWORLD ELECTRONICS (S) PTE LTD
PG. 2
FERRITE CHIP BEADS 4 LINE ARRAY (NORMAL USAGE)
A4K SERIES
7. IMPEDANCE VS. FREQUENCY CURVES :
A4K300-RE-10
A4K600-RD-10
A4K121-RD-10
A4K301-RC-10
A4K601-RB-10
A4K102-RB-10
NOTE : Specifications subject to change without notice. Please check our website for latest information.
18.06.2008
SUPERWORLD ELECTRONICS (S) PTE LTD
PG. 3
FERRITE CHIP BEADS 4 LINE ARRAY (NORMAL USAGE)
A4K SERIES
8. RELIABILITY & TEST CONDITION :
ITEM
Electrical Characteristics Test
Impedance
DC Resistance
Rated Current
Temperature Rise Test
Solder Heat Resistance
PERFORMANCE
TEST CONDITION
HP4291A, HP4287A+16192A
HP4338B
1. Applied the allowed DC current.
2. Temperature measured by digital surface thermometer.
Preheat : 150°C, 60sec.
Solder : Sn-Ag3.0-Cu0.5
Solder Temperature : 260±5°C
Flux for lead free : rosin
Dip Time : 10±0.5sec.
260°C
150°C
Refer to standard electrical characteristics list
30°C max. ( t)
Appearance : No significant abnormality
Impedance change : Within ±30%
No mechanical damage
Remaining terminal electrode : 70% Min.
Preheating Dipping
Natural
cooling
60
seconds
10±0.5
seconds
Solderability
More than 90% of the terminal electrode
should be covered with solder.
Preheat : 150°C, 60sec.
Solder : Sn-Ag3.0-Cu0.5
Solder Temperature : 230±5°C
Flux for lead free : rosin
Dip Time : 4±1sec.
230°C
150°C
Preheating Dipping
Natural
cooling
60
seconds
4±1.0
seconds
Terminal Strength
The terminal electrode & the dielectric must
not be damaged by the forces applied on the
right conditions.
For A Series :
Size
4
Force (Kfg)
0.5
Time (sec)
> 25
W
W
Flexture Strength
The terminal electrode & the dielectric must
not be damaged by the forces applied on the
right conditions.
20(.787)
Bending
45(1.772)
45(1.772)
40(1.575)
Solder a chip on a test substrate, bend the substrate
by 2mm (0.079in) and return.
100(3.937)
NOTE : Specifications subject to change without notice. Please check our website for latest information.
18.06.2008
SUPERWORLD ELECTRONICS (S) PTE LTD
PG. 4
FERRITE CHIP BEADS 4 LINE ARRAY (NORMAL USAGE)
A4K SERIES
8. RELIABILITY & TEST CONDITION :
ITEM
Loading at High
Temperature
PERFORMANCE
Appearance : No damage.
Impedance : Within ±30% of initial value.
TEST CONDITION
Temperature : 125±5°C
Applied Current : rated current
Duration : 500±12hrs
Measured at room temperature after placing for 2 to 3hrs.
Humidity : 90~95% RH.
Temperature : 40±2°C
Duration : 500±12hrs
Measured at room temperature after placing for 2 to 3hrs.
Humidity
Thermal Shock
Appearance : No damage.
Impedance : Within ±30% of initial value.
Phase
1
2
Temperature (°C)
-55±2°C
+125±5°C
Times (min.)
30±3
30±3
For A Series :
Condition for 1 cycle
Step1 : -55±2°C 30±3 min.
Step2 : +125±5°C 30±3 min.
Number of cycles : 5
Measured at room temperature after placing for 2 to 3hrs.
Temperature : -55±2°C
Duration : 500±12hrs
Measured at room temperature after placing for 2 to 3hrs.
Measured : 5 times
Low temperature storage test
NOTE : Specifications subject to change without notice. Please check our website for latest information.
18.06.2008
SUPERWORLD ELECTRONICS (S) PTE LTD
PG. 5
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