ZXMN3B14F
30V N-CHANNEL ENHANCEMENT MODE MOSFET 2.5V GATE DRIVE
SUMMARY
V
(BR)DSS
=30V : R
DS
(
on
)=0.08 ; I
D
=3.5A
DESCRIPTION
This new generation of Trench MOSFETs from Zetex utilizes a unique structure that
combines the benefits of low on-resistance with fast switching speed. This makes
them ideal for high efficiency, low voltage, power management applications.
FEATURES
•
Low on-resistance
•
Fast switching speed
•
Low threshold
•
Low gate drive
•
SOT23 package
PACKAGE
APPLICATIONS
•
DC-DC converters
•
Power management functions
•
Disconnect switches
•
Motor control
ORDERING INFORMATION
DEVICE
ZXMN3B14FTA
ZXMN3B14FTC
REEL
SIZE
7”
13”
TAPE
WIDTH
8mm
8mm
QUANTITY
PER REEL
3,000 units
10,000 units
PINOUT
DEVICE MARKING
•
3B14
ISSUE 1 - JUNE 2005
1
SEMICONDUCTORS
ZXMN3B14F
ABSOLUTE MAXIMUM RATINGS
PARAMETER
Drain-Source Voltage
Gate-Source Voltage
Continuous Drain Current @ V
GS
= 4.5V; T
A
=25°C
@ V
GS
= 4.5V; T
A
=70°C
@ V
GS
= 4.5V; T
A
=25°C
Pulsed Drain Current
(c)
Continuous Source Current (Body Diode)
Pulsed Source Current (Body Diode)
(c)
Power Dissipation at T
A
=25°C
Linear Derating Factor
(a)
(b)
(b)
(b)
(a)
SYMBOL
V
DSS
V
GS
I
D
LIMIT
30
12
3.5
2.9
2.9
16
2.4
16
1
8
1.5
12
-55 to +150
UNIT
V
V
A
A
A
A
A
A
W
mW/°C
W
mW/°C
°C
I
DM
I
S
I
SM
P
D
P
D
T
j
, T
stg
Power Dissipation at T
A
=25°C
(b)
Linear Derating Factor
Operating and Storage Temperature Range
THERMAL RESISTANCE
PARAMETER
Junction to Ambient
(a)
Junction to Ambient
(b)
SYMBOL
R
JA
R
JA
VALUE
125
83
UNIT
°C/W
°C/W
NOTES
(a) For a device surface mounted on 25mm x 25mm FR4 PCB with high coverage of single sided 1oz copper, in still air conditions.
(b) For a device surface mounted on FR4 PCB measured at t 5 sec.
(c) Repetitive rating - 25mm x 25mm FR4 PCB, D=0.02, pulse width 300 s - pulse width limited by maximum junction temperature.
ISSUE 1 - JUNE 2005
SEMICONDUCTORS
2
ZXMN3B14F
TYPICAL CHARACTERISTICS
ISSUE 1 - JUNE 2005
3
SEMICONDUCTORS
ZXMN3B14F
ELECTRICAL CHARACTERISTICS
(at T
amb
= 25°C unless otherwise stated)
PARAMETER
STATIC
Drain-Source Breakdown Voltage
Zero Gate Voltage Drain Current
Gate-Body Leakage
Gate-Source Threshold Voltage
Static Drain-Source On-State
Resistance
(1)
(1) (3)
SYMBOL
MIN.
TYP.
MAX. UNIT CONDITIONS
V
(BR)DSS
I
DSS
I
GSS
V
GS(th)
R
DS(on)
g
fs
C
iss
C
oss
C
rss
t
d(on)
t
r
t
d(off)
t
f
Q
g
Q
gs
Q
gd
V
SD
t
rr
30
1
100
0.7
0.080
0.140
8.5
V
A
nA
V
I
D
= 250 A, V
GS
=0V
V
DS
= 30V, V
GS
=0V
V
GS
= 12V, V
DS
=0V
I
D
= 250 A, V
DS
=V
GS
V
GS
= 4.5V, I
D
= 3.1A
V
GS
= 2.5V, I
D
= 2.2A
V
DS
= 15V, I
D
= 3.1A
Forward Transconductance
DYNAMIC
(3)
S
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
SWITCHING
(2) (3)
Turn-On-Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Total Gate Charge
Gate-Source Charge
Gate Drain Charge
SOURCE-DRAIN DIODE
Diode Forward Voltage
(1)
Reverse Recovery Time
(3)
Reverse Recovery Charge
(3)
568
101
66
pF
pF
pF
V
DS
= 15V, V
GS
=0V
f=1MHz
3.6
4.9
17.3
9.8
6.7
1.4
1.8
ns
ns
ns
ns
nC
nC
nC
V
DD
= 15V, V
GS
= 4.5V
I
D
= 1A
R
G
≅
6.0
V
DS
= 15V, V
GS
= 4.5V
I
D
= 3.1A
0.82
10.8
4.54
0.95
V
ns
nC
T
j
=25°C, I
S
= 3.1A,
V
GS
=0V
T
j
=25°C, I
F
= 1.6A,
di/dt=100A/ s
Q
rr
NOTES
(1) Measured under pulsed conditions. Pulse width 300 s; duty cycle 2%.
(2) Switching characteristics are independent of operating junction temperature.
(3) For design aid only, not subject to production testing.
ISSUE 1 - JUNE 2005
SEMICONDUCTORS
4
ZXMN3B14F
N-CHANNEL TYPICAL CHARACTERISTICS
ISSUE 1 - JUNE 2005
5
SEMICONDUCTORS
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