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UPD44322322GF-A50

Description
Cache SRAM, 1MX32, 3.1ns, CMOS, PQFP100, 14 X 20 MM, PLASTIC, LQFP-100
Categorystorage    storage   
File Size727KB,40 Pages
ManufacturerNEC Electronics
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UPD44322322GF-A50 Overview

Cache SRAM, 1MX32, 3.1ns, CMOS, PQFP100, 14 X 20 MM, PLASTIC, LQFP-100

UPD44322322GF-A50 Parametric

Parameter NameAttribute value
Is it lead-free?Contains lead
Is it Rohs certified?incompatible
Parts packaging codeQFP
package instructionLQFP,
Contacts100
Reach Compliance Codecompliant
ECCN code3A991.B.2.A
Maximum access time3.1 ns
Other featuresPIPELINED ARCHITECTURE
JESD-30 codeR-PQFP-G100
JESD-609 codee0
length20 mm
memory density33554432 bit
Memory IC TypeCACHE SRAM
memory width32
Number of functions1
Number of terminals100
word count1048576 words
character code1000000
Operating modeSYNCHRONOUS
Maximum operating temperature70 °C
Minimum operating temperature
organize1MX32
Package body materialPLASTIC/EPOXY
encapsulated codeLQFP
Package shapeRECTANGULAR
Package formFLATPACK, LOW PROFILE
Parallel/SerialPARALLEL
Peak Reflow Temperature (Celsius)NOT SPECIFIED
Certification statusNot Qualified
Maximum seat height1.7 mm
Maximum supply voltage (Vsup)3.465 V
Minimum supply voltage (Vsup)3.135 V
Nominal supply voltage (Vsup)3.3 V
surface mountYES
technologyCMOS
Temperature levelCOMMERCIAL
Terminal surfaceTIN LEAD
Terminal formGULL WING
Terminal pitch0.65 mm
Terminal locationQUAD
Maximum time at peak reflow temperatureNOT SPECIFIED
width14 mm
Base Number Matches1
PRELIMINARY DATA SHEET
MOS INTEGRATED CIRCUIT
µ
PD44322182, 44322322, 44322362
32M-BIT CMOS SYNCHRONOUS FAST SRAM
PIPELINED OPERATION
SINGLE CYCLE DESELECT
Description
The
µ
PD44322182 is a 2,097,152-word by 18-bit,
µ
PD44322322 is a 1,048,576-word by 32-bit and the
µ
PD44322362 is
a 1,048,576-word by 36-bit synchronous static RAM fabricated with advanced CMOS technology using Full-CMOS six-
transistor memory cell.
The
µ
PD44322182,
µ
PD44322322 and
µ
PD44322362 integrates unique synchronous peripheral circuitry, 2-bit burst
counter and output buffer as well as SRAM core. All input registers are controlled by a positive edge of the single clock
input (CLK).
The
µ
PD44322182,
µ
PD44322322 and
µ
PD44322362 are suitable for applications which require synchronous operation,
high speed, low voltage, high density and wide bit configuration, such as buffer memory.
ZZ has to be set LOW at the normal operation. When ZZ is set HIGH, the SRAM enters Power Down State (“Sleep”). In
the “Sleep” state, the SRAM internal state is preserved. When ZZ is set LOW again, the SRAM resumes normal operation.
The
µ
PD44322182,
µ
PD44322322 and
µ
PD44322362 are packaged in 100-pin PLASTIC LQFP with a 1.4 mm package
thickness or 165-pin PLASTIC FBGA for high density and low capacitive loading.
Features
3.3 V or 2.5 V core supply
Synchronous operation
Operating temperature : T
A
= 0 to 70 °C (-A44, -A50, -A60, -C50, -C60)
T
A
= –40 to +85 °C (-A44Y, -A50Y, -A60Y, -C50Y, -C60Y)
Internally self-timed write control
Burst read / write : Interleaved burst and linear burst sequence
Fully registered inputs and outputs for pipelined operation
Single-Cycle deselect timing
All registers triggered off positive clock edge
3.3 V or 2.5 V LVTTL Compatible : All inputs and outputs
Fast clock access time : 2.8 ns (225 MHz), 3.1 ns (200 MHz), 3.5 ns (167 MHz)
Asynchronous output enable : /G
Burst sequence selectable : MODE
Sleep mode : ZZ (ZZ = Open or Low : Normal operation)
Separate byte write enable : /BW1 to /BW4, /BWE (
µ
PD44322322,
µ
PD44322362)
/BW1, /BW2, /BWE (
µ
PD44322182)
Global write enable : /GW
Three chip enables for easy depth expansion
Common I/O using three state outputs
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all products and/or types are available in every country. Please check with NEC Electronics sales
representative for availability and additional information.
Document No. M16355EJ1V0DS00 (1st edition)
Date Published December 2002 NS CP(K)
Printed in Japan
The mark
shows major revised points.
2002

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