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IRGC8B120KB

Description
Insulated Gate Bipolar Transistor, 1200V V(BR)CES, N-Channel, 150 MM, WAFER
CategoryDiscrete semiconductor    The transistor   
File Size15KB,1 Pages
ManufacturerInternational Rectifier ( Infineon )
Websitehttp://www.irf.com/
Download Datasheet Parametric View All

IRGC8B120KB Overview

Insulated Gate Bipolar Transistor, 1200V V(BR)CES, N-Channel, 150 MM, WAFER

IRGC8B120KB Parametric

Parameter NameAttribute value
Is it lead-free?Contains lead
Is it Rohs certified?incompatible
Parts packaging codeWAFER
package instructionUNCASED CHIP, O-XUUC-N
Reach Compliance Codecompliant
ECCN codeEAR99
Collector-emitter maximum voltage1200 V
ConfigurationSINGLE
JESD-30 codeO-XUUC-N
JESD-609 codee0
Number of components1
Number of terminals2
Package body materialUNSPECIFIED
Package shapeROUND
Package formUNCASED CHIP
Peak Reflow Temperature (Celsius)NOT SPECIFIED
Polarity/channel typeN-CHANNEL
Certification statusNot Qualified
surface mountYES
Terminal surfaceTIN LEAD
Terminal formNO LEAD
Terminal locationUPPER
Maximum time at peak reflow temperatureNOT SPECIFIED
transistor applicationsMOTOR CONTROL
Transistor component materialsSILICON
Base Number Matches1
PD - 94316
IRGC8B120KB
IRGC8B120KB IGBT Die in Wafer Form
Features
GEN5 Non Punch Through (NPT) Technology
Low V
CE(on)
10µs Short Circuit Capability
Square RBSOA
Positive V
CE(on)
Temperature Coefficient
Benefits
Benchmark Efficiency for Motor Control
Rugged Transient Performance
Excellent Current Sharing in Parallel Operation
Qualified for Industrial Market
1200 V
I
C(nom)
= 8A
VCE(on) typ. = 2.32V @
I
C(nom)
@ 25
°
C
Motor Control IGBT
Short Circuit Rated
150mm Wafer
C
G
E
Electrical Characteristics ( Wafer Form )
Parameter
V
CE (on)
V
(BR)CES
V
GE(th)
I
CES
I
GES
Description
Guaranteed (Min/Max)
Collector-to-Emitter Saturation Voltage
1.83V MIn., 2.27V Max.
Collector-to-Emitter Breakdown Voltage
1200V Min.
Gate Threshold Voltage
4.4V Min., 6.0V Max.
Zero Gate Voltage Collector Current
5.0 µA Max.
Gate-to-Emitter Leakage Current
±
1.1 µA Max.
Test Conditions
I
C
= 5.0A, T
J
= 25°C, V
GE
= 15V
T
J
= 25°C, I
CES
= 100µA, V
GE
= 0V
V
GE
= V
CE
, T
J
=25°C, I
C
=125µA
T
J
= 25°C, V
CE
= 1200V
T
J
= 25°C, V
GE
= +/- 20V
Mechanical Data
Norminal Backmetal Composition, Thickness:
Norminal Front Metal Composition, Thickness:
Dimensions:
Wafer Diameter:
Wafer thickness:
Relevant Die Mechanical Dwg. Number
Minimum Street Width
Reject Ink Dot Size
Ink Dot Location
Recommended Storage Environment:
Recommended Die Attach Conditions
Al-Ti-NiV-Ag ( 1kA-1kA-4kA-6kA )
99% Al, 1% Si (4 microns)
0.133" x 0.195"
150mm, with std. < 100 > flat
185 +/- 15 Microns
01-5429
100 Microns
0.25mm Diameter Minimum
Consistent throughout same wafer lot
Store in original container, in dessicated
nitrogen, with no contamination
For optimum electrical results, die attach
temperature should not exceed 300C
Die Outline
3.378
[.133]
1.953
[.077]
NOT ES:
1. ALL DIMENSIONS ARE SHOWN IN MILLIMET ERS [INCHE S].
2. CONTROLLING DIMENS ION: [INCH].
3. LET TE R DES IGNAT ION:
S = S OURCE
G = GATE
SK = SOURCE KELVIN
IS = CURRENT S ENS E
< 0.635 TOLE RANCE = + /- 0.013
< [.0250] T OLERANCE = + /- [.0005]
> 0.635 TOLE RANCE = + /- 0.025
> [.0250] T OLERANCE = + /- [.0010]
< 1.270 TOLE RANCE = + /- 0.102
< [.050] TOLE RANCE = + /- [.004]
> 1.270 TOLE RANCE = + /- 0.203
> [.050] TOLE RANCE = + /- [.008]
E = E MITT ER
4.953
[.195]
EMITT ER
0.696
[.027]
3.473
[.136]
4. DIMENS IONAL T OLERANCES:
BONDING PADS:
WIDT H
&
LE NGTH
G
OVERALL DIE :
WIDT H
0.701
[.027]
&
LE NGTH
10/02/01

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