MCP3201
2.7V 12-Bit A/D Converter with SPI Serial Interface
Features
•
•
•
•
•
•
•
•
•
•
•
•
•
•
12-Bit Resolution
±1 LSB max DNL
±1 LSB max INL (MCP3201-B)
±2 LSB max INL (MCP3201-C)
On-chip Sample and Hold
SPI Serial Interface (modes 0,0 and 1,1)
Single Supply Operation: 2.7V - 5.5V
100 ksps Maximum Sampling Rate at V
DD
= 5V
50 ksps Maximum Sampling Rate at V
DD
= 2.7V
Low-Power CMOS Technology
500 nA Typical Standby Current, 2 µA Maximum
400 µA Maximum Active Current at 5V
Industrial Temp Range: -40°C to +85°C
8-pin MSOP, PDIP, SOIC and TSSOP Packages
Description
The Microchip Technology Inc. MCP3201 device is a
successive approximation 12-bit Analog-to-Digital
(A/D) Converter with on-board sample and hold
circuitry. The device provides a single pseudo-differen-
tial input. Differential Nonlinearity (DNL) is specified at
±1 LSB, and Integral Nonlinearity (INL) is offered in
±1 LSB (MCP3201-B) and ±2 LSB (MCP3201-C)
versions. Communication with the device is done using
a simple serial interface compatible with the SPI
protocol. The device is capable of sample rates of up to
100 ksps at a clock rate of 1.6 MHz. The MCP3201
device operates over a broad voltage range (2.7V-
5.5V). Low-current design permits operation with
typical standby and active currents of only 500 nA and
300 µA, respectively. The device is offered in 8-pin
MSOP, PDIP, TSSOP and 150 mil SOIC packages.
Applications
•
•
•
•
Sensor Interface
Process Control
Data Acquisition
Battery Operated Systems
Package Types
MSOP, PDIP, SOIC, TSSOP
V
REF
IN+
1
MCP3201
2
3
4
8
7
6
5
V
DD
CLK
D
OUT
CS/SHDN
Functional Block Diagram
V
REF
V
DD
V
SS
IN–
V
SS
DAC
Comparator
IN+
IN-
Sample
and
Hold
Control Logic
12-Bit SAR
Shift
Register
CS/SHDN
CLK
D
OUT
1998-2011 Microchip Technology Inc.
DS21290F-page 1
MCP3201
NOTES:
DS21290F-page 2
1998-2011 Microchip Technology Inc.
MCP3201
1.0
1.1
ELECTRICAL
CHARACTERISTICS
Maximum Ratings†
V
DD
...................................................................................7.0V
All inputs and outputs w.r.t. V
SS
................ -0.6V to V
DD
+0.6V
Storage temperature .....................................-65°C to +150°C
Ambient temp. with power applied ................-65°C to +125°C
ESD protection on all pins (HBM) .................................> 4 kV
†Notice:
Stresses above those listed under “Maximum
ratings” may cause permanent damage to the device. This is
a stress rating only and functional operation of the device at
those or any other conditions above those indicated in the
operational listings of this specification is not implied.
Exposure to maximum rating conditions for extended periods
may affect device reliability.
ELECTRICAL CHARACTERISTICS
Electrical Specifications:
All parameters apply at V
DD
= 5V, V
SS
= 0V, V
REF
= 5V, T
A
= -40°C to +85°C, f
SAMPLE
= 100 ksps, and
fCLK = 16*f
SAMPLE
, unless otherwise noted.
Parameter
Conversion Rate:
Conversion Time
Analog Input Sample Time
Throughput Rate
DC Accuracy:
Resolution
Integral Nonlinearity
Differential Nonlinearity
Offset Error
Gain Error
Dynamic Performance:
Total Harmonic Distortion
Signal to Noise and Distortion
(SINAD)
Spurious Free Dynamic Range
Reference Input:
Voltage Range
Current Drain
Analog Inputs:
Input Voltage Range (IN+)
Input Voltage Range (IN-)
Leakage Current
Switch Resistance
Sample Capacitor
Digital Input/Output:
Data Coding Format
High Level Input Voltage
Low Level Input Voltage
Note 1:
2:
3:
Sym
t
CONV
t
SAMPLE
f
SAMPLE
Min
—
Typ
—
1.5
Max
12
Units
clock
cycles
clock
cycles
Conditions
—
—
100
50
ksps
ksps
bits
V
DD
= V
REF
= 5V
V
DD
= V
REF
= 2.7V
12
INL
DNL
—
—
—
—
—
THD
SINAD
SFDR
—
—
—
0.25
—
—
IN+
IN-
R
SS
C
SAMPLE
IN-
V
SS
-100
—
—
—
0.001
1K
20
Straight Binary
V
IH
V
IL
0.7 V
DD
—
—
—
—
0.3 V
DD
±0.75
±1
±0.5
±1.25
±1.25
-82
72
86
—
100
.001
—
±1
±2
±1
±3
±5
—
—
—
V
DD
150
3
V
REF
+IN-
V
SS
+100
±1
—
—
LSB
LSB
LSB
LSB
LSB
dB
dB
dB
V
µA
µA
V
mV
µA
W
pF
MCP3201-B
MCP3201-C
No missing codes over
temperature
V
IN
= 0.1V to 4.9V@1 kHz
V
IN
= 0.1V to 4.9V@1 kHz
V
IN
= 0.1V to 4.9V@1 kHz
Note 2
CS = V
DD
= 5V
See
Figure 4-1
See
Figure 4-1
V
V
This parameter is established by characterization and not 100% tested.
See graph that relates linearity performance to V
REF
level.
Because the sample cap will eventually lose charge, effective clock rates below 10 kHz can affect linearity performance,
especially at elevated temperatures. See
Section 6.2 “Maintaining Minimum Clock Speed”
for more information.
1998-2011 Microchip Technology Inc.
DS21290F-page 3
MCP3201
ELECTRICAL CHARACTERISTICS (CONTINUED)
Electrical Specifications:
All parameters apply at V
DD
= 5V, V
SS
= 0V, V
REF
= 5V, T
A
= -40°C to +85°C, f
SAMPLE
= 100 ksps, and
fCLK = 16*f
SAMPLE
, unless otherwise noted.
Parameter
High Level Output Voltage
Low Level Output Voltage
Input Leakage Current
Output Leakage Current
Pin Capacitance
(all inputs/outputs)
Timing Parameters:
Clock Frequency
Clock High Time
Clock Low Time
CS Fall To First Rising CLK Edge
CLK Fall To Output Data Valid
CLK Fall To Output Enable
CS Rise To Output Disable
CS Disable Time
D
OUT
Rise Time
D
OUT
Fall Time
Power Requirements:
Operating Voltage
Operating Current
Standby Current
Note 1:
2:
3:
Sym
V
OH
V
OL
I
LI
I
LO
C
IN
, C
OUT
Min
4.1
—
-10
-10
—
Typ
—
—
—
—
—
Max
—
0.4
10
10
10
Units
V
V
µA
µA
pF
Conditions
I
OH
= -1 mA, V
DD
= 4.5V
I
OL
= 1 mA, V
DD
= 4.5V
V
IN
= V
SS
or V
DD
V
OUT
= V
SS
or V
DD
V
DD
= 5.0V
(Note
1)
T
A
= +25°C, f = 1 MHz
V
DD
= 5V
(Note
3)
V
DD
= 2.7V
(Note
3)
f
CLK
t
HI
t
LO
t
SUCS
t
DO
t
EN
t
DIS
t
CSH
t
R
t
F
—
—
312
312
100
—
—
—
625
—
—
—
—
—
—
—
—
—
—
—
—
—
1.6
0.8
—
—
—
200
200
100
—
100
100
MHz
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
See Test Circuits,
Figure 1-2
See Test Circuits,
Figure 1-2
See Test Circuits,
Figure 1-2
(Note
1)
See Test Circuits,
Figure 1-2
(Note
1)
See Test Circuits,
Figure 1-2
(Note
1)
V
DD
I
DD
I
DDS
2.7
—
—
—
—
300
210
0.5
5.5
400
—
2
V
µA
µA
µA
V
DD
= 5.0V, D
OUT
unloaded
V
DD
= 2.7V, D
OUT
unloaded
CS = V
DD
= 5.0V
This parameter is established by characterization and not 100% tested.
See graph that relates linearity performance to V
REF
level.
Because the sample cap will eventually lose charge, effective clock rates below 10 kHz can affect linearity performance,
especially at elevated temperatures. See
Section 6.2 “Maintaining Minimum Clock Speed”
for more information.
TEMPERATURE CHARACTERISTICS
Electrical Specifications:
Unless otherwise indicated, V
DD
= +2.7V to +5.5V, V
SS
= GND.
Parameters
Temperature Ranges
Specified Temperature Range
Operating Temperature Range
Storage Temperature Range
Thermal Package Resistances
Thermal Resistance, 8L-MSOP
Thermal Resistance, 8L-PDIP
Thermal Resistance, 8L-SOIC
Thermal Resistance, 8L-TSSOP
JA
JA
JA
JA
—
—
—
—
211
89.5
149.5
139
—
—
—
—
°C/W
°C/W
°C/W
°C/W
T
A
T
A
T
A
-40
-40
-65
—
—
—
+85
+85
+150
°C
°C
°C
Sym
Min
Typ
Max
Units
Conditions
DS21290F-page 4
1998-2011 Microchip Technology Inc.
MCP3201
t
CSH
CS
t
SUCS
t
HI
t
LO
CLK
t
EN
D
OUT
HI-Z
t
DO
NULL BIT
MSB OUT
t
R
t
F
t
DIS
LSB
HI-Z
FIGURE 1-1:
Serial Timing.
Load circuit for t
DIS
and t
EN
Test Point
V
DD
3 kΩ
Test Point
D
OUT
C
L
= 30 pF
V
DD
/2
t
DIS
Waveform 2
t
EN
Waveform
t
DIS
Waveform 1
Load circuit for t
R
, t
F
, t
DO
1.4V
D
OUT
3 kΩ
30 pF
V
SS
Voltage Waveforms for t
R
, t
F
D
OUT
t
R
t
F
V
OH
V
OL
Voltage Waveforms for t
EN
CS
CLK
D
OUT
t
EN
1
2
3
4
B9
Voltage Waveforms for t
DO
CS
CLK
t
DO
D
OUT
Voltage Waveforms for t
DIS
V
IH
90%
t
DIS
D
OUT
Waveform 2†
10%
D
OUT
Waveform 1*
* Waveform 1 is for an output with internal condi-
tions such that the output is high, unless disabled
by the output control.
† Waveform 2 is for an output with internal condi-
tions such that the output is low, unless disabled
by the output control.
FIGURE 1-2:
Test Circuits.
1998-2011 Microchip Technology Inc.
DS21290F-page 5
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