a
FEATURES
250 MHz Operation
Driver/Comparator Included
52-Lead LQFP Package with Built-in Heat Sink
High Performance Driver/Comparator
on a Single Chip
AD53033
FUNCTIONAL BLOCK DIAGRAM
V
CC
VH
47
VTERM
45
DATA
37
DATAB
38
IOD
43
IODB
42
RLD
49
RLDB
50
V
L 31
HCOMP
LEH
LEHB
QH
QHB
50
DRIVER
V
OUT
VLDCPL
VHDCPL
V
CC
V
CC
51
52
V
EE
32
V
EE
39
V
EE
40
V
EE
41
APPLICATIONS
Automatic Test Equipment
Semiconductor Test Systems
Board Test Systems
Instrumentation and Characterization Equipment
AD53033
PRODUCT DESCRIPTION
COMPARATOR
QL
QLB
LEL
LELB
LCOMP
The AD53033 is a single chip that performs the pin electronics
functions of driver and comparator (D-C) in ATE VLSI and
memory testers.
The driver is a proprietary design that features three active
states: Data High Mode, Data Low Mode and Term Mode as
well as an Inhibit State. This facilitates the implementation of
high speed active termination. The output voltage range is –3 V
to +8 V to accommodate a wide variety of test devices. The
output leakage is typically less than 250 nA over the entire sig-
nal range.
The dual comparator, with an input range equal to the driver
output range, features built-in latches and ECL-compatible
outputs. The outputs are capable of driving 50
Ω
signal lines
terminated to –2 V. Signal tracking capability is upwards of
5 V/ns.
Also included on the chip is an onboard temperature sensor
whose purpose is to give an indication of the surface tempera-
ture of the D-C. This information can be used to measure
θ
JC
and
θ
JA
or flag an alarm if proper cooling is lost. Output from the
NC
THERM
1.0 A/K
9, 33, 44, 46, 48
2, 5, 8
PWRGND
NC = NO CONNECT
ECLGND
HQGND2
sensor is a current sink that is proportional to absolute tempera-
ture. The gain is trimmed to a nominal value of 1.0
µA/K.
As
an example, the output current can be sensed by using a 10 kΩ
resistor connected from +10 V to the THERM (IOUT) pin. A
voltage drop across the resistor will be developed that equals:
10K
×
1
µA/K
= 10 mV/K = 2.98 V at room temperature.
REV. 0
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781/329-4700
World Wide Web Site: http://www.analog.com
Fax: 781/326-8703
© Analog Devices, Inc., 1999
AD53033–SPECIFICATIONS
DRIVER SPECIFICATIONS
(All specifications are at T
J
= +85 C 5 C, +V
S
= +12 V 3%, –V
S
= –7 V =
measured at T
J
= +75 C to +95 C). CHDCPL = CLDCPL = 39 nF.
Parameter
DIFFERENTIAL INPUT CHARACTERISTICS
(DATA to
DATA,
IOD to
IOD,
RLD to
RLD)
Input Voltage
Differential Input Range
Bias Current
REFERENCE INPUTS
Bias Currents
OUTPUT CHARACTERISTICS
Logic High Range
Min
Typ
Max
Units
3% unless otherwise noted. All temperature coefficients are
Test Conditions
–2
ECL
–250
–50
–2
0
+250
+50
8
V
µA
µA
V
V
IN
= –2 V, 0.0 V
V
L
, V
H
, V
T
= 5 V
DATA = H, V
H
= –2 V to +8 V
V
L
= –3 V (V
H
= –2 V to +6 V)
V
L
= –1 V (V
H
= +6 V to +8 V)
DATA = L, V
L
= –3 V to +5 V, V
H
= +6 V
V
L
= 0.0 V, V
H
= +0.1 V, V
T
= 0 V
V
L
= –2 V, V
H
= +7 V, V
T
= 0 V
DATA = H, V
H
= 0 V, V
L
= –3 V, V
T
= +3 V
DATA = H, V
H
= –2 V to +8 V, V
L
= –3 V, V
T
= +3 V
DATA = L, V
L
= –3 V, V
H
= +6 V, V
T
= +7.5 V
DATA = L, V
L
= 0 V , V
H
= +6 V, V
T
= +7.5 V
V
L
= 0 V, V
H
= +5 V, V
T
= 0 V
V
L
= –3 V, V
T
= 0 V, I
OUT
= 0, +1, +30 mA
V
L
= –1 V, V
T
= 0 V, I
OUT
= 0, –1, –30 mA
V
H
= +6 V, V
T
= 0 V, I
OUT
= 0, +1, +30 mA
V
H
= +6 V, V
T
= 0 V, I
OUT
= 0, –1, –30 mA
V
L
= 0 V, V
T
= 0 V, I
OUT
= –30 mA (Trim Point)
C
BYP
= 39 nF, V
H
= +7 V, V
L
= –2 V, V
T
= 0 V
Output to –3 V, V
H
= +8 V, V
L
= –1 V, V
T
= 0 V
DATA = H and Output to +8 V, V
H
= +6 V,
V
L
= –3 V, V
T
= 0 V, DATA = L
TERM MODE, V
T
= –3 V to +8 V, V
L
= 0 V, V
H
= 3 V
TERM MODE, V
T
= 0 V, V
L
= 0 V, V
H
= 3 V
TERM MODE, V
T
= –3 V to +8 V, V
L
= 0 V, V
H
= 3 V
V
T
= 0 V, V
L
= 0 V, V
H
= 3 V
I
OUT
= +30 mA, +1.0 mA, V
T
= –3.0 V, V
H
= 3 V, V
L
= 0 V
I
OUT
= –30 mA, –1.0 mA, V
T
= +8.0 V, V
H
= 3 V, V
L
= 0 V
I
OUT
=
±
30 mA,
±
1.0 mA, V
T
= 0 V, V
H
= 3 V, V
L
= 0 V
Measured at 50%, V
H
= +400 mV, V
L
= –400 mV
Measured at 50%, V
H
= +400 mV, V
L
= –400 mV
Measured at 50%, V
H
= +400 mV, V
L
= –400 mV
Measured 20%–80%, V
L
= 0 V, V
H
= 1 V
Measured 20%–80%, V
L
= 0 V, V
H
= 3 V
Measured 10%–90%, V
L
= 0 V, V
H
= 5 V
Measured 10%–90%, V
L
= –2 V, V
H
= 7 V
Measured 20%–80%, V
L
= 0 V, V
H
= 1 V
Measured 20%–80%, V
L
= 0 V, V
H
= 3 V
Measured 10%–90%, V
L
= 0 V, V
H
= 5 V
V
L
, V
H
= –0.1 V, 0.1 V, V
L
, V
H
= 0.0 V, 1.0 V
V
L
, V
H
= 0.0 V, 3.0 V, V
L
, V
H
= 0.0 V, 5.0 V
V
L
, V
H
= –2.0 V, 7.0 V
V
L
= 0 V, V
H
= 0.5 V
V
L
= 0 V, V
H
= 0.5 V
Logic Low Range
Amplitude (V
H
and V
L
)
Absolute Accuracy
V
H
Offset
V
H
Gain + Linearity Error
V
L
Offset
V
L
Gain + Linearity Error
Offset TC
Output Resistance
V
H
= –2 V
V
H
= +8 V
V
L
= –3 V
V
L
= +5 V
V
H
= +3 V
Dynamic Current Limit
Static Current Limit
–3
0.1
–50
0.3 – 5
–50
–0.3 – 5
0.5
44
44
44
44
100
–85
46
46
46
46
46
5
9
+50
+0.3 + 5
+50
+0.3 + 5
V
V
mV
% of V
H
+ mV
mV
% of V
L
+ mV
mV/°C
Ω
Ω
Ω
Ω
Ω
mA
mA
48
48
48
48
+85
V
TERM
Voltage Range
V
TERM
Offset
V
TERM
Gain + Linearity Error
Offset TC
Output Resistance
–3
–50
–0.3 + 5
44
0.5
46
8.0
+50
+0.3 + 5
49
V
mV
% of V
SET
+ mV
mV/°C
Ω
DYNAMIC PERFORMANCE, (V
H
AND V
L
)
Propagation Delay Time
Propagation Delay TC
Delay Matching, Edge to Edge
Rise and Fall Times
1 V Swing
3 V Swing
5 V Swing
9 V Swing
Rise and Fall Time Temperature Coefficient
1 V Swing
3 V Swing
5 V Swing
Overshoot and Preshoot
1.1
1.6
2.1
2
<100
0.6
1.0
1.7
3.0
±
1
±
2
±
4
ns
ps/°C
ps
ns
ns
ns
ns
ps/°C
ps/°C
ps/°C
% of Step + mV
–3.0 – 50
+3.0 + 50
Settling Time
to 15 mV
to 4 mV
<50
<10
ns
µs
–2–
REV. 0
AD53033
Parameter
Delay Change vs. Pulsewidth
Minimum Pulsewidth
3 V Swing
5 V Swing
Toggle Rate
DYNAMIC PERFORMANCE, INHIBIT
Delay Time, Active to Inhibit
Delay Time, Inhibit to Active
Delay Time Matching (Z)
1.5
1.5
Min
Typ
<50
2
3
250
4.0
3.5
±
2.2
Max
Units
ps
ns
ns
MHz
ns
ns
ns
Test Conditions
V
L
= 0 V, V
H
= 2 V
V
L
= 0 V, V
H
= 3 V, 90% Reached, Measure @ 50%
V
L
= 0 V, V
H
= 5 V, 90% Reached, Measure @ 50%
V
L
= 0 V, V
H
= 5 V, VDUT > 3.0 V p-p
Measured at 50%, V
H
= +2 V, V
L
= –2 V
Measured at 50%, V
H
= +2 V, V
L
= –2 V
Z = Delay Time Active to Inhibit Test (Above)—
Delay Time Inhibit to Active Test (Above)
(Of Worst Two Edges)
V
H
= 0 V, V
L
= 0 V
V
H
= +2 V, V
L
= –2 V (Measured 20%/80% of 1 V Output)
V
H
= +2 V, V
L
= –2 V (Measured 20%/80% of 1 V Output)
Measured at 50%, V
L
= V
H
= +0.4 V, V
TERM
= –0.4 V
Measured at 50%, V
L
= V
H
= +0.4 V, V
TERM
= –0.4 V
Measured at 50%, V
L
= V
H
= +0.4 V, V
TERM
= –0.4 V
V
H
/V
L
, V
TERM
= (+0.4 V, –0.4 V), (0.0 V, –2.0 V),
(0.0 V, +7.0 V)
V
L
, V
H
= 0 V, V
TERM
= –2 V, 20%–80%
V
L
, V
H
= 0 V, V
TERM
= –2 V, 20%–80%
V
S
= V
S
±
3%
I/O Spike
Rise, Fall Time, Active to Inhibit
Rise, Fall Time, Inhibit to Active
DYNAMIC PERFORMANCE , V
TERM
Delay Time, V
H
to V
TERM
Delay Time, V
L
to V
TERM
Delay Time, V
TERM
to V
H
and V
TERM
to V
L
Overshoot and Preshoot
V
TERM
Mode Rise Time
V
TERM
Mode Fall Time
PSRR, DRIVE or TERM Mode
Specifications subject to change without notice.
<200
3.5
2.2
3.0
5.0
4.0
+3.0 + 75
4.0
5.5
35
mV, p-p
ns
ns
ns
ns
ns
% of Step + mV
ns
ns
dB
–3.0 + 75
COMPARATOR SPECIFICATIONS
(All specifications are at T
J
= +85 C
measured at T
J
= +75 C to +95 C).
Parameter
DC INPUT CHARACTERISTICS
Offset Voltage (V
OS
)
Offset Voltage (Drift)
HCOMP, LCOMP Bias Current
Voltage Range (V
CM
)
Differential Voltage (V
DIFF
)
Gain and Linearity
LATCH ENABLE INPUTS
Logic “1” Current (I
IH
)
Logic “0” Current (I
IL
)
DIGITAL OUTPUTS
Logic “1” Voltage (V
OH
)
Logic “0” Voltage (V
OL
)
Slew Rate
SWITCHING PERFORMANCE
Propagation Delay
Input to Output
Latch Enable to Output
Propagation Delay Temperature Coefficient
Propagation Delay Change with Respect to
Slew Rate: 0.5 V, 1.0 V, 3.0 V/ns
Slew Rate: 5.0 V/ns
Amplitude: 1.0 V, 3.0 V, 5.0 V
Equivalent Input Rise Time
Pulsewidth Linearity
Settling Time
Latch Timing
Input Pulsewidth
Setup Time
Hold Time
Specifications subject to change without notice.
5 C, +V
S
= +12 V
Min
–25
50
–50
–3
–0.05
3%, –V
S
= –7 V =
Typ
Max
25
50
8.0
9.0
0.05
250
Units
3% unless otherwise noted. All temperature coefficients are
Test Conditions
CMV = 0 V
CMV = 0 V
V
IN
= 0 V
mV
µV/°C
µA
V
V
% FSR
µA
µA
V
V
V/ns
V
IN
= –3 V to +8 V
LE,
LE
= –0.8 V
LE,
LE
= –1.8 V
Q or
Q,
50
Ω
to –2 V
Q or
Q,
50
Ω
to –2 V
–250
–0.98
–1.5
1
0.9
2
2
<± 100
<± 350
<± 200
450
<± 200
<25
<1.5
<1.0
<1.0
2.5
ns
ns
ps/°C
ps
ps
ps
ps
ps
ns
ns
ns
ns
V
IN
= 2 V p-p,
HCOMP = +1 V, LCOMP = +1 V
V
IN
= 0 V to 5 V
V
IN
= 0 V to 5 V
V
IN
= 1.0 V/ns
V
IN
= 0 V to 3 V, 3 V/ns
V
IN
= 0 V to 3 V, 3 V/ns, PW = 3 ns–8 ns
Settling to
±
8 mV, V
IN
= 1 V to 0 V
REV. 0
–3–
AD53033–SPECIFICATIONS
TOTAL FUNCTION SPECIFICATIONS
(All specifications are at T
J
= +85 C
measured at T
J
= +75 C to +95 C).
Parameter
OUTPUT CHARACTERISTICS
Output Leakage Current, V
OUT
= –2 V to +7 V
Output Leakage Current, V
OUT
= –3 V to +8 V
Output Capacitance
POWER SUPPLIES
Total Supply Range
Positive Supply
Negative Supply
Positive Supply Current
Negative Supply Current
Total Power Dissipation
Temperature Sensor Gain Factor
5 C, +V
S
= +12 V
Min
–500
–2
3%, –V
S
= –7 V =
Typ
Max
+500
+2
6
19
12
–7
178
195
3.5
1.4
3% unless otherwise noted. All temperature coefficients are
Units
nA
µA
pF
V
V
V
mA
mA
W
µA/K
Test Conditions
Driver INHIBITED
0.7
1
Driver = Active
Driver = Active
Driver = Active
R
LOAD
= 10 kΩ, V
SOURCE
= +10 V
NOTES
Connecting or shorting the decoupling pins to ground will result in the destruction of the device.
Specifications subject to change without notice.
Table I. Driver Truth Table
DATA
0
1
X
X
DATA
1
0
X
X
IOD
1
1
0
0
IOD
0
0
1
1
RLD
X
X
0
1
RLD
X
X
1
0
OUTPUT STATE
VL
VH
INH
VTERM
Table II. Comparator Truth Table
V
OUT
>HCOMP
>HCOMP
<HCOMP
<HCOMP
X
>LCOMP
<LCOMP
>LCOMP
<LCOMP
X
LEH
1
1
1
1
0
LEH
0
0
0
0
1
LEL
1
1
1
1
0
LEL
0
0
0
0
1
QH
OUTPUT STATES
QH
QL
0
0
1
1
QH
(t-1)
1
0
1
0
QL (t-1)
QL
0
1
0
1
QL
(t-1)
1
1
0
0
QH (t-1)
–4–
REV. 0
AD53033
ABSOLUTE MAXIMUM RATINGS
1
Power Supply Voltage
+V
S
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +13 V
–V
S
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –8 V
+V
S
to –V
S
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +20 V
PWR GND to ECL GND or HQ GND . . . . . . . . . .
±
0.4 V
Inputs
DATA,
DATA,
IOD,
IOD,
RLD,
RLD
. . . . . . +5 V, –3 V
DATA to
DATA,
IOD to
IOD,
RLD to
RLD
. . . . . . .
±
3 V
LEL,
LEL,
LEH,
LEH
. . . . . . . . . . . . . . . . . . . +5 V, –3 V
LEL to
LEL,
LEH to
LEH
. . . . . . . . . . . . . . . . . . . . .
±
3 V
VH, VL, VTERM to GND . . . . . . . . . . . . . . . . +9 V, –4 V
VH to VL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
±
11 V
(VH – VTERM) and (VTERM – VL) . . . . . . . . . . . .
±
11 V
HCOMP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +9 V, –4 V
LCOMP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +9 V, –4 V
HCOMP, LCOMP to V
OUT
. . . . . . . . . . . . . . . . . . .
±
11 V
Outputs
V
OUT
Short Circuit Duration . . . . . . . . . . . . . . . . Indefinite
2
V
OUT
Inhibit Mode . . . . . . . . . . . . . . . . . . . . . . . +9 V, –4 V
VHDCPL . . . . . . . . Do Not Connect Except for Cap to V
CC
VLDCPL . . . . . . . . Do Not Connect Except for Cap to V
EE
QH,
QH,
QL,
QL
Maximum I
OUT
Continuous . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 mA
Surge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .100 mA
THERM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +13 V, 0 V
Environmental
Operating Temperature (Junction) . . . . . . . . . . . . . . +175°C
Storage Temperature . . . . . . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 10 sec)
3
. . . . . . . . . . +260°C
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Absolute maximum limits apply
individually, not in combination. Exposure to absolute maximum rating condi-
tions for extended periods may affect device reliability.
2
Output short circuit protection to ground is guaranteed as long as proper heat
sinking is employed to ensure compliance with the operating temperature limits.
3
To ensure lead coplanarity (± 0.002 inches) and solderability, handling with bare
hands should be avoided and the device should be stored in environments at 24
°C
±
5°C (75°F
±
10°F) with relative humidity not to exceed 65%.
Table III. Package Thermal Characteristics
Air Flow, FM
0
200
400
JA
,
C/W
33
25
22
ORDERING GUIDE
Model
AD53033JSTP
Package
Description
52-Lead LQFP-EDQUAD
Shipment Method
Quantity per
Shipping Container
90
Package
Option
SQ-52
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD53033 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
REV. 0
–5–
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