PS-AT17LV010
Rev A
1
1.1
1.2
1.3
1.4
1.5
1.6
SUMMARY
GENERAL........................................................................................................................ 4
Scope .............................................................................................................................................................4
Identification..................................................................................................................................................4
Absolute maximum ratings..........................................................................................................................4
Recommended operating conditions..........................................................................................................4
Radiation features.........................................................................................................................................4
Handling precautions ...................................................................................................................................4
2
3
3.1
3.1.1
3.1.2
3.1.3
3.1.4
3.2
3.2.1
3.2.2
3.2.3
3.3
3.4
3.4.1
3.4.2
3.5
3.5.1
3.5.2
3.5.3
3.6
3.6.1
3.6.2
APPLICABLE DOCUMENTS .......................................................................................... 5
REQUIREMENTS ............................................................................................................ 5
Design, construction, and physical dimensions. ......................................................................................5
Package type. .................................................................................................................................................5
Terminal connections......................................................................................................................................5
Block diagram. ................................................................................................................................................5
Timing waveforms...........................................................................................................................................5
Marking ..........................................................................................................................................................5
Lead Identification...........................................................................................................................................5
Component Number........................................................................................................................................5
Traceability Information...................................................................................................................................6
Electrical characteristics..............................................................................................................................6
Burn-in test....................................................................................................................................................6
Electrical circuit ...............................................................................................................................................6
Parameters drift value.....................................................................................................................................6
Environmental and Endurance Tests..........................................................................................................6
Electrical Circuit for Operating LifeTest ..........................................................................................................6
Electrical Measurements at Completion of Environmental and endurance tests............................................6
Conditions for Operating LifeTest ...................................................................................................................6
Total dose irradiation testing.......................................................................................................................6
Bias Conditions ...............................................................................................................................................6
Electrical Measurements.................................................................................................................................6
4
4.1
4.2
4.3
4.4
4.4.1
4.4.2
4.4.3
4.5
QUALITY ASSURANCE PROVISIONS........................................................................... 6
Wafer lot acceptance test.............................................................................................................................6
Sampling and inspection. ............................................................................................................................7
Screening.......................................................................................................................................................7
Quality conformance inspection .................................................................................................................7
Group A inspection. ........................................................................................................................................7
Group C inspection. ........................................................................................................................................7
Group D inspection. ........................................................................................................................................7
Delta measurements.....................................................................................................................................7
5
5.1
PACKAGING ................................................................................................................... 7
Packaging requirements ..............................................................................................................................7
FIGURES
FIGURE 1. Case outline .............................................................................................................................................................. 10
FIGURE 2. Terminal connections. ............................................................................................................................................... 11
FIGURE 3. Block diagram............................................................................................................................................................ 12
FIGURE 4. Timing waveforms. .................................................................................................................................................... 13
FIGURE 5. Electrical circuit for power burn-in and operating life test............................................................................................ 14
FIGURE 6. Electrical circuit for total dose radiation test. .............................................................................................................. 15
TABLES
TABLE I. Electrical performance characteristics. ........................................................................................................................... 8
TABLE 2. Parameter drift values.................................................................................................................................................... 9
Sheet 3 / 15
PS-AT17LV010
Rev A
1
GENERAL
1.1
Scope
This specification details the ratings, physical and electrical characteristics, tests and inspection
data of the 1 megabit serial EEPROM named AT17LV010. It also defines the specific requirement for
space and military applications with high reliability.
1.2
Identification
Part number
AT17LV010-10DP-MQ
AT17LV010-10DP-SV
Description
1 megabit
serial eeprom
1 megabit
serial eeprom
Access
Time
60ns
60ns
Case
Flat pack 400 mils
28 leads
Flat pack 400 mils
28 leads
Application
Military
application
Space
application
1.3
Absolute maximum ratings
Supply voltage range (V
DD
) ................................................ -0.5V to 7V
Output voltage range (V
OUT
)............................................... -0.1V dc to V
DD
+ 0.5V dc
Power dissipation (Pd) ....................................................... 0,1W
Storage temperature .......................................................... -65°C to 150°C
Maximum junction temperature (T
J
) ................................... 175°C
Thermal resistance junction to case (Θjc) :........................ 9°C/W
Lead temperature (soldering @ 1/16 in, 10 s) ................... 260°C
Endurance.......................................................................... 50,000 write cycles
Data retention .................................................................... 10 years
1.4
Recommended operating conditions.
Supply voltage range (V
DD
) ................................................ 3 V dc to 3.6 V dc
Ambient operating temperature (T
A
) ................................. -55°C to 125°C
Storage temperature ..........................................................
30°C, 20 to 65% RH, dust free, original packing
1.5
Radiation features
Tested up to a Total Dose of (according to MIL STD 883 Method 1019) :
(dose rate 0.1 rad/s).......................................................... 20 kRads (Si) Read Only Mode, when biased
........... 60 kRads (Si) Read Only Mode, when un-biased
No Single Event Latch-up below a LET Threshold of 80 MeV/mg/cm
2
1.6
Handling precautions
These components are susceptible to damage by electrostatic discharge. Therefore, suitable
precautions shall be employed for protection during all phases of manufacturing, testing, shipment and any
handling.
ESD (Rzap = 1.5 kΩ, Czap = 100 pF) ............................... 2000 V (class 3)
Sheet 4 / 15
PS-AT17LV010
Rev A
2
APPLICABLE DOCUMENTS
MIL-PRF-38535 ........................................Integrated Circuits, Manufacturing, General Specification for.
MIL-STD-883 ............................................Test Method Standard Microcircuits.
ASTM Standard F1192-95 ........................Standard guide for the measurement of single event phenomena
from heavy ion irradiation of semiconductor devices
JEDEC Standard EIA/JESD78..................IC latch-up test
ATMEL Aerospace Products Quality Flows
In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence.
3
REQUIREMENTS
3.1
herein.
3.1.1
Package type.
Design, construction, and physical dimensions.
The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and
The package shall be a flat pack 400 mils, 28 leads (figure1). The case shall be hermetically
sealed and have a ceramic body. The leads shall be brazed.
3.1.2
Terminal connections.
The terminal connections shall be as specified on figure 2 .
3.1.3
Block diagram.
The block diagram shall be as specified on figure 3 .
3.1.4
Timing waveforms.
The timing waveforms shall be as specified on figure 4.
3.2
Marking
Each component shall be marked in respect of :
(a) Lead Identification
(b) Component Number
(c) Traceability Information
(d) Manufacturer’s Component Number
3.2.1
Lead Identification
An index shall be located at the top of the package in the position defined in
Figure 1.
3.2.2
Component Number
Each component shall bear the component number which shall be constituted and marked as
follows :
AT17LV010-10DP-XX
Product identification
Speed (10 = 100 ns)
Package (DP = flat pack 28)
Level (MQ=Military Level B – SV=Space Level B)
Sheet 5 / 15
DSP and ARM Processors
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