HY628100B Series
128Kx8bit CMOS SRAM
Document Title
128K x8 bit 5.0V Low Power CMOS slow SRAM
Revision History
Revision No
10
History
Initial Revision History Insert
Draft Date
Jul.14.2000
Remark
Final
This document is a general product description and is subject to change without notice. Hyundai Electronics does not assume any
responsibility for use of circuits described. No patent licenses are implied.
Rev 10 / Jul.00
Hyundai Semiconductor
HY628100B Series
DESCRIPTION
The HY628100B is a high speed, low power and
1M bit CMOS Static Random Access Memory
organized as 131,072 words by 8bit. The
HY628100B uses high performance CMOS
process technology and designed for high speed
low power circuit technology. It is particulary well
suited for used in high density low power system
application. This device has a data retention
mode that guarantees data to remain valid at a
minimum power supply voltage of 2.0V.
FEATURES
•
Fully static operation and Tri-state output
•
TTL compatible inputs and outputs
•
Battery backup(L/LL-part)
-. 2.0V(min) data retention
•
Standard pin configuration
-. 32 - SOP - 525mil
-. 32 - TSOPI - 8X20(Standard)
Product
Voltage
Speed
Operation
No
(V)
(ns)
Current/Icc(mA)
HY628100B
4.5~5.5 50*/55/70/85
10
Comment : 50ns is available with 30pF test load.
Standby Current(uA)
L
LL
100
20
Temperature
(°C)
0~70
PIN CONNECTION
NC
A16
A14
A12
A7
A6
A5
A4
A3
A2
A1
A0
I/O1
I/O2
I/O3
Vss
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
Vcc
A15
CS2
/WE
A13
A8
A9
A11
/OE
A10
/CS1
I/O8
I/O7
I/O6
I/O5
I/O4
A11
A9
A8
A13
/WE
CS2
A15
Vcc
NC
A16
A14
A12
A7
A6
A5
A4
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
/OE
A10
/CS1
DQ8
DQ7
DQ6
DQ5
DQ4
Vss
DQ3
DQ2
DQ1
A0
A1
A2
A3
SOP
TSOP-I(Standard)
PIN DESCRIPTION
Pin Name
/CS1
CS2
/WE
/OE
A0 ~ A16
I/O1 ~ I/O8
Vcc
Vss
Pin Function
Chip Select 1
Chip Select 2
Write Enable
Output Enable
Address Inputs
Data Inputs / Outputs
Power(4.5V~5.5V)
Ground
BLOCK DIAGRAM
A0
ROW
DECODER
SENSE AMP
I/O1
ADD INPUT
BUFFER
DATA I/O
BUFFER
COLUMN
DECODER
MEMORY ARRAY
128K x 8
WRITE DRIVER
A16
I/O8
/CS1
CONTROL
LOGIC
CS2
/OE
/WE
Rev 10 / Jul.00
2
HY628100B Series
ORDERING INFORMATION
Part No.
Speed
Power
HY628100BLG
55/70/85
L-part
HY628100BLLG
55/70/85
LL-part
HY628100BLT1
55/70/85
L-part
HY628100BLLT1
55/70/85
LL-part
Comment : 50ns is available with 30pF test load.
Temp
Package
SOP
SOP
TSOPI(Standard)
TSOPI(Standard)
ABSOLUTE MAXIMUM RATING (1)
Symbol
Vcc, V
IN,
V
OUT
T
A
T
STG
P
D
I
OUT
T
SOLDER
Parameter
Power Supply, Input/Output Voltage
Operating Temperature
Storage Temperature
Power Dissipation
Data Output Current
Lead Soldering Temperature & Time
Rating
-0.5 to 7.0
0 to 70
-65 to 125
1.0
50
260
•10
Unit
V
°C
°C
W
mA
°C•sec
Note
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent
damage to the device. This is stress rating only and the functional operation of the device under these
or any other conditions above those indicated in the operation of this specification is not implied.
Exposure to the absolute maximum rating conditions for extended period may affect reliablity.
TRUTH TABLE
/CS1
H
X
L
L
L
CS2
X
L
H
H
H
/WE
X
X
H
H
L
/OE
X
X
H
L
X
Mode
Deselected
Deselected
Output Disabled
Read
Write
I/O
High-Z
High-Z
High-Z
Data Out
Data In
Power
Standby
Standby
Active
Active
Active
Note :
1. H=V
IH
, L=V
IL
, X=don't care( V
IH or
V
IL )
Rev 10 / Jul.00
2
HY628100B Series
RECOMMENDED DC OPERATING CONDITION
T
A
=0°C to 70°C
Symbol
Parameter
Vcc
Supply Voltage
Vss
Ground
V
IH
Input High Voltage
V
IL
Input Low Voltage
Min.
4.5
0
2.2
-0.5
(1)
Typ.
5.0
0
-
-
Max.
5.5
0
Vcc+0.5
0.8
Unit
V
V
V
V
Note :
1. V
IL
= -1.5V for pulse width less than 30ns and not 100% tested
DC ELECTRICAL CHARACTERISTICS
Vcc = 4.5V~5.5V, T
A
= 0°C to 70°C, unless otherwise specified
Symbol
Parameter
Test Condition
I
LI
Input Leakage Current
Vss < V
IN
< Vcc
I
LO
Output Leakage Current
Vss < V
OUT
< Vcc, /CS1 = V
IH
or
CS2 = V
IL
or
/
OE
=
V
IH
or /WE = V
IL
Icc
Operating Power Supply
/CS1 = V
IL
, CS2 = V
IH,
Current
V
IN
= V
IH
or V
IL,
I
I/O =
0mA
I
CC1
Average Operating
/CS1 = V
IL
, CS2 = V
IH
,
Current
V
IN
= V
IH
or V
IL
Cycle Time = Min, 100% duty,
I
IO
= 0mA
I
SB
TTL Standby Current
/CS1 = V
IH
or CS2 = V
IL
(TTL Input)
I
SB1
Standby Current
/CS1 > Vcc - 0.2V
L
(CMOS Input)
CS2 < 0.2V or
LL
CS2 > Vcc - 0.2V
V
OL
Output Low Voltage
I
OL
= 2.1mA
V
OH
Output High Voltage
I
OH =
-1mA
Note : Typical values are at Vcc = 5.0V, T
A
= 25°C
Min.
-1
-1
-
-
Typ.
-
-
-
-
Max.
1
1
10
50
Unit
uA
uA
mA
mA
-
-
-
-
2.4
-
2
1
-
-
2
100
20
0.4
-
mA
uA
uA
V
V
CAPACITANCE
Temp = 25°C, f= 1.0MHz
Symbol
Parameter
C
IN
Input Capacitance
C
OUT
Output Capacitance
Condition
V
IN
= 0V
V
I/O
= 0V
Max.
6
8
Unit
pF
pF
Note : These parameters are sampled and not 100% tested
Rev 10 / Jul.00
3
HY628100B Series
AC CHARACTERISTICS
Vcc = 4.5V~5.5V, T
A
= 0°C to 70°C, unless otherwise specified
-55
# Symbol
Parameter
Min.
Max.
READ CYCLE
1
tRC
Read Cycle Time
55
-
2
tAA*
Address Access Time
-
55
3
tACS* Chip Select Access Time
-
55
4
tOE
Output Enable to Output Valid
-
25
5
tCLZ
Chip Select to Output in Low Z
10
-
6
tOLZ
Output Enable to Output in Low Z
5
-
7
tCHZ
Chip Deselection to Output in High Z
0
20
8
tOHZ
Out Disable to Output in High Z
0
20
9
tOH
Output Hold from Address Change
10
-
WRITE CYCLE
10 tWC
Write Cycle Time
55
-
11 tCW
Chip Selection to End of Write
45
-
12 tAW
Address Valid to End of Write
45
-
13 tAS
Address Set-up Time
0
-
14 tWP
Write Pulse Width
40
-
15 tWR
Write Recovery Time
0
-
16 tWHZ
Write to Output in High Z
0
20
17 tDW
Data to Write Time Overlap
25
-
18 tDH
Data Hold from Write Time
0
-
19 tOW
Output Active from End of Write
5
-
Comment : tAA* and tACS* can meet 50ns with 30pF test load.
-70
Min.
Max.
70
-
-
-
10
5
0
0
10
70
60
60
0
50
0
0
30
0
5
-
70
70
35
-
-
25
25
-
-
-
-
-
-
-
25
-
-
-
-85
Min
Max.
85
-
-
-
10
5
0
0
10
85
70
70
0
55
0
0
40
0
5
-
85
85
45
-
-
30
30
-
-
-
-
-
-
-
30
-
-
-
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
AC TEST CONDITIONS
T
A
= 0°C to 70°C, unless otherwise specified
Parameter
Input Pulse Level
Input Rise and Fall Time
Input and Output Timing Reference Level
Output Load
Comment
* : Test load is 30pF for 50ns
Value
0.8V to 2.4V
5ns
1.5V
CL = 100pF + 1TTL Load
CL* = 30pF + 1TTL Load
AC TEST LOADS
TTL
CL(1)
Note : Including jig and scope capacitance
Rev 10 / Jul.00
4
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