INCH POUND
The documentation and process conversion
measures necessary to comply with this revision
shall be completed by 24 February 2005.
MIL-PRF-19500/356H
24 November 2004
SUPERSEDING
MIL-PRF-19500/356G
5 September 2003
PERFORMANCE SPECIFICATION SHEET
SEMICONDUCTOR DEVICE, DIODE, SILICON, VOLTAGE REGULATOR,
TYPES 1N4954 THROUGH 1N4996, 1N5968, 1N5969, AND 1N6632 THROUGH 1N6637,
1N4954US THROUGH 1N4996US, 1N5968US, 1N5969US, AND 1N6632US THROUGH 1N6637US,
AND C AND D TOLERANCE SUFFIX DEVICES,
JAN, JANTX, JANTXV, JANS, JANHC, AND JANKC
This specification is approved for use by all Departments
and Agencies of the Department of Defense.
*
The requirements for acquiring the product described herein shall consist of
this specification sheet and MIL-PRF-19500.
1. SCOPE
1.1 Scope. This specification covers the performance requirements for silicon, voltage regulator diodes. Four
levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500, and two
levels of product assurance for each unencapsulated device type die.
1.2 Physical dimensions. See figures 1 (axial leaded), 2 (surface mount), and 3 (die).
* 1.3 Maximum ratings. Maximum ratings are as shown in maximum test ratings herein (see 3.10) and as follows:
P
T
at
T
L
= +65°C
L = .375 inch
(9.53 mm)
1N4954
through
1N4996
P
T
at
T
L
= +25°C
L = .375 inch (9.53
mm)
1N5968,
1N5969,
1N6632 through
1N6637
P
T
at
T
EC
= +125°C
1N4954US
through
1N4996US
N5968US,
1N5969US,
1N6632US through
1N6637US
5 W (3)
T
J
and T
STG
Barometric pressure
reduced (high altitude
operation)
1N4954 through
1N4996
1N5968,
1N5969,
1N6632 through
1N6637
including US suffix
8 mHg
1N4954 through
1N4996
1N5968,
1N5969,
1N6632 through
1N6637
including US suffix
-65°C to +175°C
5 W (1)
5 W (2)
(1) Derate: See figure 4 herein.
(2) Derate: See figure 5 herein.
(3) Derate: See figures 5, 6 and 7 herein.
* Comments, suggestions, or questions on this document should be addressed to Defense Supply Center,
Columbus, ATTN: DSCC-VAC, P.O. Box 3990, Columbus, OH 43218-3990, or emailed to
Semiconductor@dscc.dla.mil.
Since contact information can change, you may want to verify the currency of this
address information using the ASSIST Online database at
http://assist.daps.dla.mil
..
AMSC N/A
FSC 5961.
MIL-PRF-19500/356H
* 1.4 Primary electrical characteristics. Primary electrical characteristics are as shown in maximum test ratings
herein (see 3.10) and as follows:
R
θJL
= 22°C/W (max)
L = .375 inch
(9.53 mm)
1N4954 through
1N4996
R
θJL
= 30°C/W (max)
L = .375 inch
(9.53 mm)
1N5968, 1N5969,
1N6632 through 1N6637
R
θJEC
= 7°C/W (max)
L = 0 inch
R
θJEC
= 10°C/W (max)
L = 0 inch
1N4954US through
1N4996US
1N5968US, 1N5969US,
1N6632US through
1N6637US
2. APPLICABLE DOCUMENTS
* 2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This
section does not include documents cited in other sections of this specification or recommended for additional
information or as examples. While every effort has been made to ensure the completeness of this list, document
users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this
specification, whether or not they are listed.
2.2 Government documents.
* 2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a
part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are
those cited in the solicitation or contract.
*
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-19500
*
-
Semiconductor Devices, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-750
-
Test Methods for Semiconductor Devices.
* (Copies of these documents are available online at
http://assist.daps.dla.mil
or from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.3 Order of precedence. In the event of a conflict between the text of this document and the references cited
herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws
and regulations unless a specific exemption has been obtained.
3. REQUIREMENTS
3.1 General. The individual item requirements shall be as specified in MIL-PRF-19500 and as modified herein.
3.2 Qualification. Devices furnished under this specification shall be products that are manufactured by a
manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturer's list (QML)
before contract award (see 4.2 and 6.3).
2
MIL-PRF-19500/356H
Dimensions
Ltr
BL
BD
LL
LU
LD
Min
.130
.090
1.00
.037
Inches
Max
.300
.145
1.300
.050
.043
Millimeters
Min
Max
3.30
7.62
2.29
3.68
25.40
33.02
1.27
0.94
1.09
Notes
3
4
NOTES:
1. Dimensions are in inches.
2. Millimeters are given for general information only.
3. Dimensions BD shall be measured at the largest diameter.
4. Dimension LU defines region of uncontrolled diameter.
5. In accordance with ASME Y14.5M, diameters are equivalent to
φx
symbology..
* FIGURE 1. Physical dimensions, non-surface mount devices.
3
MIL-PRF-19500/356H
Dimensions
Ltr
BL
ECT
S
BD
Min
.200
.019
.003
.137
Inches
Max
.225
.028
.148
Millimeters
Min
Max
5.08
5.72
0.48
0.71
0.08
3.48
3.76
NOTES:
1. Dimensions are in inches.
2. Millimeters are given for general information only.
3. In accordance with ASME Y14.5M, diameters are equivalent to
φx
symbology.
* FIGURE 2. Physical dimensions (surface mount devices (US)) (D5B).
4
MIL-PRF-19500/356H
C version
Type
A
B
C
Inches
Min
.062 sq
.052 sq
.007
Max
.064 sq
.056 sq
.012
Millimeters
Min
Max
1.57 sq
1.63 sq
1.32 sq
1.42 sq
0.18
0.30
NOTES:
1. Dimensions are in inches.
2. Millimeters are given for general information only.
3. Metallization:
Top -
AL.
Back -
AU.
(See 3.4.3)
4. Backside is Anode on 1N4954 through 1N4996.
5. Backside is Cathode on 1N5968, 1N5969, and 1N6632 through 1N6637.
6. In accordance with ASME Y14.5M, diameters are equivalent to
φx
symbology.
* FIGURE 3. Physical dimensions JANHCC and JANKCC (die).
5
京公网安备 11010802033920号
EEWORLD
