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A40MX04-3PQG100IX39

Description
Field Programmable Gate Array, 547-Cell, CMOS, PQFP100,
CategoryProgrammable logic devices    Programmable logic   
File Size3MB,115 Pages
ManufacturerMicrosemi
Websitehttps://www.microsemi.com
Environmental Compliance
Download Datasheet Parametric View All

A40MX04-3PQG100IX39 Overview

Field Programmable Gate Array, 547-Cell, CMOS, PQFP100,

A40MX04-3PQG100IX39 Parametric

Parameter NameAttribute value
Is it Rohs certified?conform to
MakerMicrosemi
package instructionQFP, QFP100,.7X.9
Reach Compliance Codecompliant
JESD-30 codeR-PQFP-G100
Humidity sensitivity level3
Number of entries69
Number of logical units547
Output times69
Number of terminals100
Maximum operating temperature85 °C
Minimum operating temperature-40 °C
Package body materialPLASTIC/EPOXY
encapsulated codeQFP
Encapsulate equivalent codeQFP100,.7X.9
Package shapeRECTANGULAR
Package formFLATPACK
power supply3.3/5 V
Programmable logic typeFIELD PROGRAMMABLE GATE ARRAY
Certification statusNot Qualified
surface mountYES
technologyCMOS
Temperature levelINDUSTRIAL
Terminal formGULL WING
Terminal pitch0.635 mm
Terminal locationQUAD
5.1
40MX and 42MX FPGA Families
Fe a t ur es
High C apaci t y
Single-Chip ASIC Alternative
3,000 to 54,000 System Gates
Up to 2.5 kbits Configurable Dual-Port SRAM
Fast Wide-Decode Circuitry
Up to 202 User-Programmable I/O Pins
5.6 ns Clock-to-Out
250 MHz Performance
5 ns Dual-Port SRAM Access
100 MHz FIFOs
7.5 ns 35-Bit Address Decode
• Commercial, Military Temperature and MIL-STD-883
Ceramic Packages
• QML Certification
• Ceramic Devices Available to DSCC SMD
E ase of Int egr at io n
• Mixed Voltage Operation (5.0V or 3.3V I/O)
• Synthesis-Friendly Architecture to Support ASIC Design
Methodologies
• Up to 100% Resource Utilization and 100% Pin Fixing
• Deterministic, User-Controllable Timing
• Unique In-System Diagnostic and Verification Capability
with Silicon Explorer II
• Low Power Consumption
• IEEE Standard 1149.1 (JTAG) Boundary Scan Testing
• 5.0V and 3.3V Programmable PCI-Compliant I/O
High P er f or m ance
HiR el Feat ur es
• Commercial, Industrial, and Military Temperature Plastic
Packages
Pr od uc t P r o f i l e
Device
Capacity
A40MX02
A40MX04
A42MX09
A42MX16
A42MX24
A42MX36
System Gates
SRAM Bits
Logic Modules
3,000
N/A
295
9.5 ns
N/A
147
1
57
No
No
44, 68
100
80
6,000
N/A
547
9.5 ns
N/A
273
1
69
No
No
44, 68, 84
100
80
14,000
N/A
348
336
N/A
5.6 ns
N/A
348
516
2
104
No
No
84
100, 160
100
176
24,000
N/A
624
608
N/A
6.1 ns
N/A
624
928
2
140
No
No
84
100, 160, 208
100
176
36,000
N/A
954
912
24
6.1 ns
N/A
954
1,410
2
176
Yes
Yes
84
160, 208
176
54,000
2,560
1,230
1,184
24
6.3 ns
10
1,230
1,822
6
202
Yes
Yes
208, 240
208, 256
272
Sequential
Combinatorial
Decode
Clock-to-Out
SRAM Modules
(64x4 or 32x8)
Dedicated Flip-Flops
Maximum Flip-Flops
Clocks
User I/O
(Maximum)
PCI
Boundary Scan Test (BST)
Packages
(by pin count)
PLCC
PQFP
VQFP
TQFP
CQFP
PBGA
O c t o be r 2 0 0 3
1
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