K7A203600B
K7A203200B
K7A201800B
Document Title
Preliminary
64Kx36/x32 & 128Kx18 Synchronous SRAM
64Kx36 & 64Kx32 & 128Kx18-Bit Synchronous Pipelined Burst SRAM
Revision History
Rev. No
0.0
0.1
History
1. Initial draft
1. Add tCYC 250,225, 200MHz bin.
Draft Date
Dec. 10. 2001
Jan . 17. 2002
Remark
Preliminary
Preliminary
The attached data sheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the
specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions on the parameters of this device. If you have any ques-
tions, please contact the SAMSUNG branch office near your office, call or contact Headquarters.
-1-
Jan 2002
Rev 0.1
K7A203600B
K7A203200B
K7A201800B
Preliminary
64Kx36/x32 & 128Kx18 Synchronous SRAM
64Kx36 & 64Kx32 & 128Kx18-Bit Synchronous Pipelined Burst SRAM
FEATURES
• Synchronous Operation.
• 2 Stage Pipelined operation with 4 Burst.
• On-Chip Address Counter.
• Self-Timed Write Cycle.
• On-Chip Address and Control Registers.
• V
DD
= 3.3V+0.3V/-0.165V Power Supply.
• V
DDQ
Supply Voltage 3.3V+0.3V/-0.165V for 3.3V I/O
or 2.5V+0.4V/-0.125V for 2.5V I/O.
• 5V Tolerant Inputs Except I/O Pins.
• Byte Writable Function.
• Global Write Enable Controls a full bus-width write.
• Power Down State via ZZ Signal.
• LBO Pin allows a choice of either a interleaved burst or a linear
burst.
• Three Chip Enables for simple depth expansion with No Data Cont-
nention ; 2cycle Enable, 1cycle Disable.
• Asynchronous Output Enable Control.
• ADSP, ADSC, ADV Burst Control Pins.
• TTL-Level Three-State Output.
• 100-TQFP-1420A .
• Operating in commeical and industrial temperature range.
GENERAL DESCRIPTION
The K7A203600B, K7A203200B and K7A201800B are
2,359,296-bit Synchronous Static Random Access Memory
designed for high performance second level cache of Pen-
tium and Power PC based System.
It is organized as 64K(128K) words of 36/32(18) bits and
integrates address and control registers, a 2-bit burst
address counter and added some new functions for high
performance cache RAM applications; GW, BW, LBO, ZZ.
Write cycles are internally self-timed and synchronous.
Full bus-width write is done by GW, and each byte write is
performed by the combination of WEx and BW when GW is
high. And with CS
1
high, ADSP is blocked to control signals.
Burst cycle can be initiated with either the address status
processor(ADSP) or address status cache controller(ADSC)
inputs. Subsequent burst addresses are generated inter-
nally in the system′s burst sequence and are controlled by
the burst address advance(ADV) input.
LBO pin is DC operated and determines burst sequence(lin-
ear or interleaved).
ZZ pin controls Power Down State and reduces Stand-by
current regardless of CLK.
The K7A203600B, K7A203200B and K7A201800B are fab-
ricated using SAMSUNG′s high performance CMOS tech-
nology and is available in a 100pin TQFP package. Multiple
power and ground pins are utilized to minimize ground
bounce.
FAST ACCESS TIMES
PARAMETER
Cycle Time
Clock Access Time
Output Enable Access Time
Symbol
tCYC
tCD
tOE
-25
4.0
2.4
2.4
-22
4.4
2.6
2.6
-20
5.0
2.8
2.8
-16
6.0
3.5
3.5
-14
7.2
4.0
4.0
Unit
ns
ns
ns
LOGIC BLOCK DIAGRAM
CLK
LBO
CONTROL
REGISTER
ADV
ADSC
BURST CONTROL
LOGIC
BURST
ADDRESS
A′0~A′1
COUNTER
A0~A1
64Kx36/32 , 128Kx18
MEMORY
ARRAY
ADSP
A0~A15
or A0~A16
ADDRESS
REGISTER
A2~A15
or A2~A16
CS1
CS2
CS2
GW
BW
WEx
(x=a,b,c,d or a,b)
OE
ZZ
DQa0 ~ DQd7
DQPa ~ DQPd
DATA-IN
REGISTER
CONTROL
REGISTER
or DQa0 ~ DQb7
DQPa ~ DQPb
CONTROL
LOGIC
OUTPUT
REGISTER
BUFFER
36/32 or 18
-3-
Jan 2002
Rev 0.1