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IRHLUBCN770Z4

Description
Small Signal Field-Effect Transistor, 0.8A I(D), 60V, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, HERMETIC SELALED, UBCN-4
CategoryDiscrete semiconductor    The transistor   
File Size216KB,11 Pages
ManufacturerInfineon
Websitehttp://www.infineon.com/
Download Datasheet Parametric View All

IRHLUBCN770Z4 Overview

Small Signal Field-Effect Transistor, 0.8A I(D), 60V, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, HERMETIC SELALED, UBCN-4

IRHLUBCN770Z4 Parametric

Parameter NameAttribute value
Is it Rohs certified?incompatible
MakerInfineon
package instructionUBCN-4
Reach Compliance Codeunknown
ECCN codeEAR99
Other featuresLOGIC LEVEL COMPATIBLE
Shell connectionISOLATED
ConfigurationSINGLE WITH BUILT-IN DIODE
Minimum drain-source breakdown voltage60 V
Maximum drain current (Abs) (ID)0.8 A
Maximum drain current (ID)0.8 A
Maximum drain-source on-resistance0.68 Ω
FET technologyMETAL-OXIDE SEMICONDUCTOR
JESD-30 codeR-XDSO-N3
Number of components1
Number of terminals3
Operating modeENHANCEMENT MODE
Maximum operating temperature150 °C
Package body materialUNSPECIFIED
Package shapeRECTANGULAR
Package formSMALL OUTLINE
Peak Reflow Temperature (Celsius)NOT SPECIFIED
Polarity/channel typeN-CHANNEL
Maximum power dissipation(Abs)0.6 W
Certification statusNot Qualified
surface mountYES
Terminal formNO LEAD
Terminal locationDUAL
Maximum time at peak reflow temperatureNOT SPECIFIED
transistor applicationsSWITCHING
Transistor component materialsSILICON
PD-95813H
RADIATION HARDENED
LOGIC LEVEL POWER MOSFET
SURFACE MOUNT (UB)
Product Summary
IRHLUB770Z4
JANSR2N7616UB
60V, N-CHANNEL
REF: MIL-PRF-19500/744
™
TECHNOLOGY
Part Number
Radiation Level R
DS(on)
I
D
QPL Part Number
IRHLUB770Z4 100K Rads (Si)
0.68Ω 0.8A JANSR2N7616UB
IRHLUB730Z4 300K Rads (Si) 0.68Ω 0.8A JANSF2N7616UB
Refer to Page 11 for 3 Additional Part Numbers -
IRHLUBN770Z4, IRHLUBC770Z4, IRHLUBCN770Z4
UB
(SHIELDED METAL LID)
Features
:
International Rectifier’s R7 Logic Level Power MOSFETs
provide simple solution to interfacing CMOS and TTL control
circuits to power devices in space and other radiation
environments. The threshold voltage remains within acceptable
operating limits over the full operating temperature and post
radiation. This is achieved while maintaining single event
gate rupture and single event burnout immunity.
These devices are used in applications such as current boost
low signal source in PWM, voltage comparator and operational
amplifiers.
TM
n
n
n
n
n
n
n
n
n
5V CMOS and TTL Compatible
Fast Switching
Single Event Effect (SEE) Hardened
Low Total Gate Charge
Simple Drive Requirements
Ease of Paralleling
Hermetically Sealed
Light Weight
Complimentary P-Channel Available -
IRHLUB7970Z4, IRHLUBN7970Z4
IRHLUBC7970Z4 & IRHLUBCN7970Z4
Absolute Maximum Ratings
Parameter
ID @ VGS = 4.5V, TC = 25°C Continuous Drain Current
ID @ V GS = 4.5V, TC = 100°C Continuous Drain Current
IDM
Pulsed Drain Current

PD @ TC = 25°C
VGS
EAS
IAR
EAR
dv/dt
TJ
T STG
Max. Power Dissipation
Linear Derating Factor
Gate-to-Source Voltage
Single Pulse Avalanche Energy
‚
Avalanche Current

Repetitive Avalanche Energy

Peak Diode Recovery dv/dt
ƒ
Operating Junction
Storage Temperature Range
Lead Temperature
Weight
For footnotes refer to the last page
0.8
0.5
3.2
0.6
0.005
±10
26.6
0.8
0.06
4.0
-55 to 150
300 (for 5s)
43 (Typical)
Pre-Irradiation
Units
A
W
W/°C
V
mJ
A
mJ
V/ns
°C
mg
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