HCC/HCF4042B
QUAD CLOCKED ”D” LATCH
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CLOCK POLARITY CONTROL
Q AND Q OUTPUTS
COMMON CLOCK
LOW POWER TTL COMPATIBLE
STANDARDIZED SYMMETRICAL OUTPUT
CHARACTERISTICS
QUIESCENT CURRENT SPECIFIED TO 20V
FOR HCC DEVICE
5V, 10V, AND 15V PARAMETRIC RATINGS
INPUT CURRENT OF 100nA AT 18V AND 25°C
FOR HCC DEVICE
100% TESTED FOR QUIESCENT CURRENT
MEETS ALL REQUIREMENTS OF JEDEC TEN-
TATIVE STANDARD N° 13A, ”STANDARD SPE-
CIFICATIONS FOR DESCRIPTION OF ”B”
SERIES CMOS DEVICES”
EY
(Plastic Package)
F
(Ceramic Package)
M1
(Micro Package)
C1
(Plastic Chip Carrier)
ORDER CODES :
HCC4042BF
HCF4042BM1
HCF4042BEY
HCF4042BC1
PIN CONNECTIONS
DESCRIPTION
The
HCC4042B
(extended temperature range) and
HCF4042B
(intermediate temperature range) are
monolithic integrated circuit, available in 16-lead
dual in-line plastic or ceramic package and plastic
micro package.
The
HCC/HCF4042B
types contain four latch cir-
cuits, each strobed by a common clock. Com-
plementary buffered outputs are available from
each circuit. The impedance of the n- and p-channel
output devices is balanced and all outputs are elec-
trically identical.
Information present at the data input is transferred
to outputs Q and Q during the CLOCK level which
is programmed by the POLARITY input. For PO-
LARITY = 0 the transfer occurs during the 0 CLOCK
level and for POLARITY = 1 the transfer occurs dur-
ing the 1 CLOCK level. The outputs follow the data
input providing the CLOCK and POLARITY levels
defined above are present. When a CLOCK transi-
tion occurs (positive for POLARITY = 0 and negative
for POLARITY = 1) the information present at the
input during the CLOCK transition is retained at the
outputs until an opposite CLOCK transition occurs.
June 1989
1/13
HCC/HCF4042B
FUNCTIONAL DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol
V
DD
*
V
i
I
I
P
t ot
Parameter
Supply Voltage :
HC C
Types
H C F
Types
Input Voltage
DC Input Current (any one input)
Total Power Dissipation (per package)
Dissipation per Output Transistor
for T
o p
= Full Package-temperature Range
Operating Temperature :
HCC
Types
H CF
Types
Storage Temperature
Value
– 0.5 to + 20
– 0.5 to + 18
– 0.5 to V
DD
+ 0.5
±
10
200
100
– 55 to + 125
– 40 to + 85
– 65 to + 150
Unit
V
V
V
mA
mW
mW
°C
°C
°C
T
op
T
stg
Stresses above those listed under ”Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections
of this specification is not implied. Exposure to absolute maximum rating conditions for external periods may affect device reliability.
* All voltage values are referred to V
SS
pin voltage.
RECOMMENDED OPERATING CONDITIONS
Symbol
V
DD
V
I
T
op
Parameter
Supply Voltage
HCC
Types
:
HCF
Types
Input Voltage
Operating Temperature :
HCC
Types
HCF
Types
Value
3 to 18
3 to 15
0 to V
DD
– 55 to + 125
– 40 to + 85
Unit
V
V
V
°C
°C
2/13
HCC/HCF4042B
LOGIC BLOCK DIAGRAM AND TRUTH TABLE
Clock
0
__
__/
__
1
\__
Polarity
0
0
1
1
Q
D
Latch
D
Latch
STATIC ELECTRICAL CHARACTERISTICS
(over recommended operating conditions)
Test Conditions
Symbol
Parameter
V
I
(V)
0/ 5
HCC 0/10
Types 0/15
0/20
0/5
HCF
0/10
Types
0/15
V
OH
Output High
Voltage
0/ 5
0/10
0/15
V
OL
Output Low
Voltage
5/0
10/0
15/0
V
IH
Input High
Voltage
0.5/4.5
1/9
<1
<1
<1
<1
<1
<1
<1
<1
V
O
(V)
Value
Unit
|I
O
| V
D D
T
L o w
*
25
°C
T
Hi g h
*
(µA) (V)
Min. Max. Min. Typ. Max. Min. Max.
5
10
15
20
5
10
15
5
10
15
5
10
15
5
10
15
3.5
7
11
4.95
9.95
14.95
0.05
0.05
0.05
3.5
7
11
1
2
4
20
4
8
16
4.95
9.95
14.95
0.05
0.05
0.05
3.5
7
11
V
0.02
0.02
0.02
0.04
0.02
0.02
0.02
1
2
4
20
4
8
16
4.95
9.95
14.95
0.05
0.05
0.05
V
V
30
60
120
600
30
60
120
µA
I
L
Quiescent
Current
1.5/13.5 < 1
* T
Lo w
= – 55°C for
HCC
device : – 40°C for
HCF
device.
* T
High
= + 125°C for
HCC
device : + 85°C for
HCF
device.
The Noise Margin for both ”1” and ”0” level is : 1V min. with V
DD
= 5V, 2V min. with V
DD
= 10V, 2.5V min. with V
DD
= 15V.
3/13
HCC/HCF4042B
STATIC ELECTRICAL CHARACTERISTICS
(continued)
Test Conditions
Symbol
Parameter
V
I
(V)
V
O
(V)
4.5/0.5
9/1
0/ 5
HCC 0/ 5
Types 0/10
0/15
0/ 5
0/ 5
HCF
Types 0/10
0/15
I
OL
Output
Sink
Current
0/ 5
HCC
0/10
Types
0/15
0/ 5
HCF
0/10
Types
0/15
I
IH
, I
IL
Input
leakage
Curent
HCC 0/18
Types
HCF
0/15
Types
Any Input
2.5
4.6
9.5
13.5
2.5
4.6
9.5
13.5
0.4
0.5
1.5
0.4
0.5
1.5
Value
Unit
|I
O
| V
D D
T
L o w
*
25
°C
T
Hi g h
*
(µA) (V)
Min. Max. Min. Typ. Max. Min. Max.
<1
<1
5
10
15
5
5
10
15
5
5
10
15
5
10
15
5
10
15
18
Any Input
15
±
0.3
±10
5
-5
V
IL
Input Low
Voltage
1.5
3
4
– 2
– 0.64
– 1.6
– 4.2
– 1.53
– 0.52
– 1.3
– 3.6
0.64
1.6
4.2
0.52
1.3
3.6
±
0.1
– 1.6 – 3.2
– 0.51 – 1
– 1.3 – 2.6
– 3.4 – 6.8
– 1.36 – 3.2
– 0.44 – 1
– 1.1 – 2.6
– 3.0 – 6.8
0.51
1.3
3.4
0.44
1.1
3.0
1
2.6
6.8
1
2.6
6.8
1.5
3
4
– 1.15
– 0.36
– 0.9
– 2.4
– 1.1
– 0.36
– 0.9
– 2.4
0.36
0.9
2.4
0.36
0.9
2.4
1.5
3
4
V
13.5/1.5 < 1
I
OH
Output
Drive
Current
mA
mA
±10
-5
±
0.1
±
0.3
7.5
±
1
µA
±
1
pF
C
I
Input Capacitance
* T
Low
= – 55°C for
HCC
device : – 40°C for
HCF
device.
* T
High
= + 125°C for
HCC
device : + 85°C for
HCF
device.
The Noise Margin for both ”1” and ”0” level is : 1V min. with V
DD
= 5V, 2V min. with V
DD
= 10V, 2.5V min. with V
DD
= 15V.
DYNAMIC ELECTRICAL CHARACTERISTICS
(T
amb
= 25°C, C
L
= 50pF, R
L
= 200kΩ,
typical temperature coefficient for all V
DD
values is 0.3%/°C, all input rise and fall times = 20ns)
Symbol
t
PL H
, t
PHL
Parameter
Propagation Delay Data in to Q
Time
Test Conditions
V
D D
( V ) Min.
5
10
15
Data in to Q
5
10
15
Clock to Q
5
10
15
Clock to Q
5
10
15
4/13
Value
Typ.
110
55
40
150
75
50
225
100
80
250
115
90
Max.
220
110
80
300
150
100
450
200
160
500
230
180
ns
Unit
Embedded System
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