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IBM043616CBLBC
IBM041816CBLBC
16Mb (512K x 36 & 1M x 18) SRAM
Features
• 512K x 36 or 1M x 18 organization
• CMOS technology
• Double-data-rate and single-data-rate synchro-
nous mode of operation
• Pipeline mode of operation
• Self-timed late write with full data coherency
• Single differential clock
• 1.8V high-speed transceiver logic (HSTL) I/O
•
2.5V power supply, 1.8V V
DDQ
• Registered addresses, controls, and data-ins
• Burst mode of operation
• Common I/O
• Asynchronous output enable
• Boundary scan using a limited set of JTAG
1149.1 functions
• 9 x 17 bump ball grid array package with SRAM
JEDEC standard pinout and boundary SCAN
order
• Programmable impedance output driver
Description
The IBM043616CBLBC and IBM041816CBLBC
16Mb SRAMs are synchronous pipeline-mode, high-
performance CMOS static random-access memo-
ries that have wide I/O and achieve 2.2ns cycle
times. Single differential CK clocks are used to ini-
tialize the read/write operation, and all internal oper-
ations are self-timed. At the rising edge of the CK
clock, addresses and controls are registered inter-
nally. Data-outs are updated from output registers
on the next rising and falling edges of the CK clock,
hence the double data rate. Internal write buffers
allow write data to follow one cycle after addresses
and controls. The SRAM is operated with a single
2.5V power supply and is compatible with HSTL I/O
interfaces.
CBLBCds.fm.00
June 3, 2002
Page 1 of 25
IBM043616CBLBC
IBM041816CBLBC
16Mb (512K x 36 & 1M x 18) SRAM
x36 BGA Bump Layout (Top View)
1
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
T
U
V
SS
DQ23
V
SS
DQ24
V
SS
DQ25
V
SS
DQ26
V
SS
DQ27
V
SS
DQ28
V
SS
DQ29
V
SS
DQ30
V
SS
2
V
DDQ
DQ20
V
DDQ
DQ21
V
DDQ
CQ
V
DDQ
DQ22
V
DDQ
DQ31
V
DDQ
CQ
V
DDQ
DQ32
V
DDQ
DQ33
V
DDQ
3
SA13
SA14
SA15
SA18
V
SS
DQ18
V
SS
DQ19
V
SS
DQ34
V
SS
DQ35
V
SS
NC
V
DD
SA16
TMS
4
SA11
V
SS
SA12
V
SS
V
DD
V
DD
V
SS
V
DD
V
DD
V
SS
LBO
V
DD
V
DD
V
SS
SA17
V
SS
TDI
5
ZQ
B1
G
V
DD
V
REF
V
DD
CK
CK
V
DD
B2
B3
V
DD
V
REF
V
DD
SA1
SA0
TCK
6
SA10
V
SS
SA9
V
SS
V
DD
V
DD
V
SS
V
DD
V
DD
V
SS
MODE
1
V
DD
V
DD
V
SS
SA2
V
SS
TDO
7
SA8
SA7
SA6
SA5
V
SS
DQ17
V
SS
DQ16
V
SS
DQ1
V
SS
DQ0
V
SS
SA4
V
DD
SA3
NC
2
8
V
DDQ
DQ15
V
DDQ
DQ14
V
DDQ
CQ
V
DDQ
DQ13
V
DDQ
DQ4
V
DDQ
CQ
V
DDQ
DQ3
V
DDQ
DQ2
V
DDQ
9
V
SS
DQ12
V
SS
DQ11
V
SS
DQ10
V
SS
DQ9
V
SS
DQ8
V
SS
DQ7
V
SS
DQ6
V
SS
DQ5
V
SS
1. Connect the Mode pin to V
SS
. The Mode pin has a very small pull down, less than 5µA current at V
DD
input.
2. ESD protection diodes reside on this NC bump.
x18 BGA Bump Layout (Top View)
1
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
T
U
V
SS
NC
V
SS
DQ11
V
SS
NC
V
SS
DQ12
V
SS
NC
V
SS
DQ13
V
SS
NC
V
SS
DQ14
V
SS
2
V
DDQ
DQ10
V
DDQ
NC
V
DDQ
CQ
V
DDQ
NC
V
DDQ
DQ15
V
DDQ
NC
V
DDQ
DQ16
V
DDQ
NC
V
DDQ
3
SA13
SA14
SA15
SA18
V
SS
NC
V
SS
DQ9
V
SS
NC
V
SS
DQ17
V
SS
SA19
V
DD
SA16
TMS
4
SA11
V
SS
SA12
V
SS
V
DD
V
DD
V
SS
V
DD
V
DD
V
SS
LBO
V
DD
V
DD
V
SS
SA17
V
SS
TDI
5
ZQ
B1
G
V
DD
V
REF
V
DD
CK
CK
V
DD
B2
B3
V
DD
V
REF
V
DD
SA1
SA0
TCK
6
SA10
V
SS
SA9
V
SS
V
DD
V
DD
V
SS
V
DD
V
DD
V
SS
MODE
1
V
DD
V
DD
V
SS
SA2
V
SS
TDO
7
SA8
SA7
SA6
SA5
V
SS
DQ8
V
SS
NC
V
SS
DQ0
V
SS
NC
V
SS
SA4
V
DD
SA3
NC
2
8
V
DDQ
NC
V
DDQ
DQ7
V
DDQ
NC
V
DDQ
DQ6
V
DDQ
NC
V
DDQ
CQ
V
DDQ
NC
V
DDQ
DQ1
V
DDQ
9
V
SS
DQ5
V
SS
NC
V
SS
DQ4
V
SS
NC
V
SS
DQ3
V
SS
NC
V
SS
DQ2
V
SS
NC
V
SS
1. Connect the Mode pin to V
SS
. The Mode pin has a very small pull down, less than 5µA current at V
DD
input.
2. ESD protection diodes reside on this NC bump.
Page 2 of 25
CBLBCds.fm.00
June 3, 2002
IBM043616CBLBC
IBM041816CBLBC
16Mb (512K x 36 & 1M x 18) SRAM
Pin Description
SA0–SA19
DQ0–DQ35
Address Input (SA0–SA1 burst-control start-
ing addresses)
Data I/O
TDO
G
IEEE
1149.1 Test Output (LVTTL level)
Asynchronous Output Enable
Mode Pin. Connect to V
SS
. A waiver to float Mode
may be obtained; contact your field applications
engineer (FAE).
HSTL Input Reference Voltage
Power Supply (2.5V)
Ground
Output Power Supply
CQ, CQ
Differential Echo Clocks
MODE
CK, CK
B1
B2
B3
Differential Input Register Clocks
B1 = 0 initiates a Load operation
B2 = 0 initiates a Write operation
B3 = 0 Double Data Rate,
B3 = 1 Single Data Rate
Linear Burst Order (LBO = 1, interleave
mode; LBO = 0, linear mode), (can be tied to
V
DD
or V
SS
)
IEEE 1149.1 Test Inputs (LVTTL levels)
V
REF
V
DD
V
SS
V
DDQ
LBO
ZQ
Output Driver Impedance Control
TMS, TDI, TCK
NC
No Connect
Ordering Information
Part Number
IBM043616CBLBC-22
IBM043616CBLBC-24
IBM043616CBLBC-27
IBM043616CBLBC-30
IBM041816CBLBC-22
IBM041816CBLBC-24
IBM041816CBLBC-27
IBM041816CBLBC-30
Organization
512K x 36
512K x 36
512K x 36
512K x 36
1M x 18
1M x 18
1M x 18
1M x 18
Cycle Time (ns)
2.2
2.4
2.7
3.0
2.2
2.4
2.7
3.0
Package
9 x 17 BGA
9 x 17 BGA
9 x 17 BGA
9 x 17 BGA
9 x 17 BGA
9 x 17 BGA
9 x 17 BGA
9 x 17 BGA
CBLBCds.fm.00
June 3, 2002
Page 3 of 25
IBM043616CBLBC
IBM041816CBLBC
16Mb (512K x 36 & 1M x 18) SRAM
Block Diagram (x36 Double Data Rate Mode)
SA0-SA18
Read Add
Reg
E
A2-A18
Write
Add Reg
E
Decode
2:1 Mux
256K x 72
Array
36
36
36
36
A0,A1
CK,
CK
Load
Advance
Burst
Logic
E
A0’,A1’
A0’
Compare
Match
0
VSS
Output
REG
36
Output
REG
1
0
36
Output
REG
1
0
1
0
1
A0’
A0’
VDD
Output
REG
B1-B3
Control
Logic
Write
1
0
1
0
Write
Buffer
E
0
1
A0’
0
1
Write
Buffer
E
4
36
G
Output Enable
4
36
36
36
CQa,CQa
CQb,CQb
DQ0-DQ35
Page 4 of 25
CBLBCds.fm.00
June 3, 2002
IBM043616CBLBC
IBM041816CBLBC
16Mb (512K x 36 & 1M x 18) SRAM
SRAM Features
Double Data Rate (DDR) and Single Data Rate (SDR) Modes
The timing diagram on page 6 shows input and output data placements for both DDR and SDR modes. In
DDR read mode, two sets of data-outs are generated from the second rising and falling edges of the CK
clock, assuming the first rising edge of the CK clock samples the base address. The first of the two data-out
sets (DOUT-A) is generated from the sampled base address (Base-A). The second data-out set (DOUT-A’) is
generated from the next burst-order address, according to the burst-order definition. Similarly, a DDR write
requires data-in placement on the second rising and falling CK edges. In SDR read mode, only one set of
data-outs is generated from the second rising CK edge. In SDR write mode, one set of data-ins is sampled on
the second rising CK edge. The user may switch from DDR to SDR mode (or vice-versa) during any LOAD
(B1 = 0) operation.
Late Write
The late-write function allows write data to be registered one cycle after addresses and controls. This feature
eliminates one of two bus-turnaround cycles normally required when going from a read to a write operation.
Late write is accomplished by buffering write addresses and data. The SRAM array update occurs during the
third write cycle. Read-cycle addresses are monitored to determine if read data is to be supplied from the
SRAM array or the write buffer. Full data coherency is maintained for both DDR and SDR operations. As a
result, NOP (write buffer flush) operations are not required going from write cycles to read cycles.
Echo Clocks
Echo clocks CQ and CQ are generated from rising and falling edges of the CK clock, with access times repre-
sentative of the data-outs. Echo clocks keep running during write and NOP operations. Echo-clock operation
is identical for both double-data-rate and single-data-rate operations. The close tracking of echo clocks and
data-out timings allows the echo clocks to be used as capture clocks for the data-outs by the receiving
device.
CBLBCds.fm.00
June 3, 2002
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