REI Datasheet
SN54ALS113A, SN74ALS113A
Dual J-K Negative-Edge-Triggered Flip-Flops With Preset
These devices contain two independent J-K negative-edge-triggered flip-flops. A low level at the
Preset input sets the outputs regardless of the levels of the other inputs. When Preset (PRE) is
inactive (high), data at the J and K inputs meeting the setup time requirements are transferred to the
outputs on the negative-going edge of the clock pulse. Clock triggering occurs at a voltage level and
is not directly related to the fall time of the clock pulse. Following the hold time interval, data at the J
and K inputs may be changed without affecting the levels at the outputs. These versatile flip-flops can
perform as toggle flip-flops by tying J and K high.
Rochester Electronics
Manufactured Components
Rochester branded components are
manufactured using either die/wafers
purchased from the original suppliers
or Rochester wafers recreated from the
original IP. All recreations are done with
the approval of the OCM.
Parts are tested using original factory
test programs or Rochester developed
test solutions to guarantee product
meets or exceeds the OCM data sheet.
Quality Overview
•
ISO-9001
• AS9120 certification
• Qualified Manufacturers List (QML) MIL-PRF-38535
• Class Q Military
• Class V Space Level
• Qualified Suppliers List of Distributors (QSLD)
• Rochester is a critical supplier to DLA and
meets all industry and DLA standards.
Rochester Electronics, LLC is committed to supplying
products that satisfy customer expectations for
quality and are equal to those originally supplied by
industry manufacturers.
The original manufacturer’s datasheet accompanying this document reflects the performance
and specifications of the Rochester manufactured version of this device. Rochester Electronics
guarantees the performance of its semiconductor products to the original OEM specifications.
‘Typical’ values are for reference purposes only. Certain minimum or maximum ratings may be
based on product characterization, design, simulation, or sample testing.
© 2013 Rochester Electronics, LLC. All Rights Reserved 10252013
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