FERRITE CHIP INDUCTORS
1. PART NO. EXPRESSION :
L3 SERIES
(d)
: 10 : RoHS Compliant
11 ~ 99 : Internal controlled number
L3-47NK-10
(a)
(b)
(c)
(d)
(a) Series code
(b) Inductance code : 47N = 0.047uH
(c) Tolerance code : K = ±10%, M = ±20%
2. CONFIGURATION & DIMENSIONS :
A
D
L
G
B
C
PCB Pattern
Unit:m/m
A
B
C
D
G
1.00 Ref.
H
1.00 Ref.
H
L
3.00 Ref.
2.00±0.20 1.25±0.20 0.85±0.20 1.25±0.20 0.50±0.30
3. SCHEMATIC :
4. MATERIALS :
b
a
Ag(100%)
Ni(100%)-1.5um(min.)
Sn(100%)-3.0um(min.)
(a) Body : Ferrite
(b) Termination : Ag/Ni/Sn
5. GENERAL SPECIFICATION :
a) Temp. rise : 30°C Max.
b) Rated current : Base on temp. rise
c) Storage temp. : -40°C to +85°C
d) Operating temp. : -40°C to +85°C
e) Resistance to solder heat : 260°C.10secs
NOTE : Specifications subject to change without notice. Please check our website for latest information.
03.08.2010
SUPERWORLD ELECTRONICS (S) PTE LTD
PG. 1
FERRITE CHIP INDUCTORS
6. ELECTRICAL CHARACTERISTICS :
Part Number
L3-47N -
L3-68N -
L3-82N -
L3-R10 -
L3-R12 -
L3-R15 -
L3-R18 -
L3-R22 -
L3-R27 -
L3-R33 -
L3-R39 -
L3-R47 -
L3-R56 -
L3-R68 -
L3-R82 -
L3-1R0 -
L3-1R2 -
L3-1R5 -
L3-1R8 -
L3-2R2 -
L3-2R7 -
L3-3R3 -
L3-3R9 -
L3-4R7 -
L3-5R6 -
L3-6R8 -
L3-8R2 -
L3-100 -
EIA
Size
0805
0805
0805
0805
0805
0805
0805
0805
0805
0805
0805
0805
0805
0805
0805
0805
0805
0805
0805
0805
0805
0805
0805
0805
0805
0805
0805
0805
Dim. C
( mm )
0.85±0.2
0.85±0.2
0.85±0.2
0.85±0.2
0.85±0.2
0.85±0.2
0.85±0.2
0.85±0.2
0.85±0.2
0.85±0.2
0.85±0.2
1.25±0.2
1.25±0.2
1.25±0.2
1.25±0.2
0.85±0.2
0.85±0.2
0.85±0.2
0.85±0.2
0.85±0.2
1.25±0.2
1.25±0.2
1.25±0.2
1.25±0.2
1.25±0.2
1.25±0.2
1.25±0.2
1.25±0.2
Inductance
( µH )
0.047
0.068
0.082
0.100
0.120
0.150
0.180
0.220
0.270
0.330
0.390
0.470
0.560
0.680
0.820
1.000
1.200
1.500
1.800
2.200
2.700
3.300
3.900
4.700
5.600
6.800
8.200
10.000
Q
Min.
15
15
15
20
20
20
20
20
20
20
25
25
25
25
25
45
45
45
45
45
45
45
45
45
45
45
45
45
Test
Frequency
( MHz )
50
50
50
25
25
25
25
25
25
25
25
25
25
25
25
10
10
10
10
10
10
10
10
10
4
4
4
2
SRF
( MHz )
Min.
320
280
255
235
220
200
185
170
150
145
135
125
115
105
100
75
65
60
55
50
45
41
38
35
32
29
26
24
L3 SERIES
DC Resistance
( )
Max.
0.20
0.20
0.20
0.30
0.30
0.40
0.40
0.50
0.50
0.55
0.65
0.65
0.75
0.80
1.00
0.40
0.50
0.50
0.60
0.65
0.75
0.80
0.90
1.00
0.90
1.00
1.10
1.15
Rated Current
( mA )
300
300
300
250
250
250
250
250
250
250
200
200
150
150
150
50
50
50
50
30
30
30
30
30
15
15
15
15
Packaging : Paper Carrier Tape
Inductance tolerance :
: K : ±10%
M : ±20%
NOTE : Specifications subject to change without notice. Please check our website for latest information.
03.08.2010
SUPERWORLD ELECTRONICS (S) PTE LTD
PG. 2
FERRITE CHIP INDUCTORS
7. IMPEDANCE VS. FREQUENCY CURVES :
L3 SERIES
120
100
80
60
40
20
0
1
Q vs. Frequency
FCI2012-Series Q vs Freq.
100
4R7
R1
0
1R0
Q
330
10
100
FREQUENCY(MHz)
100
L vs.
L vs
FCI2012-Series
IDC
IDC.
330
Indu
ctance(uH)
100
4R7
1R2
1
10
R12
0.1
1
10
100
1000
DC Current (mA)
NOTE : Specifications subject to change without notice. Please check our website for latest information.
03.08.2010
SUPERWORLD ELECTRONICS (S) PTE LTD
PG. 3
FERRITE CHIP INDUCTORS
8. RELIABILITY & TEST CONDITION :
L3 SERIES
TEST CONDITION
HP4291A, HP4287A+16092A
HP4338B
1. Applied the allowed DC current.
2. Temperature measured by digital surface thermometer.
Preheat : 150°C, 60sec.
Solder : Sn-Ag3.0-Cu0.5
Solder Temperature : 260±5°C
Flux for lead free : rosin
Dip Time : 10±0.5sec.
ITEM
Electrical Characteristics Test
Impedance
DC Resistance
Rated Current
Temperature Rise Test
Solder Heat Resistance
PERFORMANCE
Refer to standard electrical characteristics list
30°C max. ( t)
No mechanical damage
Remaining terminal electrode : 70% min.
Preheating Dipping
260°C
150°C
Natural
cooling
60
seconds
10±0.5
seconds
Solderability
More than 90% of the terminal electrode
should be covered with solder.
Preheating Dipping
245°C
150°C
Natural
cooling
Preheat : 150°C, 60sec.
Solder : Sn-Ag3.0-Cu0.5
Solder Temperature : 245±5°C
Flux for lead free : rosin
Dip Time : 4±1sec.
60
seconds
4±1.0
seconds
Terminal Strength
The terminal electrode & the dielectric must
not be damaged by the forces applied on the
right conditions.
For Z / L Series :
Size
1
2
3
4
5
6
Force (Kfg)
0.2
0.5
0.6
1.0
1.0
1.0
1.5
2.0
> 25
Time (sec)
W
W
7
8
Flexture Strength
The terminal electrode & the dielectric must
not be damaged by the forces applied on the
right conditions.
20(.787)
Bending
45(1.772)
45(1.772)
40(1.575)
Solder a chip on a test substrate, bend the substrate
by 2mm (0.079in) and return.
100(3.937)
NOTE : Specifications subject to change without notice. Please check our website for latest information.
03.08.2010
SUPERWORLD ELECTRONICS (S) PTE LTD
PG. 4
FERRITE CHIP INDUCTORS
8. RELIABILITY & TEST CONDITION :
L3 SERIES
TEST CONDITION
For Z / L Series :
Series name
2
3
4
mm (inches)
0.80 (0.033)
1.40 (0.055)
2.00 (0.079)
2.70 (0.106)
P-Kgf
0.3
1.0
2.5
2.5
ITEM
Bending Strength
PERFORMANCE
The ferrite should not be damaged by forces
applied on the right condition.
R0.5(0.02)
1.0(0.039)
Chip
A
5
6
7
8
Random Vibration Test
Appearance : Cracking, shipping & any other
defects harmful to the characteristics should
not be allowed.
Frequency : 10-55-10Hz for 1 min.
Amplitude : 1.52mm
Directions & times : X, Y, Z directions for 2 hours.
A period of 2 hours in each of 3 mutually perpendicular
directions (Total 6 hours).
No mechanical damage
Temperature : 85±5°C
Applied Current : rated current
Duration : 1008±12hrs
Measured at room temperature after placing for 2 to 3hrs.
Humidity : 90~95% RH.
Temperature : 40±2°C
Duration : 1008±12hrs
Measured at room temperature after placing for 2 to 3hrs.
Drop
Loading at High
Temperature
Drop 10 times on a concrete floor from a
height of 75cm.
Appearance : No damage.
Inductance : Within ±10% of initial value.
Q : Within ±30% of initial value.
Humidity
Thermal Shock
Appearance : No damage.
Inductance : Within ±10% of initial value.
Q : Within ±30% of initial value.
Phase
1
2
Temperature (°C)
-40±2°C
+85±5°C
Times (min.)
30±3
30±3
For L Series :
Condition for 1 cycle
Step1 : -40±2°C 30±3 min.
Step2 : +85±5°C 30±3 min.
Number of cycles : 100
Measured at room temperature after placing for 2 to 3hrs.
Temperature : -55±2°C
Duration : 1008±12hrs
Measured at room temperature after placing for 2 to 3hrs.
No mechanical damage
Low temperature storage test
Measured : 100 times
Drop
Drop 10 times on a concrete floor from a
height of 75cm.
Derating Curve
Derated Current(A)
Derating
6
5
4
3
2
1
0
6A
5A
4A
3A
2A
1.5A
1A
For the ferrite chip bead which withstanding current over 1.5A, as the
operating temperature over 85°C, the derating current information is
necessary to consider with. For the detail derating of current, please
refer to the Derated Current vs. Operating Temperature curve.
85
125
Operating Tem perature(°C)
Operating Temperature(¢X )
C
NOTE : Specifications subject to change without notice. Please check our website for latest information.
03.08.2010
SUPERWORLD ELECTRONICS (S) PTE LTD
PG. 5
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