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SST27SF512-90-3I-WH

Description
EEPROM, 64KX8, 90ns, Parallel, CMOS, PDSO32
Categorystorage    storage   
File Size234KB,28 Pages
ManufacturerSilicon Laboratories Inc
Download Datasheet Parametric View All

SST27SF512-90-3I-WH Overview

EEPROM, 64KX8, 90ns, Parallel, CMOS, PDSO32

SST27SF512-90-3I-WH Parametric

Parameter NameAttribute value
Is it Rohs certified?incompatible
MakerSilicon Laboratories Inc
package instructionTSSOP, TSSOP32,.56,20
Reach Compliance Codeunknown
Maximum access time90 ns
command user interfaceNO
Data pollingNO
JESD-30 codeR-PDSO-G32
JESD-609 codee0
memory density524288 bit
Memory IC TypeEEPROM
memory width8
Number of terminals32
word count65536 words
character code64000
Maximum operating temperature85 °C
Minimum operating temperature-40 °C
organize64KX8
Package body materialPLASTIC/EPOXY
encapsulated codeTSSOP
Encapsulate equivalent codeTSSOP32,.56,20
Package shapeRECTANGULAR
Package formSMALL OUTLINE, THIN PROFILE, SHRINK PITCH
Parallel/SerialPARALLEL
power supply5 V
Certification statusNot Qualified
Maximum standby current0.00005 A
Maximum slew rate0.03 mA
Nominal supply voltage (Vsup)5 V
surface mountYES
technologyCMOS
Temperature levelINDUSTRIAL
Terminal surfaceTin/Lead (Sn/Pb)
Terminal formGULL WING
Terminal pitch0.5 mm
Terminal locationDUAL
switch bitNO
256 Kbit / 512 Kbit / 1 Mbit / 2 Mbit (x8)
Many-Time Programmable Flash
SST27SF256 / SST27SF512 / SST27SF010 / SST27SF020
Data Sheet
FEATURES:
• Organized as 32K x8 / 64K x8 / 128K x8 / 256K x8
• 5.0V (4.5-5.5V) Read Operation
• Superior Reliability
– Endurance: At least 1000 Cycles
– Greater than 100 years Data Retention
• Low Power Consumption
– Active Current: 20 mA (typical)
– Standby Current: 10 µA (typical)
• Fast Read Access Time
– 70 and 90 ns
• Fast Byte-Program Operation
– Byte-Program Time: 20 µs (typical)
– Chip-Program Time:
0.7 seconds (typical) for SST27SF256
1.4 seconds (typical) for SST27SF512
2.8 seconds (typical) for SST27SF010
5.6 seconds (typical) for SST27SF020
PRODUCT DESCRIPTION
The SST27SF256/512/010/020 are a 32K x8 / 64K x8 /
128K x8 / 256K x8 CMOS, Many-Time Programmable
(MTP) low cost flash, manufactured with SST’s propri-
etary, high performance SuperFlash technology. The
split-gate cell design and thick oxide tunneling injector
attain better reliability and manufacturability compared
with alternate approaches. These MTP devices can be
electrically erased and programmed at least 1000 times
using an external programmer with a 12 volt power
supply. They have to be erased prior to programming.
These devices conform to JEDEC standard pinouts for
byte-wide memories.
Featuring high performance Byte-Program, the
SST27SF256/512/010/020 provide a Byte-Program
time of 20 µs. Designed, manufactured, and tested for a
wide spectrum of applications, these devices are offered
with an endurance of at least 1000 cycles. Data retention
is rated at greater than 100 years.
The SST27SF256/512/010/020 are suited for applica-
tions that require infrequent writes and low power non-
volatile storage. These devices will improve flexibility,
efficiency, and performance while matching the low cost
in nonvolatile applications that currently use UV-
EPROMs, OTPs, and mask ROMs.
To meet surface mount and conventional through hole
requirements, the SST27SF256/512 are offered in 28-
pin PDIP, 32-pin PLCC and 32-pin TSOP packages. The
SST27SF010/020 are offered in 32-pin PDIP, 32-pin
PLCC and 32-pin TSOP packages. See Figures 1,2 and
3 for pinouts.
Device Operation
The SST27SF256/512/010/020 are a low cost flash
solution that can be used to replace existing UV-
EPROM, OTP, and mask ROM sockets. These devices
are functionally (read and program) and pin compatible
with industry standard EPROM products. In addition to
EPROM functionality, these devices also support electri-
cal erase operation via an external programmer. They do
not require a UV source to erase, and therefore the
packages do not have a window.
Read
The Read operation of the SST27SF256/512/010/020 is
controlled by CE# and OE#. Both CE# and OE# have to
be low for the system to obtain data from the outputs.
Once the address is stable, the address access time is
equal to the delay from CE# to output (T
CE
). Data is
available at the output after a delay of T
OE
from the falling
edge of OE#, assuming that CE# pin has been low and
the addresses have been stable for at least T
CE
- T
OE
.
• Electrical Erase Using Programmer
– Does Not Require UV Source
– Chip-Erase Time: 100 ms (typical)
• TTL I/O Compatibility
• JEDEC Standard Byte-wide EPROM Pinouts
• 12V Power Supply for Programming/Erase
• Packages Available
– 28-Pin PDIP for SST27SF256/512
– 32-Pin PDIP for SST27SF010/020
– 32-Pin PLCC
– 32-Pin TSOP (8mm x 14mm)
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
© 2000 Silicon Storage Technology, Inc.The SST logo and SuperFlash are registered trademarks of Silicon Storage Technology, Inc. MTP is a trademark of Silicon Storage Technology, Inc.
1
502-03 2/00
These specifications are subject to change without notice.

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