Power Dissipation .......................................................... 1.0W
Static Discharge Voltage ........................................... >2001V
(per MIL-STD-883, Method 3015)
Function Table
D
H
L
X
X
Inputs
LE
H
H
L
X
Operating Range
Ambient
Temperature
−40°C
to +85°C
V
CC
5V
±
10%
Electrical Characteristics
Over the Operating Range
Parameter
V
IH
V
IL
V
H
V
IK
I
IH
I
IL
I
OZH
I
OZL
I
OS
I
O
I
OFF
Description
Input HIGH Voltage
Input LOW Voltage
Input Hysteresis
[5]
Input Clamp Diode Voltage
Input HIGH Current
Input LOW Current
High Impedance Output Current
(Three-State Output pins)
High Impedance Output Current
(Three-State Output pins)
Short Circuit Current
[6]
Output Drive Current
[6]
Power-Off Disable
V
CC
=Min., I
IN
=−18 mA
V
CC
=Max., V
I
=V
CC
V
CC
=Max., V
I
=GND
V
CC
=Max., V
OUT
=2.7V
V
CC
=Max., V
OUT
=0.5V
V
CC
=Max., V
OUT
=GND
V
CC
=Max., V
OUT
=2.5V
V
CC
=0V, V
OUT
≤4.5V
[7]
−80
−50
−140
100
−0.7
−1.2
±1
±1
±1
±1
−200
−180
±1
Test Conditions
Min.
2.0
0.8
Typ.
[4]
Max.
Unit
V
V
mV
V
µA
µA
µA
µA
mA
mA
µA
Output Drive Characteristics for CY74FCT16373T
Parameter
V
OH
Description
Output HIGH Voltage
Test Conditions
V
CC
=Min., I
OH
=−3 mA
V
CC
=Min., I
OH
=−15 mA
V
CC
=Min., I
OH
=−32 mA
V
OL
Output LOW Voltage
V
CC
=Min., I
OL
=64 mA
Min.
2.5
2.4
2.0
Typ.
[4]
3.5
3.5
3.0
0.2
0.55
Max.
Unit
V
V
V
V
Notes:
1. H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care. Z = High Impedance. Q
0
=Previous state of flip-flop.
2. Operation beyond the limits set forth may impair the useful life of the device. Unless otherwise noted, these limits are over the operating free-air temperature
range.
3. Unused inputs must always be connected to an appropriate logic voltage level, preferably either V
CC
or ground.
4. Typical values are at V
CC
=5.0V, T
A
= +25°C ambient.
5. This parameter is guaranteed but not tested.
6. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, I
OS
tests should be performed last.
7. Tested at +25°C.
2
CY74FCT16373T
CY74FCT162373T
Output Drive Characteristics for CY74FCT162373T
Parameter
I
ODL
I
ODH
V
OH
V
OL
Description
Output LOW Current
[6]
Output HIGH Current
[6]
Output HIGH Voltage
Output LOW Voltage
Test Conditions
V
CC
=5V, V
IN
=V
IH
or V
IL
, V
OUT
=1.5V
V
CC
=5V, V
IN
=V
IH
or V
IL
, V
OUT
=1.5V
V
CC
=Min., I
OH
=−24 mA
V
CC
=Min., I
OL
=24 mA
Min.
60
−60
2.4
Typ.
[4]
115
−115
3.3
0.3
0.55
Max.
150
−150
Unit
mA
mA
V
V
Capacitance
[5]
(T
A
= +25°C, f = 1.0 MHz)
Parameter
C
IN
C
OUT
Description
Input Capacitance
Output Capacitance
V
IN
= 0V
V
OUT
= 0V
Test Conditions
Typ.
[4]
4.5
5.5
Max.
6.0
8.0
Unit
pF
pF
Power Supply Characteristics
Parameter
I
CC
∆I
CC
I
CCD
Description
Quiescent Power Supply Current V
CC
=Max.
Quiescent Power Supply Current
(TTL inputs HIGH)
Dynamic Power Supply
Current
[9]
Total Power Supply Current
[10]
V
CC
=Max.
V
CC
=Max., One Input
Toggling, 50% Duty Cycle,
Outputs Open, OE=GND
V
CC
=Max., f
1
=10 MHz,
50% Duty Cycle, Outputs
Open, One Bit Toggling,
OE=GND, LE=V
CC
Test Conditions
V
IN
≤0.2V,
V
IN
≥V
CC
−0.2V
V
IN
=3.4V
[8]
V
IN
=V
CC
or
V
IN
=GND
V
IN
=V
CC
or
V
IN
=GND
V
IN
=3.4V or
V
IN
=GND
Typ.
[4]
5
0.5
60
Max.
500
1.5
100
Unit
µA
mA
µA/MHz
I
C
0.6
0.9
2.4
6.4
1.5
2.3
4.5
[11]
16.5
[11]
mA
mA
mA
mA
V
CC
=Max., f
1
=2.5 MHz,
V
IN
=V
CC
or
50% Duty Cycle, Outputs
V
IN
=GND
Open, Sixteen Bits Toggling,
V
IN
=3.4V or
OE=GND, LE=V
CC
V
IN
=GND
Notes:
8. Per TTL driven input (V
IN
=3.4V); all other inputs at V
CC
or GND.
9. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
10. I
C
= I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
I
C
= I
CC
+∆I
CC
D
H
N
T
+I
CCD
(f
0
/2 + f
1
N
1
)
I
CC
= Quiescent Current with CMOS input levels
∆I
CC
= Power Supply Current for a TTL HIGH input(V
IN
=3.4V)
D
H
= Duty Cycle for TTL inputs HIGH
N
T
= Number of TTL inputs at D
H
I
CCD
= Dynamic Current caused by an input transition pair (HLH or LHL)
f
0
= Clock frequency for registered devices, otherwise zero
f
1
= Input signal frequency
N
1
= Number of inputs changing at f
1
All currents are in milliamps and all frequencies are in megahertz.
11. Values for these conditions are examples of the I
CC
formula. These limits are guaranteed but not tested.
3
CY74FCT16373T
CY74FCT162373T
Switching Characteristics
Over the Operating Range
[12]
CY74FCT16373T
CY74FCT162373T
Parameter
t
PLH
t
PHL
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
SU
t
H
t
W
t
SK(O)
Description
Propagation Delay D to O
Propagation Delay
LE to O
Output Enable Time
Output Disable Time
Set-Up Time HIGH or LOW, D to LE
Hold Time HIGH or LOW,
D to LE
LE Pulse Width HIGH
Output Skew
[14]
Min.
1.5
2.0
1.5
1.5
2.0
1.5
6.0
0.5
CY74FCT16373CT
CY74FCT162373CT
Parameter
t
PLH
t
PHL
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
SU
t
H
t
W
t
SK(O)
Description
Propagation Delay
D to O
Propagation Delay
LE to O
Output Enable Time
Output Disable Time
Set-Up Time HIGH or LOW, D to LE
Hold Time HIGH or LOW,
D to LE
LE Pulse Width HIGH
Output Skew
[14]
Min.
1.5
2.0
1.5
1.5
2.0
1.5
3.3
0.5
Max.
4.2
5.5
5.5
5.0
Max.
8.0
13.0
12.0
7.5
CY74FCT16373AT
CY74FCT162373AT
Min.
1.5
2.0
1.5
1.5
2.0
1.5
3.3
0.5
CY74FCT16373ET
CY74FCT162373ET
Min.
1.5
2.0
1.5
1.5
1.0
1.0
3.0
0.5
Max.
3.4
3.7
4.4
3.6
Unit
ns
ns
ns
ns
ns
ns
ns
ns
Fig. No.
[13]
1, 3
1, 5
1, 7, 8
1, 7, 8
9
9
5
—
Max.
5.2
6.7
6.1
5.5
Unit
ns
ns
ns
ns
ns
ns
ns
ns
Fig. No.
[13]
1, 3
1, 5
1, 7, 8
1, 7, 8
9
9
5
—
Notes:
12. Minimum limits are guaranteed but not tested on Propagation Delays.
13. See “Parameter Measurement Information” in the General Information section.
14. Skew between any two outputs of the same package switching in the same direction. This parameter is guaranteed by design.
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