ACPL-785E , 5962-9755701EPx
HCPL-7851, 5962-9755701HPx
Hermetically Sealed, Analog Isolation Amplifier
Reliability Data Sheet
Description
The Avago Technologies reliability data shown represents
the high reliability class of this product family. Both of
the products listed use the same LEDs, ICs, DLA approved
packaging materials, processes, stress conditions and
testing per MIL-PRF-38534. Additionally, Avago Technol-
ogies internal processes, material specifications, design
standards, and statistical process controls are utilized.
The data is NOT TRANSFERABLE TO OTHER MANUFAC-
TURERS’ SIMILAR PART TYPES.
Operating Life Test
For valid system reliability calculations it is necessary to
adjust for the time when the system is not in operation.
Note that if you are using MIL-HDBK-217 for predicting
component reliability, the results may not be compara-
ble to those given in Table 2 due to different conditions
and factors that have been accounted for in MIL-HDBK-
217. For example, it is unlikely that your application will
exercise all available channels at full rated power with the
LED(s) always ON as Avago Technologies testing does.
Thus, your application total power and duty cycle must
be carefully considered when comparing Table 2 to pre-
dictions using MIL-HDBK-217.
Table 1. Demonstrated Operating Life Test Performance
Stress Test
Condition
T
A
= +125°C
V
CC
= 5.5V
V
IN
= N/A
V
OUT
= N/A
T
J
= +150 °C
Total Devices
Tested
240
Total Device
Hours
1,080,000
Number of
Failed Units
0
Demonstrated
MTTF (hr) @
T
A
= +125 °C
> 1,080,000
Demonstrated
FITs @
T
A
= +125 °C
< 923
Definition of Failure
Inability to switch, i.e. “functional failure” is the defi-
nition of failure in this data sheet. Specifically, failure
occurs when the device fails to switch ON with 2 times
the minimum recommended drive current (but not
exceeding the max rating) or fails to switch off when
there is no input current
Application Information
The data of Table 1 and 2 were obtained on MIL-PRF-
38534 screened devices with high temperature operating
life duration up to 5000 hours. An exponential (random)
failure distribution is assumed, expressed in units of FIT
(failures per billion device hours) are only defined in the
random failure portion of the reliability curve.
Failure Rate Projections
The demonstrated point mean time to failure (MTTF) is
measured at the absolute maximum stress condition. The
failure rate projections in Table 2 uses the Arrhenius ac-
celeration relationship, where a 0.43 eV activation energy
is used as in the hybrid section of MIL-HDBK-217.
Environmental Testing
All high reliability hermetic optocouplers listed meet the
100% screening and quality conformance inspection
testing of MIL-PRF-38534 Class H.
Table 2. Reliability Projections for Devices Listed In Title
Ambient
Temperature
(°C)
125
120
110
100
90
80
70
60
50
40
30
25
Junction
Temperature
(°C)
150
145
135
125
115
105
95
85
75
65
55
50
Typical (60% Confidence)
MTTF
(Hr/fail)
1,178,665
1,357,008
1,817,465
2,470,164
3,410,787
4,790,684
6,854,237
10,004,866
14,924,618
22,796,743
35,732,223
45,204,937
90% Confidence
MTTF
(Hr/fail)
469,038
540,008
723,242
982,977
1,357,288
1,906,405
2,727,575
3,981,336
5,939,103
9,071,736
14,219,281
17,988,853
FITs
(Fail/10
9
hr)
848
737
550
405
293
209
146
100
67
44
28
22
FITs
(Fail/10
9
hr)
2,132
1,852
1,383
1,017
737
525
367
251
168
110
70
56
Table 3. ESDS Classification per Method 3015, MIL-STD-883
Part Number
5962-9755701HPx, HCPL-7851
5962-9755701EPx, ACPL-785E
ESD Class
1
1
For product information and a complete list of distributors, please go to our web site:
www.avagotech.com
Avago, Avago Technologies, and the A logo are trademarks of Avago Technologies in the United States and other countries.
Data subject to change. Copyright © 2005-2013 Avago Technologies. All rights reserved.
AV02-0316EN - March 26, 2013
Embedded System
京公网安备 11010802033920号
EEWORLD
