REVISIONS
LTR
E
DESCRIPTION
Table I; Changed the min and max limits for Radhard levels L,R
device type 02 for the following tests +V
OUT
, -V
OUT
. Changed the max
limits for VR
LINE
, VR
LOAD
, I
IN
, and Eff. For the I
RIP
test separate
subgroups 1,2,3 to subgroup 1 for device type 01 max limit of 60
mAp-p and for subgroups 2 and 3 the max limit of 100 mA. For the
I
RIP
test separate subgroups 1,2,3 to subgroup 1 for device type 02
max limit of 80 mAp-p and for subgroup 2 and 3 the max limit of 120
mAp-p.
Made correction to paragraph 4.3.5.a. Updated paragraph 1.2.3 to
define the five reliability class levels. Made changes to table I format.
-sld
Added case outline Y, bathtub style package. -sld
Made changes to X
REG,
VO
TLOAD
, and TT
LOAD
in table I. Made
additions to footnotes 3/ and 5/ for table I. -gjc
Table I; TTload. Take out redundant values for +Vout and –Vout.
For TTload , 200µs Max. on device type 01 was erroneously listed for
+Vout and –Vout. Correct value is 500
µs.
Also, on Table I; change
output current (Iout) for device type 01 from 0.875 to 1.125 to agree
with footnote 2/. 90% of 15W is 13.5W and for 12Vout is 1.125A. gjc
Figure 1; case outline X. Change the max limit for dimension "D"
from 1.455 inches to 1.460 inches and for dimension "E" change the
max limit from 1.125 inches to 1.130 inches. Editorial changes
troughout. -sld
DATE (YR-MO-DA)
98-02-04
APPROVED
K. A. Cottongim
F
01-03-21
Raymond Monnin
G
H
J
01-08-21
02-09-24
Raymond Monnin
Raymond Monnin
03-11-06
Raymond Monnin
K
04-08-19
Raymond Monnin
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
PMIC N/A
K
15
REV
SHEET
PREPARED BY
Steve L. Duncan
CHECKED BY
Michael Jones
K
1
K
2
K
3
K
4
K
5
K
6
K
7
K
8
K
9
K
10
K
11
K
12
K
13
K
14
STANDARD
MICROCIRCUIT
DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
http://www.dscc.dla.mil/
THIS DRAWING IS
AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
AMSC N/A
APPROVED BY
Gregory A. Lude
MICROCIRCUIT, HYBRID, LINEAR, 12 VOLT,
DUAL CHANNEL, DC/DC CONVERTER
DRAWING APPROVAL DATE
92-08-18
REVISION LEVEL
K
SIZE
A
SHEET
CAGE CODE
67268
1 OF
15
5962-92144
DSCC FORM 2233
APR 97
5962-E402-04
1. SCOPE
1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A
choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When
available, a choice of radiation hardness assurance levels are reflected in the PIN.
1.2 PIN. The PIN shall be as shown in the following example:
5962
Federal
stock class
designator
\
-
92144
RHA
designator
(see 1.2.1)
/
01
Device
type
(see 1.2.2)
H
Device
class
designator
(see 1.2.3)
X
Case
outline
(see 1.2.4)
X
Lead
finish
(see 1.2.5)
\/
Drawing number
1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA
levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
01
02
Generic number
MHF+2812D/883,MHF+2812DF/883
SMHF2812D,SMHF2812DF
Circuit function
DC-DC converter, 15 W,
±12
V output
DC-DC converter, 15 W,
±12
V output
1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level.
All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K,
and E) or QML Listing (Class G and D). The product assurance levels are as follows:
Device class
K
H
G
Device performance documentation
Highest reliability class available. This level is intended for use in space
applications.
Standard military quality class level. This level is intended for use in applications
where non-space high reliability devices are required.
Reduced testing version of the standard military quality class. This level uses the
Class H screening and In-Process Inspections with a possible limited temperature
range, manufacturer specified incoming flow, and the manufacturer guarantees (but
may not test) periodic and conformance inspections (Group A, B, C and D).
Designates devices which are based upon one of the other classes (K, H, or G)
with exception(s) taken to the requirements of that class. These exception(s) must
be specified in the device acquisition document; therefore the acquisition document
should be reviewed to ensure that the exception(s) taken will not adversely affect
system performance.
Manufacturer specified quality class. Quality level is defined by the manufacturers
internal, QML certified flow. This product may have a limited temperature range.
E
D
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
K
5962-92144
SHEET
2
DSCC FORM 2234
APR 97
1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
X
Y
Z
Descriptive designator
See figure 1
See figure 1
See figure 1
Terminals
8
8
8
Package style
Dual-in-line, Platform
Dual-in-line, Bathtub
Flange mount, Platform
1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.
1.3 Absolute maximum ratings. 1/
Input voltage range....................................................................
Power dissipation (P
D
):
Device types 01 and 02 (non-RHA) .......................................
Device type 02 (RHA levels L and R)....................................
Output power .............................................................................
Lead soldering temperature (10 seconds).................................
Storage temperature range .......................................................
1.4 Recommended operating conditions.
Input voltage range.................................................................... +16 V dc to +40 V dc
Case operating temperature range ........................................... -55°C to +125°C
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a
part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in
the solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at
http://assist.daps.dla.mil/quicksearch/
or
www.dodssp.daps.mil
or from
the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
-0.5 V dc to +50 V dc
6W
8.5 W
15.26 W
+300°C
-65°C to +150°C
1/
Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
K
5962-92144
SHEET
3
DSCC FORM 2234
APR 97
3. REQUIREMENTS
3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in
accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as
designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class. The
manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as
defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not
affect the form, fit, or function of the device for the applicable device class.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38534 and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full specified operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
3.5 Marking of Device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked
with the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked.
3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot
sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for
those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer
and be made available to the preparing activity (DSCC-VA) upon request.
3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this
drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturer's product meets
the performance requirements of MIL-PRF-38534 and herein.
3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of
microcircuits delivered to this drawing.
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the
form, fit, or function as described herein.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
K
5962-92144
SHEET
4
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions 1/
-55°C
≤
T
C
≤
+125°C
V
IN
= 28 V dc ±0.5 V, C
L
= 0
unless otherwise specified
±I
OUT
= 625 mA
Group A
subgroups
Device
types
Min
Limits
Max
12.12
12.24
12.60
-12.18
-12.30
-12.66
1.125
0.875
0.875
80
175
120
275
350
50
A
V
Unit
Output voltage
+V
OUT
1
2,3
L,R
1,2,3
1
2,3
L,R
1,2,3
1,2,3
01,02
01,02
02
01,02
01,02
02
01
02
11.88
11.76
11.40
-11.82
-11.70
-11.34
0.0
0.0
0.0
`
-V
OUT
Output current 2/
I
OUT
V
IN
= 16 V dc to 40 V dc
L,R
V
OUT
ripple voltage
V
RIP
±I
OUT
= 625 mA,
B.W. = 10 kHz to 2MHz
1,2
02
01
02
mV p-p
(±V
OUT
)
3
01
02
L,R
V
OUT
line regulation
+V
OUT
VR
LINE
±I
OUT
= 625 mA,
V
IN
= 16 V dc to 40 V dc
L,R
-V
OUT
L,R
V
OUT
load regulation
+V
OUT
VR
LOAD
±I
OUT
= 0 to 625 mA,
both outputs changed
simultaneously
L,R
-V
OUT
1,2,3
1,2,3
02
01,02
mV
1,2,3
1,2,3
1,2,3
1,2,3
02
01,02
02
01,02
100
100
200
50
mV
1,2,3
1,2,3
02
01
02
100
100
150
300
L,R
See footnotes at end of table.
1,2,3
02
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
K
5962-92144
SHEET
5
DSCC FORM 2234
APR 97
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