3D10000
5-BIT ADJUSTABLE, HIGH B.W.
PASSIVE DELAY LINE
(SERIES 3D10000)
FEATURES
Delay adjustable in 31 steps
Delay step sizes of 0.5ns to 3ns available
Fast rise time for high frequency applications
I/O reversible
F-type female connectors
Meets or exceeds MIL-D-23859C
PACKAGE
FUNCTIONAL DESCRIPTION
PIN DESCRIPTIONS
The 3D10000 device is a single-input, single-output, passive delay line.
IN
Signal Input (BNC)
The signal input (IN) is reproduced at the output (OUT), shifted by a time
OUT Signal Output (BNC)
(T
D
) which can be adjusted via five binary-weighted switches. The value
of these switches, multiplied by the device dash number, determines the
device delay (referenced to the delay with all the switches off). The characteristic impedance of the device
is nominally 75-ohms.
SERIES SPECIFICATIONS
Total Delay Tolerance:
3%
Minimum Delay
(all switches off):
12ns
Impedance:
75Ω
Ripple in pass-band:
Approx. 0.2dB
Dielectric breakdown:
100 VDC
Operating temp:
-65C to +125C
Temperature coeff:
<100 PPM/C
Case dimensions:
17” x 13” x 5-1/4”
(43.2cm x 33.0cm x 13.3cm)
DASH NUMBER SPECIFICATIONS
Part
Number
3D10000-0.5
3D10000-1
3D10000-1.4
3D10000-2
3D10000-3
Delay
Step
(ns)
0.5
1.0
1.4
2.0
3.0
Delay
Range
(ns)
15.5
31.0
43.4
62.0
93.0
Imped-
ance
(Ω)
75
75
75
75
75
3dB
B.W.
(MHz)
380
380
380
380
380
Notes: 3db BW measured at maximum delay
Larger dash numbers are available in
larger form factors. Please contact factory
for details.
2015
Data Delay Devices
Doc #15001
1/5/2015
DATA DELAY DEVICES, INC.
3 Mt. Prospect Ave. Clifton, NJ 07013
1
3D10000
PASSIVE DELAY LINE TEST SPECIFICATIONS
TEST CONDITIONS
INPUT:
Ambient Temperature:
Input Pulse:
Source Impedance:
Rise/Fall Time:
Pulse Width:
Period:
25 C
3 C
High = +0.5V typical
Low = -0.5V typical
50 Max.
3.0 ns Max. (measured
at 10% and 90% levels)
PW
IN
= 100ns
PER
IN
= 1000ns
o
o
OUTPUT:
R
load
:
C
load
:
Threshold:
10M
10pf
50% (Rising & Falling)
NOTE:
The above conditions are for test only and do not in any way restrict the operation of the device.
OUT
PULSE
GENERATOR
TRIG
R
IN
IN
DEVICE UNDER
TEST (DUT)
OUT
IN
TRIG
OSCILLOSCOPE
50
R
IN
= R
OUT
= Z
LINE
R
OUT
Test Setup (Delay Measurements)
OUT
IN R
IN A
NETWORK
ANALYZER
(HP 3577A)
IN B
RF
Coax
Coax
50-OHM
SIGNAL
DIVIDER
OUT R
(HP 35676
-66301)
OUT A
OUT B
IN
Coax
IMPEDANCE
MATCHING
NETWORK
Coax
IMPEDANCE
MATCHING
NETWORK
IN
GND
DEVICE
UNDER
TEST
OUT
GND
Test Setup (Frequency Response)
Doc #15001
1/5/2015
DATA DELAY DEVICES, INC.
Tel: 973-773-2299
Fax: 973-773-9672
http://www.datadelay.com
2
Microcontroller MCU
京公网安备 11010802033920号
EEWORLD
