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PD44165364BF5-E40-EQ3-A

Description
18M-BIT QDRTM II SRAM 4-WORD BURST OPERATION
File Size476KB,40 Pages
ManufacturerRenesas Electronics Corporation
Websitehttps://www.renesas.com/
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PD44165364BF5-E40-EQ3-A Overview

18M-BIT QDRTM II SRAM 4-WORD BURST OPERATION

Datasheet
μ
PD44165084B
μ
PD44165094B
μ
PD44165184B
μ
PD44165364B
18M-BIT QDR II SRAM
4-WORD BURST OPERATION
Description
TM
R10DS0018EJ0200
Rev.2.00
October 6, 2011
The
μ
PD44165084B is a 2,097,152-word by 8-bit, the
μ
PD44165094B is a 2,097,152-word by 9-bit, the
μ
PD44165184B is a 1,048,576-word by 18-bit and the
μ
PD44165364B is a 524,288-word by 36-bit synchronous
quad data rate static RAM fabricated with advanced CMOS technology using full CMOS six-transistor memory
cell.
The
μ
PD44165084B,
μ
PD44165094B,
μ
PD44165184B and
μ
PD44165364B integrate unique synchronous
peripheral circuitry and a burst counter. All input registers controlled by an input clock pair (K and K#) are
latched on the positive edge of K and K#. These products are suitable for application which require synchronous
operation, high speed, low voltage, high density and wide bit configuration. These products are packaged in 165-
pin PLASTIC BGA.
Features
1.8 ± 0.1 V power supply
165-pin PLASTIC BGA (13 x 15)
HSTL interface
PLL circuitry for wide output data valid window and future frequency scaling
Separate independent read and write data ports with concurrent transactions
100% bus utilization DDR READ and WRITE operation
Four-tick burst for reduced address frequency
Two input clocks (K and K#) for precise DDR timing at clock rising edges only
Two output clocks (C and C#) for precise flight time
and clock skew matching-clock and data delivered together to receiving device
Internally self-timed write control
Clock-stop capability. Normal operation is restored in 20
μ
s after clock is resumed.
User programmable impedance output (35 to 70
Ω)
Fast clock cycle time : 3.3 ns (300 MHz), 3.5 ns (287 MHz), 4.0 ns (250 MHz), 5.0 ns (200 MHz)
Simple control logic for easy depth expansion
JTAG 1149.1 compatible test access port
R10DS0018EJ0200 Rev.2.00
October 6, 2011
Page 1 of 39

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