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RT54SX72S-CG624B

Description
Field Programmable Gate Array, 4024 CLBs, 108000 Gates, 156MHz, 6036-Cell, CMOS, CPGA624, CERAMIC, CGA-624
CategoryProgrammable logic devices    Programmable logic   
File Size659KB,84 Pages
ManufacturerMicrosemi
Websitehttps://www.microsemi.com
Download Datasheet Parametric View All

RT54SX72S-CG624B Overview

Field Programmable Gate Array, 4024 CLBs, 108000 Gates, 156MHz, 6036-Cell, CMOS, CPGA624, CERAMIC, CGA-624

RT54SX72S-CG624B Parametric

Parameter NameAttribute value
Is it Rohs certified?incompatible
MakerMicrosemi
package instructionCGA, BGA624,25X25,50
Reach Compliance Codeunknown
ECCN code3A001.A.2.C
Other features72000 TYPICAL GATES AVAILABLE
maximum clock frequency156 MHz
Combined latency of CLB-Max1.4 ns
JESD-30 codeS-CPGA-X624
length32.5 mm
Configurable number of logic blocks4024
Equivalent number of gates108000
Number of entries360
Number of logical units6036
Output times360
Number of terminals624
Maximum operating temperature125 °C
Minimum operating temperature-55 °C
organize4024 CLBS, 108000 GATES
Package body materialCERAMIC, METAL-SEALED COFIRED
encapsulated codeCGA
Encapsulate equivalent codeBGA624,25X25,50
Package shapeSQUARE
Package formGRID ARRAY
Peak Reflow Temperature (Celsius)NOT SPECIFIED
power supply2.5,3.3/5 V
Programmable logic typeFIELD PROGRAMMABLE GATE ARRAY
Certification statusNot Qualified
Filter levelMIL-STD-883 Class B
Maximum seat height5.37 mm
Maximum supply voltage2.75 V
Minimum supply voltage2.25 V
Nominal supply voltage2.5 V
surface mountNO
technologyCMOS
Temperature levelMILITARY
Terminal formUNSPECIFIED
Terminal pitch1.27 mm
Terminal locationPERPENDICULAR
Maximum time at peak reflow temperatureNOT SPECIFIED
width32.5 mm
v2 .2
RTSX-S RadTolerant FPGAs
Designed for Space
SEU-Hardened Registers Eliminate the Need to
Implement Triple-Module Redundancy (TMR)
– Immune to Single-Event Upsets (SEU) to LET
th
> 40 MeV-cm
2
/mg,
– SEU Rate < 10
–10
Upset/Bit-Day in Worst-Case
Geosynchronous Orbit
Up to 100 krad (Si) Total Ionizing Dose (TID)
– Parametric Performance Supported with Lot-
Specific Test Data
Single-Event Latch-Up (SEL) Immunity
TM1019.5 Test Data Available
QML Certified Devices
u e
Features
Very Low Power Consumption (Up to 68 mW at
Standby)
3.3V and 5V Mixed Voltage
Configurable I/O Support for 3.3V/5V PCI, LVTTL,
TTL, and CMOS
– 5V Input Tolerance and 5V Drive Strength
– Slow Slew Rate Option
– Configurable Weak Resistor Pull-Up/Down for
Tristated Outputs at Power-Up
– Hot-Swap
Compliant
with
Cold-Sparing
Support
Secure Programming Technology Prevents Reverse
Engineering and Design Theft
100% Circuit Resource Utilization with 100% Pin
Locking
Unique In-System Diagnostic and Verification
Capability with Silicon Explorer II
Low-Cost Prototyping Option
Deterministic, User-Controllable Timing
JTAG Boundary Scan Testing in Compliance with
IEEE Standard 1149.1 – Dedicated JTAG Reset
(TRST) Pin
High Performance
230 MHz System Performance
310 MHz Internal Performance
9.5 ns Input Clock to Output Pad
Specifications
0.25 µm Metal-to-Metal Antifuse Process
48,000 to 108,000 Available System Gates
Up to 2,012 SEU-Hardened Flip-Flops
Up to 360 User-Programmable I/O Pins
Table 1 •
RTSX-S Product Profile
Device
Capacity
Typical Gates
System Gates
Logic Modules
Combinatorial Cells
SEU-Hardened Register Cells (Dedicated Flip-Flops)
Maximum Flip-Flops
Maximum User I/Os
Clocks
Quadrant Clocks
Speed Grades
Package
(by pin count)
CQFP
CCGA
CCLG
RT54SX32S
32,000
48,000
2,880
1,800
1,080
1,980
227
3
0
Std., –1
208, 256
256
RT54SX72S
72,000
108,000
6,036
4,024
2,012
4,024
360
3
4
Std., –1
208, 256
624
November 2004
© 2004 Actel Corporation
i
See Actel’s website for the latest version of the datasheet
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