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K7A403600M-QC16

Description
Cache SRAM, 128KX36, 3.5ns, CMOS, PQFP100, 14 X 20 MM, TQFP-100
Categorystorage    storage   
File Size405KB,15 Pages
ManufacturerSAMSUNG
Websitehttp://www.samsung.com/Products/Semiconductor/
Download Datasheet Parametric View All

K7A403600M-QC16 Overview

Cache SRAM, 128KX36, 3.5ns, CMOS, PQFP100, 14 X 20 MM, TQFP-100

K7A403600M-QC16 Parametric

Parameter NameAttribute value
Is it Rohs certified?incompatible
MakerSAMSUNG
Parts packaging codeQFP
package instructionLQFP, QFP100,.63X.87
Contacts100
Reach Compliance Codeunknown
ECCN code3A991.B.2.A
Maximum access time3.5 ns
Maximum clock frequency (fCLK)166 MHz
I/O typeCOMMON
JESD-30 codeR-PQFP-G100
JESD-609 codee0
length20 mm
memory density4718592 bit
Memory IC TypeCACHE SRAM
memory width36
Number of functions1
Number of terminals100
word count131072 words
character code128000
Operating modeSYNCHRONOUS
Maximum operating temperature70 °C
Minimum operating temperature
organize128KX36
Output characteristics3-STATE
Package body materialPLASTIC/EPOXY
encapsulated codeLQFP
Encapsulate equivalent codeQFP100,.63X.87
Package shapeRECTANGULAR
Package formFLATPACK, LOW PROFILE
Parallel/SerialPARALLEL
Peak Reflow Temperature (Celsius)NOT SPECIFIED
power supply2.5/3.3,3.3 V
Certification statusNot Qualified
Maximum seat height1.6 mm
Maximum standby current0.03 A
Minimum standby current3.14 V
Maximum slew rate0.425 mA
Maximum supply voltage (Vsup)3.6 V
Minimum supply voltage (Vsup)3.135 V
Nominal supply voltage (Vsup)3.3 V
surface mountYES
technologyCMOS
Temperature levelCOMMERCIAL
Terminal surfaceTin/Lead (Sn/Pb)
Terminal formGULL WING
Terminal pitch0.65 mm
Terminal locationQUAD
Maximum time at peak reflow temperatureNOT SPECIFIED
width14 mm
K7A403600M
Document Title
128Kx36-Bit Synchronous Pipelined Burst SRAM
128Kx36 Synchronous SRAM
Revision History
Rev. No.
0.0
0.1
0.2
0.3
History
Initial draft
Change 7.5 bin to 7.2
Change speed symbol 6.0/6.7/7.2/8.5 to 60/67/72/85
Draft Date
May . 15. 1997
January . 13 . 1998
February. 02. 1998
Remark
Preliminary
Preliminary
Preliminary
Preliminary
Change DC characteristics V
DD
condition from V
DD
=3.3V+10%/-5% Change February. 12. 1998
Input/output leackage currant for
±1µA
to
±2µA
Modify Read timing & Power down cycle timing.
Change I
SB2
value from 30mA to 20mA.
Remove DC characteristics I
SB1
- L ver.& I
SB2
- L ver .
Remove Low power version.
Add 119BGA(7x17 Ball Grid Array Package)
Change Undershoot spec
from -3.0V(pulse width
20ns) to -2.0V(pulse width
t
CYC
/2)
Add Overshoot spec 4.6V((pulse width
t
CYC
/2)
Change V
IH
max from 5.5V to V
DD
+0.5V
March. 11 . 1998
0.4
Preliminary
0.5
April. 14. 1998
Preliminary
0.6
May.13. 1998
Change I
SB2
value from 20mA to 30mA.
Change V
DD
condition from V
DD
=3.3V+10%/-5% to V
DD
=3.3V+0.3V/-0.165V.
Modify DC characteristics( Input Leakage Current test Conditions)
form V
DD
=V
SS to
V
DD
to Max.
Final spec Release
Add V
DDQ
Supply voltage( 2.5V )
Remove 119BGA(7x17 Ball Grid Array Package) .
May.14.1998
Preliminary
0.7
Preliminary
1.0
2.0
3.0
May. 15. 1998
Dec. 02. 1998
Nov. 26. 1999
Final
Final
Final
The attached data sheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the
specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions on the parameters of this device. If you have any ques-
tions, please contact the SAMSUNG branch office near your office, call or contact Headquarters.
-1-
November 1999
Rev 3.0

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