KM416C254D, KM416V254D
CMOS DRAM
256K x 16Bit CMOS Dynamic RAM with Extended Data Out
DESCRIPTION
This is a family of 262,144 x 16 bit Extended Data Out Mode CMOS DRAMs. Extended Data Out Mode offers high speed random access
of memory cells within the same row. Power supply voltage(+5.0V or +3.3V), Access time (-5,-6 or -7), power consumption(Normal or
Low power) and package type(SOJ or TSOP-II) are optional features of this family. All of this family have CAS-before-RAS refresh, RAS-
only refresh and Hidden refresh capabilities. Furthermore, Self-refresh operation is available in L-version. This 256Kx16 EDO Mode
DRAM family is fabricated using Samsung′s advanced CMOS process to realize high band-width, low power consumption and high reli-
ability. It may be used as graphic memory unit for microcomputer, personal computer and portable machines.
• Extended Data Out Mode operation
FEATURES
• Part Identification
- KM416C254D/DL (5V, 512 Ref.)
- KM416V254D/DL (3.3V, 512 Ref.)
• 2 CAS Byte/Wrod Read/Write operation
• CAS-before-RAS refresh capability
• RAS-only and Hidden refresh capability
• Self-refresh capability (L-ver only)
• TTL(5V)/LVTTL(3.3V) compatible inputs and outputs
• Early Write or output enable controlled write
• JEDEC Standard pinout
• Available in 40-pin SOJ 400mil and 44(40)-pin
packages
• Triple +5V±10% power supply (5V product)
• Triple +3.3V±0.3V power supply (3.3V product)
•
Active Power Dissipation
Speed
-5
-6
-7
•
Refresh Cycles
Part
NO.
C254D
V254D
V
CC
5V
3.3V
Refresh
cycle
512
3.3V(512 Ref.)
-
255
235
Unit : mW
5V(512 Ref.)
605
495
440
FUNCTIONAL BLOCK DIAGRAM
Refresh period
Normal
8ms
L-ver
128ms
RAS
UCAS
LCAS
W
Control
Clocks
VBB Generator
Vcc
Vss
Lower
Data in
Buffer
Sense Amps & I/O
Lower
Data out
Buffer
Upper
Data in
Buffer
Upper
Data out
Buffer
Refresh Timer
Row Decoder
•
Performance Range
Refresh Control
DQ0
to
DQ7
Speed
-5
-6
-7
t
RAC
50ns
60ns
70ns
t
CAC
15ns
15ns
20ns
t
RC
84ns
104ns
124ns
t
HPC
20ns
25ns
30ns
Remark
5V only
5V/3.3V
5V/3.3V
A0~A8
Col. Address Buffer
Refresh Counter
Row Address Buffer
Memory Array
262,144 x16
Cells
OE
Column Decoder
DQ8
to
DQ15
SAMSUNG ELECTRONICS CO., LTD.
reserves the right to
change products and specifications without notice.
KM416C254D, KM416V254D
CMOS DRAM
PIN CONFIGURATION
(Top Views)
•KM416C/V254DJ
•KM416C/V254DT
V
CC
DQ0
DQ1
DQ2
DQ3
V
CC
DQ4
DQ5
DQ6
DQ7
N.C
N.C
W
RAS
N.C
A0
A1
A2
A3
V
CC
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
21
V
SS
DQ15
DQ14
DQ13
DQ12
V
SS
DQ11
DQ10
DQ9
DQ8
N.C
LCAS
UCAS
OE
A8
A7
A6
A5
A4
V
SS
V
CC
DQ0
DQ1
DQ2
DQ3
V
CC
DQ4
DQ5
DQ6
DQ7
N.C
N.C
W
RAS
N.C
A0
A1
A2
A3
V
CC
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
21
V
SS
DQ15
DQ14
DQ13
DQ12
V
SS
DQ11
DQ10
DQ9
DQ8
N.C
LCAS
UCAS
OE
A8
A7
A6
A5
A4
V
SS
(SOJ)
(TSOP-II)
Pin Name
A0 - A8
DQ0 - 15
V
SS
RAS
UCAS
LCAS
W
OE
V
CC
N.C
Pin Function
Address Inputs
Data In/Out
Ground
Row Address Strobe
Upper Column Address Strobe
Lower Column Address Strobe
Read/Write Input
Data Output Enable
Power(+5V)
Power(+3.3V)
No Connection
KM416C254D, KM416V254D
ABSOLUTE MAXIMUM RATINGS
Parameter
Voltage on any pin relative to V
SS
Voltage on V
CC
supply relative to V
SS
Storage Temperature
Power Dissipation
Short Circuit Output Current
Symbol
3.3V
V
IN,
V
OUT
V
CC
Tstg
P
D
I
OS
-0.5 to +4.6
-0.5 to +4.6
-55 to +150
1
50
Rating
CMOS DRAM
Units
5V
-1.0 to +7.0
-1.0 to +7.0
-55 to +150
1
50
V
V
°C
W
mA
* Permanent device damage may occur if "ABSOLUTE MAXIMUM RATINGS" are exceeded. Functional operation should be restricted
to the conditions as detailed in the operational sections of this data sheet. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS
(Voltage referenced to Vss, T
A
= 0 to 70°C)
Parameter
Supply Voltage
Ground
Input High Voltage
Input Low Voltage
Symbol
Min
V
CC
V
SS
V
IH
V
IL
3.0
0
2.0
-0.3
*2
3.3V
Typ
3.3
0
-
-
Max
3.6
0
V
CC
+0.3
*1
0.8
Min
4.5
0
2.4
-1.0
*2
5V
Typ
5.0
0
-
-
Max
5.5
0
V
CC
+1.0
*1
0.8
V
V
V
V
Units
*1 : V
CC
+1.3V/15ns(3.3V), V
CC
+2.0V/20ns(5V), Pulse width is measured at V
CC
*2 : -1.3V/15ns(3.3V), -2.0V/20ns(5V), Pulse width is measured at V
SS
DC AND OPERATING CHARACTERISTICS
(Recommended operating conditions unless otherwise noted.)
Max
Parameter
Input Leakage Current (Any input 0≤V
IN
≤V
IN
+0.3V,
all other input pins not under test=0 Volt)
3.3V
Output Leakage Current
(Data out is disabled, 0V≤V
OUT
≤V
CC
)
Output High Voltage Level(I
OH
=-2mA)
Output Low Voltage Level(I
OL
=2mA)
Input Leakage Current (Any input 0≤V
IN
≤V
IN
+0.5V,
all other input pins not under test=0 Volt)
5V
Output Leakage Current
(Data out is disabled, 0V≤V
OUT
≤V
CC
)
Output High Voltage Level(I
OH
=-5mA)
Output Low Voltage Level(I
OL
=4.2mA)
Symbol
I
I(L)
I
O(L)
V
OH
V
OL
I
I(L)
I
O(L)
V
OH
V
OL
Min
-5
-5
2.4
-
-5
-5
2.4
-
Max
5
5
-
0.4
5
5
-
0.4
Units
uA
uA
V
V
uA
uA
V
V
KM416C254D, KM416V254D
DC AND OPERATING CHARACTERISTICS
(Continued)
Symbol
Power
Speed
KM416V254D
I
CC1
I
CC2
I
CC3
Don′t care
Don′t care
Don′t care
-5
-6
-7
Don′t care
-5
-6
-7
-5
-6
-7
Don′t care
-5
-6
-7
Don′t care
Don′t care
-
70
65
1
-
70
65
-
60
55
0.5
100
-
70
65
200
100
Max
KM416C254D
110
90
80
2
110
90
80
90
80
70
1
150
110
90
80
300
200
CMOS DRAM
Units
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
uA
mA
mA
mA
uA
uA
I
CC4
Don′t care
Normal
L
Don′t care
L
L
I
CC5
I
CC6
I
CC7
I
CCS
I
CC1
* : Operating Current (RAS and UCAS, LCAS, Address cycling @
t
RC
=min.)
I
CC2
: Standby Current (RAS=UCAS=LCAS=W=V
IH
)
I
CC3
* : RAS-only Refresh Current (UCAS=LCAS=V
IH
, RAS, Address cycling @
t
RC
=min.)
I
CC4
* : Extended Data Out Mode Current (RAS=V
IL
, UCAS or LCAS, Address cycling @
t
HPC
=min.)
I
CC5
: Standby Current (RAS=UCAS=LCAS=W=V
CC
-0.2V)
I
CC6
* : CAS-Before-RAS Refresh Current (RAS and UCAS or LCAS cycling @
t
RC
=min.)
I
CC7
: Battery back-up current, Average power supply current, Battery back-up mode
Input high voltage(V
IH
)=V
CC
-0.2V, Input low voltage(V
IL
)=0.2V, UCAS, LCAS=0.2V,
DQ=Don′t care, T
RC
=125us, T
RAS
=T
RAS
min~300ns
I
CCS
: Self Refresh Current
RAS=UCAS=LCAS=V
IL
, W=OE=A0 ~ A8=V
CC
-0.2V or 0.2V,
DQ0 ~ DQ15=V
CC
-0.2V, 0.2V or Open
*Note :
I
CC1
, I
CC3
, I
CC4
and I
CC6
are dependent on output loading and cycle rates. Specified values are obtained with the output open.
I
CC
is specified as an average current. In I
CC1
, I
CC3
, I
CC6
and I
CC7,
address can be changed maximum once while RAS=V
IL
. In
I
CC4
, address can be changed maximum once within one Hyper page mode cycle time,
t
HPC
.
KM416C254D, KM416V254D
CAPACITANCE
(T
A
=25°C, V
CC
=5V or 3.3V, f=1MHz)
Parameter
Input capacitance [A0 ~ A8]
Input capacitance [RAS, UCAS, LCAS, W, OE]
Output capacitance [DQ0 - DQ15]
Symbol
C
IN1
C
IN2
C
DQ
Min
-
-
-
CMOS DRAM
Max
5
7
7
Units
pF
pF
pF
AC CHARACTERISTICS
(0°C≤T
A
≤70°C,
See note 1,2)
Test condition (5V device) : V
CC
=5.0V±10%, Vih/Vil=2.4/0.8V, Voh/Vol=2.0/0.8V
Test condition (3.3V device) : V
CC
=3.3V±0.3V, Vih/Vil=2.2/0.7V, Voh/Vol=2.0/0.8V
Parameter
Random read or write cycle time
Read-modify-write cycle time
Access time from RAS
Access time from CAS
Access time from column address
CAS to output in Low-Z
Output buffer turn-off delay from CAS
Transition time (rise and fall)
RAS precharge time
RAS pulse width
RAS hold time
CAS hold time
CAS pulse width
RAS to CAS delay time
RAS to column address delay time
CAS to RAS precharge time
Row address set-up time
Row address hold time
Column address set-up time
Column address hold time
Column address to RAS lead time
Read command set-up time
Read command hold time referenced to CAS
Read command hold time referenced to RAS
Write command set-up time
Write command hold time
Write command pulse width
Write command to RAS lead time
Write command to CAS lead time
Note) *1 : 5V only
Symbol
Min
-5
*1
Max
Min
104
138
50
15
25
3
3
2
30
50
15
40
8
20
15
5
0
10
0
8
25
0
0
0
0
10
10
13
8
10K
35
25
10K
13
50
3
3
2
40
60
15
50
10
20
15
5
0
10
0
10
30
0
0
0
0
10
10
15
10
10K
45
30
10K
13
50
60
15
30
3
3
2
50
70
20
60
15
20
15
5
0
10
0
15
35
0
0
0
0
10
10
15
15
10K
50
35
10K
18
50
-6
Max
Min
124
163
70
20
35
-7
Max
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
16
8
8
7
13
13
4
10
3,4,10
3,4,5
3,10
3
6,12
2
Units
Notes
t
RC
t
RWC
t
RAC
t
CAC
t
AA
t
CLZ
t
CEZ
t
T
t
RP
t
RAS
t
RSH
t
CSH
t
CAS
t
RCD
t
RAD
t
CRP
t
ASR
t
RAH
t
ASC
t
CAH
t
RAL
t
RCS
t
RCH
t
RRH
t
WCS
t
WCH
t
WP
t
RWL
t
CWL
84
116
NXP MCU
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