Small Signal Bipolar Transistor, 0.1A I(C), 160V V(BR)CEO, 1-Element, NPN, Silicon, TO-205AD, HERMETIC SEALED, METAL, TO-39, 3 PIN
BF257.MOD Parametric
Parameter Name
Attribute value
Is it Rohs certified?
conform to
Maker
TT Electronics plc
package instruction
HERMETIC SEALED, METAL, TO-39, 3 PIN
Reach Compliance Code
compliant
ECCN code
EAR99
Maximum collector current (IC)
0.1 A
Collector-emitter maximum voltage
160 V
Configuration
SINGLE
Minimum DC current gain (hFE)
25
JEDEC-95 code
TO-205AD
JESD-30 code
O-MBCY-W3
Number of components
1
Number of terminals
3
Package body material
METAL
Package shape
ROUND
Package form
CYLINDRICAL
Peak Reflow Temperature (Celsius)
NOT SPECIFIED
Polarity/channel type
NPN
Certification status
Not Qualified
surface mount
NO
Terminal form
WIRE
Terminal location
BOTTOM
Maximum time at peak reflow temperature
NOT SPECIFIED
Transistor component materials
SILICON
Nominal transition frequency (fT)
90 MHz
BF257.MOD Preview
BF257
Dimensions in mm (inches).
8.51 (0.34)
9.40 (0.37)
7.75 (0.305)
8.51 (0.335)
Bipolar NPN Device in a
Hermetically sealed TO39
Metal Package.
Bipolar NPN Device.
6.10 (0.240)
6.60 (0.260)
12.70
(0.500)
min.
0.89
max.
(0.035)
0.41 (0.016)
0.53 (0.021)
dia.
V
CEO
= 160V
5.08 (0.200)
typ.
I
C
= 0.1A
2.54
(0.100)
2
1
0.74 (0.029)
1.14 (0.045)
0.71 (0.028)
0.86 (0.034)
3
All Semelab hermetically sealed products
can be processed in accordance with the
requirements of BS, CECC and JAN,
JANTX, JANTXV and JANS specifications
45°
TO39 (TO205AD)
PINOUTS
1 – Emitter
2 – Base
3 – Collector
Parameter
V
CEO
*
I
C(CONT)
h
FE
f
t
P
D
Test Conditions
Min.
Typ.
Max.
160
0.1
Units
V
A
-
@ 10/30m (V
CE
/ I
C
)
25
90M
0.8
Hz
W
* Maximum Working Voltage
This is a shortform datasheet. For a full datasheet please contact
sales@semelab.co.uk.
Semelab Plc reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed
to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use.
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Embedded System
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