DATASHEET
Am29LV320MT/B
32 Megabit (2 M x 16-Bit/4 M x 8-Bit) MirrorBit
3.0 Volt-only Boot Sector Flash Memory
DISTINCTIVE CHARACTERISTICS
ARCHITECTURAL ADVANTAGES
■
Single power supply operation
— 3 V for read, erase, and program operations
■
Manufactured on 0.23 µm MirrorBit process
technology
■
SecSi (Secured Silicon) Sector region
— 128-word/256-byte sector for permanent, secure
identification through an 8-word/16-byte random
Electronic Serial Number, accessible through a
command sequence
— May be programmed and locked at the factory or by
the customer
■
Flexible sector architecture
— Sixty-three 32 Kword/64-Kbyte sectors
— Eight 4 Kword/8 Kbyte boot sectors
■
Compatibility with JEDEC standards
— Provides pinout and software compatibility for
single-power supply flash, and superior inadvertent
write protection
■
Minimum 100,000 erase cycle guarantee per sector
■
20-year data retention at 125°C
PERFORMANCE CHARACTERISTICS
■
High performance
— 90 ns access time
— 25 ns page read times
— 0.5 s typical sector erase time
— 15 µs typical effective write buffer word programming
time: 16-word/32-byte write buffer reduces overall
programming time for multiple-word/byte updates
— 4-word/8-byte page read buffer
— 16-word/32-byte write buffer
■
Low power consumption (typical values at 3.0 V, 5
MHz)
— 13 mA typical active read current
— 50 mA typical erase/program current
— 1 µA typical standby mode current
■
Package options
— 48-pin TSOP
— 48-ball Fine-pitch BGA
— 64-ball Fortified BGA
SOFTWARE & HARDWARE FEATURES
■
Software features
— Program Suspend & Resume: read other sectors
before programming operation is completed
— Erase Suspend & Resume: read/program other
sectors before an erase operation is completed
— Data# polling & toggle bits provide status
— Unlock Bypass Program command reduces overall
multiple-word programming time
— CFI (Common Flash Interface) compliant: allows host
system to identify and accommodate multiple flash
devices
■
Hardware features
— Sector Group Protection: hardware-level method of
preventing write operations within a sector group
— Temporary Sector Unprotect: V
ID
-level method of
changing code in locked sectors
— WP#/ACC input:
Write Protect input (WP#) protects top or bottom two
sectors regardless of sector protection settings
ACC (high voltage) accelerates programming time for
higher throughput during system production
— Hardware reset input (RESET#) resets device
— Ready/Busy# output (RY/BY#) indicates program or
erase cycle completion
This Data Sheet states AMD’s current technical specifications regarding the Products described herein. This Data
Sheet may be revised by subsequent versions or modifications due to changes in technical specifications.
Publication#
26518
Rev:
B
Amendment/0
Issue Date:
May 16, 2003
Refer to AMD’s Website (www.amd.com) for the latest information.
D A T A S H E E T
GENERAL DESCRIPTION
The Am29LV320M/TB is a 32 Mbit, 3.0 volt single
power supply flash memory device organized as
2,097,152 words or 4,194,304 bytes. The device has
an 8-bit/16-bit bus and can be programmed either in
the host system or in standard EPROM programmers.
An access time of 90, 100, 110, or 120 ns is available.
Note that each access time has a specific operating
voltage range (V
CC
) and an I/O voltage range (V
IO
), as
specified in the
Product Selector Guide
and the
Order-
ing Information
sections. The device is offered in a
48-pin TSOP, 48-ball Fine-pitch BGA or 64-ball Forti-
fied BGA package. Each device has separate chip en-
able (CE#), write enable (WE#) and output enable
(OE#) controls.
Each device requires only a
single 3.0 volt power
supply
for both read and write functions. In addition to
a V
CC
input, a high-voltage
accelerated program
(ACC)
function provides shorter programming times
through increased current on the WP#/ACC input. This
feature is intended to facilitate factory throughput dur-
ing system production, but may also be used in the
field if desired.
The device is entirely command set compatible with
the
JEDEC single-power-supply Flash standard.
Commands are written to the device using standard
microprocessor write timing. Write cycles also inter-
nally latch addresses and data needed for the pro-
gramming and erase operations.
The
sector erase architecture
allows memory sec-
tors to be erased and reprogrammed without affecting
the data contents of other sectors. The device is fully
erased when shipped from the factory.
Device programming and erasure are initiated through
command sequences. Once a program or erase oper-
ation has begun, the host system need only poll the
DQ7 (Data# Polling) or DQ6 (toggle)
status bits
or
monitor the
Ready/Busy# (RY/BY#)
output to deter-
mine whether the operation is complete. To facilitate
programming, an
Unlock Bypass
mode reduces com-
mand sequence overhead by requiring only two write
cycles to program data instead of four.
Hardware data protection
measures include a low
V
CC
detector that automatically inhibits write opera-
tions during power transitions. The hardware sector
protection feature disables both program and erase
operations in any combination of sectors of memory.
This can be achieved in-system or via programming
equipment.
The
Erase Suspend/Erase Resume
feature allows
the host system to pause an erase operation in a
given sector to read or program any other sector and
then complete the erase operation. The
Program
Suspend/Program Resume
feature enables the host
system to pause a program operation in a given sector
to read any other sector and then complete the pro-
gram operation.
The
hardware RESET# pin
terminates any operation
in progress and resets the device, after which it is then
ready for a new operation. The RESET# pin may be
tied to the system reset circuitry. A system reset would
thus also reset the device, enabling the host system to
read boot-up firmware from the Flash memory device.
The device reduces power consumption in the
standby mode
when it detects specific voltage levels
on CE# and RESET#, or when addresses have been
stable for a specified period of time.
The
Write Protect (WP#)
feature protects the top or
bottom two sectors by asserting a logic low on the
WP#/ACC pin. The protected sector will still be pro-
tected even during accelerated programming.
The
SecSi (Secured Silicon) Sector
provides a
128-word/256-byte area for code or data that can be
permanently protected. Once this sector is protected,
no further changes within the sector can occur.
AMD MirrorBit flash technology combines years of
Flash memory manufacturing experience to produce
the highest levels of quality, reliability and cost effec-
tiveness. The device electrically erases all bits within a
sector simultaneously via hot-hole assisted erase. The
data is programmed using hot electron injection.
2
Am29LV320MT/B
May 16, 2003
D A T A S H E E T
MIRRORBIT 32 MBIT DEVICE FAMILY
Device
LV033MU
LV320MT/B
LV320MH/L
Bus
x8
x8/x16
x8/x16
Sector Architecture
Uniform (64 Kbyte)
Boot (8 x 8 Kbyte
at top & bottom)
Uniform (64 Kbyte)
Packages
40-pin TSOP (std. & rev. pinout),
48-ball FBGA
48-pin TSOP, 48-ball Fine-pitch BGA,
64-ball Fortified BGA
56-pin TSOP (std. & rev. pinout),
64-ball Fortified BGA
V
IO
Yes
No
Yes
RY/BY#
Yes
Yes
Yes
WP#, ACC
ACC only
WP#/ACC pin
WP#/ACC pin
WP# Protection
No WP#
2 x 8 Kbyte
top or bottom
1 x 64 Kbyte
high or low
RELATED DOCUMENTS
To download related documents, click on the following
links or go to www.amd.com
→
Flash Memory
→
Prod-
uct Information
→
MirrorBit
→
Flash Information
→
Tech-
nical Documentation.
MirrorBit™ Flash Memory Write Buffer Programming
and Page Buffer Read
Implementing a Common Layout for AMD MirrorBit
and Intel StrataFlash Memory Devices
Migrating from Single-byte to Three-byte Device IDs
AMD MirrorBit™ White Paper
May 16, 2003
Am29LV320MT/B
3
D A T A S H E E T
TABLE OF CONTENTS
Product Selector Guide . . . . . . . . . . . . . . . . . . . . . 5
Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Connection Diagrams . . . . . . . . . . . . . . . . . . . . . . 6
Pin Description. . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Ordering Information . . . . . . . . . . . . . . . . . . . . . . . 9
Device Bus Operations . . . . . . . . . . . . . . . . . . . . 10
Table 1. Device Bus Operations .....................................................10
DQ3: Sector Erase Timer ....................................................... 37
DQ1: Write-to-Buffer Abort ..................................................... 37
Table 14. Write Operation Status ................................................... 37
Absolute Maximum Ratings. . . . . . . . . . . . . . . . . 38
Figure 10. Maximum Negative Overshoot Waveform ................... 38
Figure 11. Maximum Positive Overshoot Waveform..................... 38
Requirements for Reading Array Data ................................... 10
Writing Commands/Command Sequences ............................ 11
Automatic Sleep Mode ........................................................... 12
RESET#: Hardware Reset Pin ............................................... 12
Output Disable Mode .............................................................. 12
Table 2. Am29LV320MT Top Boot Sector Architecture ..................12
Table 3. Am29LV320MB Bottom Boot Sector Architecture .............14
Table 4. Autoselect Codes, (High Voltage Method) .......................16
DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 39
Test Conditions. . . . . . . . . . . . . . . . . . . . . . . . . . . 40
Figure 12. Test Setup.................................................................... 40
Table 15. Test Specifications ......................................................... 40
Key to Switching Waveforms. . . . . . . . . . . . . . . . 40
Figure 13. Input Waveforms and
Measurement Levels...................................................................... 40
AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 41
Read-Only Operations ........................................................... 41
Figure 14. Read Operation Timings ............................................... 41
Figure 15. Page Read Timings ...................................................... 42
Sector Group Protection and Unprotection ............................. 17
Table 5. Am29LV320MT Top Boot Sector Protection .....................17
Table 6. Am29LV320MB Bottom Boot Sector Protection ................17
Hardware Reset (RESET#) .................................................... 43
Figure 16. Reset Timings ............................................................... 43
Write Protect (WP#) ................................................................ 17
Temporary Sector Group Unprotect ....................................... 18
Figure 1. Temporary Sector Group Unprotect Operation................ 18
Figure 2. In-System Sector Group Protect/Unprotect Algorithms ... 19
Erase and Program Operations .............................................. 44
Figure 17. Program Operation Timings..........................................
Figure 18. Accelerated Program Timing Diagram..........................
Figure 19. Chip/Sector Erase Operation Timings ..........................
Figure 20. Data# Polling Timings (During Embedded Algorithms).
Figure 21. Toggle Bit Timings (During Embedded Algorithms)......
Figure 22. DQ2 vs. DQ6.................................................................
45
45
46
47
48
48
SecSi (Secured Silicon) Sector Flash Memory Region .......... 20
Table 7. SecSi Sector Contents ......................................................20
Figure 3. SecSi Sector Protect Verify.............................................. 21
Hardware Data Protection ...................................................... 21
Common Flash Memory Interface (CFI) . . . . . . . 21
Command Definitions . . . . . . . . . . . . . . . . . . . . . 24
Reading Array Data ................................................................ 24
Reset Command ..................................................................... 25
Autoselect Command Sequence ............................................ 25
Enter SecSi Sector/Exit SecSi Sector Command Sequence .. 25
Word/Byte Program Command Sequence ............................. 25
Figure 4. Write Buffer Programming Operation............................... 28
Figure 5. Program Operation .......................................................... 29
Temporary Sector Unprotect .................................................. 49
Figure 23. Temporary Sector Group Unprotect Timing Diagram ... 49
Figure 24. Sector Group Protect and Unprotect Timing Diagram .. 50
Alternate CE# Controlled Erase and Program Operations ..... 51
Figure 25. Alternate CE# Controlled Write (Erase/Program)
Operation Timings.......................................................................... 52
Program Suspend/Program Resume Command Sequence ... 29
Figure 6. Program Suspend/Program Resume............................... 30
Chip Erase Command Sequence ........................................... 30
Sector Erase Command Sequence ........................................ 30
Figure 7. Erase Operation............................................................... 31
Erase Suspend/Erase Resume Commands ........................... 31
Write Operation Status . . . . . . . . . . . . . . . . . . . . 34
DQ7: Data# Polling ................................................................. 34
Figure 8. Data# Polling Algorithm ................................................... 34
DQ6: Toggle Bit I .................................................................... 35
Figure 9. Toggle Bit Algorithm......................................................... 36
DQ2: Toggle Bit II ................................................................... 36
Reading Toggle Bits DQ6/DQ2 .............................................. 36
DQ5: Exceeded Timing Limits ................................................ 37
Erase And Programming Performance. . . . . . . . 53
Latchup Characteristics . . . . . . . . . . . . . . . . . . . . 53
TSOP Pin and BGA Package Capacitance . . . . . 54
Data Retention. . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
Physical Dimensions . . . . . . . . . . . . . . . . . . . . . . 55
TS 048—48-Pin Standard Pinout Thin Small Outline Package
(TSOP) ................................................................................... 55
Physical Dimensions . . . . . . . . . . . . . . . . . . . . . . 56
TS 048—48-Pin Standard Pinout Thin Small Outline Package
(TSOP) ................................................................................... 56
FBC048—48-Ball Fine-pitch Ball Grid Array (fBGA)
9 x 8 mm Package .................................................................. 57
Physical Dimensions
LAA064—64-Ball Fortified Ball Grid Array (FBGA)
13 x 11 mm Package . . . . . . . . . . . . . . . . . . . . . . . 58
Revision Summary . . . . . . . . . . . . . . . . . . . . . . . . 60
4
Am29LV320MT/B
May 16, 2003
D A T A S H E E T
PRODUCT SELECTOR GUIDE
Part Number
Speed
Option
V
CC
= 3.0–3.6 V
V
CC
= 2.7–3.6 V
90
90
25
25
90R
100R
100
100
100
30
30
30
30
110
110
40
40
30
30
Am29LV320MT/B
110R
110
120
120
40
40
120R
120
Max. Access Time (ns)
Max. CE# Access Time (ns)
Max. Page access time (t
PACC
)
Max. OE# Access Time (ns)
Note:
See “AC Characteristics” for full specifications.
BLOCK DIAGRAM
RY/BY#
V
CC
V
SS
Erase Voltage
Generator
RESET#
WE#
WP#/ACC
BYTE#
Input/Output
Buffers
Sector Switches
DQ0
–
DQ15 (A-1)
State
Control
Command
Register
PGM Voltage
Generator
Chip Enable
Output Enable
Logic
STB
Data
Latch
CE#
OE#
STB
V
CC
Detector
Timer
Address Latch
Y-Decoder
Y-Gating
X-Decoder
Cell Matrix
A20–A0
May 16, 2003
Am29LV320MT/B
5
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