Snap-In Aluminum Electrolytic Capacitors
PEH506 Series, 85ºC
Overview
Applications
Typical applications for KEMET's PEH506 capacitor include
switch mode power supplies (SMPS), drives, welding equipment,
uninterruptible power supplies (UPS), and other power electronic
applications where high current ratings and compact size are
important.
KEMET's PEH506 is a long-life electrolytic capacitor designed
to offer high ripple current capability and low mounting cost. Low
ESR is the result of a very low resistive paper/electrolyte system.
Low ESR, together with the TDC thermal concept, gives the
PEH506 a high ripple current capability.
Benefits
•
•
•
•
•
Snap-In
Long life, 6,000 hours at +85°C (V
R
applied)
PCB mounting
Low ESR and ESL
High ripple current
Part Number System
PEH506
Series
Snap-In type
Aluminum
Electrolytic
J
Voltage (VDC)
J = 35
M = 63
P = 100
R = 200
S = 250
U = 350
V = 400
Y = 450
AC
Size Code
See Dimension
Table
433
Capacitance Code (µF)
The second two digits indicate
the two most significant digits of
the capacitance value. The first
digit indicates the total number
digits.
0
Version
0 = Standard
M
Capacitance
Tolerance
M = ±20%
2
Termination
See Termination
Table
One world. One KEMET
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 (864) 963-6300 • www.kemet.com
A4019_PEH506 • 4/15/2013
1
Snap-In Aluminum Electrolytic Capacitors – PEH506, +85ºC
Performance Characteristics
Item
Capacitance Range
Rated Voltage
Temperature Range
Capacitance Tolerance
Operational Lifetime
Shelf Life
Leakage Current
68 – 27,000 µF
35 – 450 VDC
-40 to +85°C
±20% at 100 Hz / +20°C
D (mm)
22–35
4 years at +40°C 0 VDC
I = 0.003 CV (µA)
C = rated capacitance (µF), V = rated voltage (VDC). Voltage applied for 5 minutes at +20°C.
Procedure
Vibration Test Specifications
0.75 mm displacement amplitude or 10g maximum
acceleration. Vibration applied for three 2-hour sessions at
10 – 500 Hz (Capacitor clamped by body).
Requirements
No leakage of electrolyte or other visible damage.
Deviations in capacitance and tanδ from initial
measurements must not exceed: ∆ C/C < 5%
+85°C (hours)
6,000
Performance Characteristics
Standards
IEC 60384-4 long life grade 40/85/56, in accordance with CECC 30 301–809
Test Method & Performance
Endurance Life Test
Conditions
Temperature
Test Duration
Ripple Current
Voltage
+85°C
2,000 hours
Maximum ripple current specified in table
The sum of DC voltage and the peak AC voltage must not exceed the rated voltage of the capacitor
Performance
Performance
Capacitance Change
Equivalent Series Resistance
Leakage Current
The following specifications will be satisfied when the capacitor is tested at +20°C:
≤ 160 V
> 160 V
Does not exceed 200% of the initial value
Does not exceed leakage current limit
Within 15% of the initial value
Within 10% of the initial value
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 (864) 963-6300 • www.kemet.com
A4019_PEH506 • 4/15/2013
2
Snap-In Aluminum Electrolytic Capacitors – PEH506, +85ºC
Dimensions – Millimeters
DXL
22 x 25
22 x 30
22 x 35
22 x 40
22 x 45
22 x 50
25 x 25
25 x 30
25 x 35
25 x 40
25 x 45
25 x 50
30 x 25
30 x 30
30 x 35
30 x 40
30 x 45
30 x 50
35 x 25
35 x 30
35 x 35
35 x 40
35 x 45
35 x 50
35 x 55
Size Code
AB
AC
AD
AE
AF
AG
BB
BC
BD
BE
BF
BG
CB
CC
CD
CE
CF
CG
DB
DC
DD
DE
DF
DG
DH
±0.5
22.5
22.5
22.5
22.5
22.5
22.5
25.5
25.5
25.5
25.5
25.5
25.5
30.5
30.5
30.5
30.5
30.5
30.5
35.5
35.5
35.5
35.5
35.5
35.5
35.5
Dimensions in mm
D1
L1
26
31
36
41
46
51
26
31
36
41
46
51
26
31
36
41
46
51
26
31
36
41
46
51
56
±1.0
Note: Add 0.5 mm to D and 1 mm to L for Sleeving
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 (864) 963-6300 • www.kemet.com
A4019_PEH506 • 4/15/2013
3
Snap-In Aluminum Electrolytic Capacitors – PEH506, +85ºC
Termination Tables
Termination Code
Diameter (mm)
22
25
30
35
2
•
•
•
•
2S
•
•
•
•
3
•
•
•
•
4
4S
•
•
Mounting: These capacitors are designed to be mounted by their terminations alone and may be used in any position.
Dummy pins on 4-pin decks must be isolated.
Termination
Code
2
2S
3
4
4S
Termination
Style
Standard Termination Option
2 Pin
Other Termination Options
2 Pin
3 Pin
4 Pin
4 Pin
LL
±1
6.3
4
4
6.3
4
Dimensions in mm
Style 2/2S
L
LL
D
10 ±0.1
2 ±0.1
Ø2.5 Minimum
Style 3
LL
3.3 ±0.1
+ ve
Ø2 ±0.1 Typical
-
10 ± 0.1
4.75 ± 0.1
Style 4/4S
LL
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 (864) 963-6300 • www.kemet.com
+
+
4HOLES ø2 ±0.1
ON A ø22.5 PCD
- ve
-
30°
30°
+ ve
A4019_PEH506 • 4/15/2013
4
Snap-In Aluminum Electrolytic Capacitors – PEH506, +85ºC
Shelf Life
The capacitance, ESR and impedance of a capacitor will not change significantly after extended storage periods, however the leakage
current will very slowly increase. KEMET products are particularly stable and allow a shelf life in excess of three years at 40°C. See
sectional specification under each product series for specific data.
Re-age (Reforming) Procedure
Apply the rated voltage to the capacitor at room temperature for a period of one hour, or until the leakage current has fallen to a steady
value below the specified limit. During re-aging a maximum charging current of twice the specified leakage current or 5 mA (whichever
is greater) is suggested.
Reliability
The reliability of a component can be defined as the probability that it will perform satisfactorily under a given set of conditions for a
given length of time.
In practice, it is impossible to predict with absolute certainty how any individual component will perform; thus, we must utilize probability
theory. It is also necessary to clearly define the level of stress involved (e.g. operating voltage, ripple current, temperature and time).
Finally, the meaning of satisfactory performance must be defined by specifying a set of conditions which determine the end of life of the
component.
Reliability as a function of time, R(t), is normally expressed as: R(t)=e-
λt
where R(t) is the probability that the component will perform satisfactorily for time t, and λ is the failure rate.
Failure Rate
The failure rate is the number of components failing per unit time. The failure rate of most electronic components follows the
characteristic pattern:
• Early failures are removed during the manufacturing process.
• The operational life is characterized by a constant failure rate.
• The wear out period is characterized by a rapidly increasing failure rate.
The failures in time (FIT) are given with a 60% confidence level for the various type codes. By convention, FIT is expressed as 1 x 10
-9
failures per hour. Failure rate is also expressed as a percentage of failures per 1,000 hours.
e.g., 100 FIT = 1 x 10
-7
failures per hour = 0.01%/1,000 hours
End of Life Definition
Catastrophic Failure: short circuit, open circuit or safety vent operation
Parametric Failure:
• Change in capacitance > ±10%
• Leakage current > specified limit
• ESR > 2 x initial ESR value
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 (864) 963-6300 • www.kemet.com
A4019_PEH506 • 4/15/2013
5
FPGA/CPLD
京公网安备 11010802033920号
EEWORLD
