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EPM7064AEFC100-7

Description
EE PLD, 7.5ns, 64-Cell, CMOS, PBGA100, FINE LINE, BGA-100
CategoryProgrammable logic devices    Programmable logic   
File Size1MB,66 Pages
ManufacturerIntel
Websitehttp://www.intel.com/
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EPM7064AEFC100-7 Overview

EE PLD, 7.5ns, 64-Cell, CMOS, PBGA100, FINE LINE, BGA-100

EPM7064AEFC100-7 Parametric

Parameter NameAttribute value
Is it Rohs certified?incompatible
MakerIntel
package instructionFINE LINE, BGA-100
Reach Compliance Codecompliant
ECCN codeEAR99
Other features64 MICROCELLS; 4 LABS; CONFIGURABLE I/O OPERATION WITH 2.5 OR 3.3
maximum clock frequency135.1 MHz
In-system programmableYES
JESD-30 codeS-PBGA-B100
JESD-609 codee0
JTAG BSTYES
length11 mm
Humidity sensitivity level3
Dedicated input times
Number of I/O lines68
Number of macro cells64
Number of terminals100
Maximum operating temperature70 °C
Minimum operating temperature
organize0 DEDICATED INPUTS, 68 I/O
Output functionMACROCELL
Package body materialPLASTIC/EPOXY
encapsulated codeLBGA
Encapsulate equivalent codeBGA100,10X10,40
Package shapeSQUARE
Package formGRID ARRAY, LOW PROFILE
Peak Reflow Temperature (Celsius)235
power supply2.5/3.3,3.3 V
Programmable logic typeEE PLD
propagation delay7.5 ns
Certification statusNot Qualified
Maximum seat height1.7 mm
Maximum supply voltage3.6 V
Minimum supply voltage3 V
Nominal supply voltage3.3 V
surface mountYES
technologyCMOS
Temperature levelCOMMERCIAL
Terminal surfaceTin/Lead (Sn/Pb)
Terminal formBALL
Terminal pitch1 mm
Terminal locationBOTTOM
Maximum time at peak reflow temperature30
width11 mm
MAX 7000A
®
Includes
MAX 7000AE
Programmable Logic
Device
Data Sheet
October 2002, ver. 4.3
Features...
High-performance 3.3-V EEPROM-based programmable logic
devices (PLDs) built on second-generation Multiple Array MatriX
(MAX
®
) architecture (see
Table 1)
3.3-V in-system programmability (ISP) through the built-in
IEEE Std. 1149.1 Joint Test Action Group (JTAG) interface with
advanced pin-locking capability
MAX 7000AE device in-system programmability (ISP) circuitry
compliant with IEEE Std. 1532
EPM7128A and EPM7256A device ISP circuitry compatible with
IEEE Std. 1532
Built-in boundary-scan test (BST) circuitry compliant with
IEEE Std. 1149.1
Supports JEDEC Jam Standard Test and Programming Language
(STAPL) JESD-71
Enhanced ISP features
Enhanced ISP algorithm for faster programming (excluding
EPM7128A and EPM7256A devices)
ISP_Done bit to ensure complete programming (excluding
EPM7128A and EPM7256A devices)
Pull-up resistor on I/O pins during in-system programming
Pin-compatible with the popular 5.0-V MAX 7000S devices
High-density PLDs ranging from 600 to 10,000 usable gates
Extended temperature range
f
For information on in-system programmable 5.0-V MAX 7000 or 2.5-V
MAX 7000B devices, see the
MAX 7000 Programmable Logic Device Family
Data Sheet
or the
MAX 7000B Programmable Logic Device Family Data Sheet.
Altera Corporation
DS-M7000A-4.3
1

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