*Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
REV. C
–3–
AD7892
TIMING CHARACTERISTICS
1, 2
(V
Parameter
t
CONV
t
ACQ
Parallel Interface
t
1
t
2
t
3
t
4
t
5
t
6 3
t
7 4
t
8
t
9
Serial Interface
t
10
t
113
t
12
t
13
t
143
t
153
t
16
t
174
t
17A4
A, B
Versions
1.47
1.6
200
400
35
60
0
0
35
35
5
30
0
200
30
25
25
25
5
25
20
0
30
0
30
DD
= +5 V
5%, AGND = DGND = 0 V, REF IN = +2.5 V)
Unit
µs
max
µs
max
ns min
ns min
ns min
ns min
ns min
ns min
ns min
ns max
ns min
ns max
ns min
ns min
ns min
ns max
ns min
ns min
ns min
ns max
ns min
ns min
ns max
ns min
ns max
Test Conditions/Comments
Conversion Time for AD7892-3
Conversion Time for AD7892-1, AD7892-2
Acquisition Time for AD7892-3
Acquisition Time for AD7892-1, AD7892-2
CONVST
Pulsewidth
EOC
Pulsewidth
EOC
Falling Edge to
CS
Falling Edge Setup Time
CS
to
RD
Setup Time
Read Pulsewidth
Data Access Time After Falling Edge of
RD
Bus Relinquish Time After Rising Edge of
RD
CS
to
RD
Hold Time
RD
to
CONVST
Setup Time
RFS
Low to SCLK Falling Edge Setup Time
RFS
Low to Data Valid Delay
SCLK High Pulsewidth
SCLK Low Pulsewidth
SCLK Rising Edge to Data Valid Hold Time
SCLK Rising Edge to Data Valid Delay
RFS
to SCLK Falling Edge Hold Time
Bus Relinquish Time after Rising Edge of
RFS
Bus Relinquish Time after Rising Edge of SCLK
S
Version
1.68
320
45
60
0
0
45
40
5
40
0
200
35
30
25
25
5
30
30
0
30
0
30
NOTES
1
Sample tested at +25°C to ensure compliance. All input signals are measured with tr = tf = 1 ns (10% to 90% of +5 V) and timed from a voltage level of +1.6 V.
2
See Figures 2 and 3.
3
Measured with the load circuit of Figure 1 and defined as the time required for an output to cross 0.8 V or 2.4 V.
4
These times are derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit of Figure 1. The measured number is then
extrapolated back to remove the effects of charging or discharging the 50 pF capacitor. This means that the times quoted in the timing characteristics are the true bus
relinquish times of the part and as such are independent of external bus loading capacitances.
5
Assumes CMOS loads on the data bits. With TTL loads, more current is drawn from the data lines and the
RD
to
CONVST
time needs to be extended to 400 ns min.
Specifications subject to change without notice.
1.6mA
TO
OUTPUT
PIN
50pF
+1.6V
200 A
Figure 1. Load Circuit for Access Time and Bus Relinquish Time
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD7892 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
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