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TC7WG00FU(TE12L,F)

Description
NAND Gate 2-Element 2-IN CMOS 8-Pin SSOP T/R
Categorylogic    logic   
File Size223KB,7 Pages
ManufacturerToshiba Semiconductor
Websitehttp://toshiba-semicon-storage.com/
Environmental Compliance
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TC7WG00FU(TE12L,F) Overview

NAND Gate 2-Element 2-IN CMOS 8-Pin SSOP T/R

TC7WG00FU(TE12L,F) Parametric

Parameter NameAttribute value
Is it Rohs certified?conform to
MakerToshiba Semiconductor
Reach Compliance Codeunknown
Factory Lead Time11 weeks
TC7WG00FU/FK
TOSHIBA CMOS Digital Integrated Circuit
Silicon Monolithic
TC7WG00FU,TC7WG00FK
Dual 2-Input NAND Gate
TC7WG00FU
Features
High output current
: ±8 mA (min) at V
CC
= 3 V
Super high speed operation : t
pd
= 2.5 ns (typ.)
at V
CC
= 3.3 V,15pF
Operating voltage range
5.5-V tolerant inputs
3.6-V power down protection outputs
TC7WG00FK
: V
CC
= 0.9 to 3.6 V
(SM8)
Marking
SM8
Product Name
US8
G 00
Lot No.
WG
00
Weight:
SSOP8-P-0.65
SSOP8-P-0.50A
(US8)
: 0.02 g (typ.)
: 0.01 g (typ.)
Absolute Maximum Ratings
(Ta = 25°C)
Characteristics
Supply voltage
DC input voltage
DC output voltage
Input diode current
Output diode current
DC output current
DC V
CC
/GND current
Power dissipation
Storage temperature
Symbol
V
CC
V
IN
V
OUT
I
IK
I
OK
I
OUT
I
CC
P
D
T
stg
Rating
−0.5
to 4.6
−0.5
to 7.0
−0.5
to 4.6
−0.5
to V
CC
+0.5
−20
−20
±25
±50
300 (SM8)
200 (US8)
−65
to 150
(Note 3)
(Note1)
(Note2)
Unit
V
V
Pin Assignment
(top view)
1A
1B
1
2
3
4
8
V
CC
7
6
5
1Y
2B
2A
V
2Y
mA
mA
mA
mA
mW
°C
GND
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
Note 1: V
CC
= 0 V
Note 2: High or Low state. Do not exceed I
OUT
of absolute maximum ratings.
Note 3: V
OUT
< GND
1
2009-07-09

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Description NAND Gate 2-Element 2-IN CMOS 8-Pin SSOP T/R NAND Gate 2-Element 2-IN CMOS 8-Pin SSOP T/R
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