QS74LCX162827 PRELIMINARY
Q
Q
UALITY
S
EMICONDUCTOR,
I
NC.
FEATURES/BENEFITS
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High-Speed CMOS 3.3V
20-Bit Buffer
with Output Resistor
DESCRIPTION
QS74LCX162827
PRELIMINARY
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5V tolerant inputs and outputs
25Ω series resistor for low switching noise
10µA I
CCQ
quiescent power supply current
Hot insertable
2.0V-3.6V V
CC
supply operation
±12mA
balanced output drive
Power down high impedance inputs and outputs
t
PD
= 6.5ns
Input hysteresis for noise immunity
Meets or exceeds JEDEC Standard 36
specifications
Multiple power and ground pins for low noise
Operating temperature range:
–40°C to 85°C
Latch-up performance exceeds 500mA
ESD performance:
Human body model > 2000V
Machine model > 200V
Packages available:
56-pin TSSOP
56-pin SSOP
The QS74LCX162827 is a 20-bit buffer that is ideal
for driving address and data buses. The 3.3V LCXPlus
family features low power, low switching noise, and
fast switching speeds for low power portable applica-
tions as well as high-end, advanced workstation
applications. 5V tolerant inputs and outputs allow this
LCXPlus product to be used in mixed 5V and 3.3V
applications. The QS74LCX162827 with integrated
output resistor is ideally suited for low noise environ-
ments where reduced output overshoot and under-
shoot are critical requirements. Easy board layout is
facilitated by the use of flow-through pinouts and byte
enable controls provide architectural flexibility for
systems designers. To accommodate hot-plug or live
insertion applications, this product is designed not to
load an active bus when V
CC
is removed.
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Figure 1. Functional Block Diagram
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1OE1
1OE2
2OE1
2OE2
1A1
1Y1
2A1
2Y1
To 9 Other Channels
To 9 Other Channels
MDSL-00233-01
FEBRUARY 10, 1998
QUALITY SEMICONDUCTOR, INC.
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QS74LCX162827 PRELIMINARY
Figure 2. Pin Configuration
(All Pins Top View)
SSOP, TSSOP
1OE1
1Y1
1Y2
GND
1Y3
1Y4
V
CC
1Y5
1Y6
1Y7
GND
1Y8
1Y9
1Y10
2Y1
2Y2
2Y3
GND
2Y4
2Y5
2Y6
V
CC
2Y7
2Y8
GND
2Y9
2Y10
2OE1
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
1OE2
1A1
1A2
GND
1A3
1A4
V
CC
1A5
1A6
1A7
GND
1A8
1A9
1A10
2A1
2A2
2A3
GND
2A4
2A5
2A6
V
CC
2A7
2A8
GND
2A9
2A10
2OE2
Table 1. Pin Description
Name
xOEx
xAx
xYx
Description
Output Enables
Data Inputs
Data Outputs
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Table 2. Function Table
OE1
OE
L
L
H
—
Inputs
OE2
OE
L
L
—
H
xAx
L
H
—
—
Output
xYx
L
H
Hi-Z
Hi-Z
Function
Enabled
Enabled
High Impedance
High Impedance
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QUALITY SEMICONDUCTOR, INC.
MDSL-00233-01
FEBRUARY 10, 1998
QS74LCX162827 PRELIMINARY
Table 3. Capacitance
Symbol
C
IN
C
I/O
C
PD
Pins
Input Capacitance
I/O Capacitance
Power Dissipation
Capacitance
Typ
7.0
8.0
25
Unit
pF
pF
pF
Conditions
V
IN
= 0V, V
OUT
= 0V, f = 1MHz
V
IN
= 0V, V
OUT
= 0V, f = 1MHz
V
CC
= 3.3V, V
IN
= 0 or V
CC
f = 10MHz
Note:
Capacitance is characterized but not production tested.
Table 4. Absolute Maximum Ratings
Supply Voltage to Ground ................................................. –0.5V to 7.0V
DC Output Voltage V
OUT
Outputs HIGH-Z .............................................................. –0.5V to 7.0V
Outputs Active ...................................................... –0.5V to V
CC
+ 0.5V
DC Input Voltage V
IN
......................................................... –0.5V to 7.0V
DC Input Diode Current with V
IN
< 0 ........................................... –50mA
DC Output Diode Current
V
O
< 0 ....................................................................................... –50mA
V
O
> V
CC
.................................................................................... 50mA
DC Output Source/Sink Current (I
OH
/I
OL
) ....................................
±50mA
DC Supply Current per Supply Pin ...........................................
±100mA
DC Ground Current per Ground Pin .........................................
±100mA
T
STG
Storage Temperature ............................................. –65°C to 150°C
Note:
Stresses greater than
those listed under ABSOLUTE
MAXIMUM RATINGS may
cause permanent damage to
this device resulting in func-
tional or reliability type failures.
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Table 5. Recommended Operating Conditions
Symbol
V
CC
V
IN
V
OUT
V
OUT
I
OH
/I
OL
∆t/∆v
T
A
Parameter
Supply Voltage, Operating
Supply Voltage, Data Retention Only
Input Voltage
Output Voltage in Active State
Output Voltage in "OFF" State
Output Current
V
CC
= 3.0 – 3.6V
V
CC
= 2.7V
Input Transition Slew Rate
Operating Free Air Tempeature
—
–40
Min
2.0
1.5
0
0
0
—
Max
3.6
3.6
5.5
V
CC
5.5
±12
±6
10
85
ns/V
°C
V
V
V
mA
Unit
V
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MDSL-00233-01
FEBRUARY 10, 1998
QUALITY SEMICONDUCTOR, INC.
3
QS74LCX162827 PRELIMINARY
Table 6. DC Electrical Characteristics Over Operating Range
Industrial Temperature Range, T
A
= –40°C to 85°C
Symbol
V
IH
V
IL
V
OH
Parameter
Input HIGH Voltage
Input LOW Voltage
Output HIGH Voltage
Test Conditions
(1)
Logic HIGH for All Inputs
Logic LOW for All Inputs
V
CC
= 2.7V, I
OH
= –100µA
V
CC
= 3.0V, I
OH
= –12mA
V
CC
= 3.0V, I
OH
= –18mA
V
CC
= 2.7V, I
OL
= 100µA
V
CC
= 3.0V, I
OL
= 12mA
V
CC
= 3.0V, I
OL
= 18mA
V
CC
= 3.0V, I
OL
= 12mA
V
TLH
– V
THL
for All Inputs
V
CC
= Max., V
I
= 0V, V
I
= 5.5V
V
CC
= Max., V
O
= 0V
V
O
= 5.5V, V
I
= V
IH
or V
IL
V
CC
= 3.6V, V
O
=
GND
V
CC
= 3.6V, V
OUT
= 2.0V
V
CC
= 0V, V
I
or V
O
= 5.5V
V
CC
= 2.7V, I
IN
= –18mA
Min
2.0
—
V
CC
–0.2
2.4
2.2
—
—
—
—
—
—
—
–60
Typ
(2)
—
—
—
—
—
—
—
—
28
150
—
—
—
Max
—
0.8
—
—
—
0.2
0.55
0.8
—
—
±1.0
±1.0
–200
—
10
Unit
V
V
V
V
OL
Output LOW Voltage
V
R
OUT
∆V
T
I
I
I
OZ
I
I
OS
I
OR
I
OFF
V
IK
Output Resistance
Input Hysteresis
(3)
Input Leakage Current
High-Z I/O Leakage
Short Circuit Current
(3,4)
Current Drive
Power Off Leakage
Input Clamp Voltage
Ω
mV
µA
µA
mA
mA
µA
V
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—
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—
—
–1.2
–0.7
Notes:
1. For conditions shown as Min. or Max., use appropriate value specified under Recommended Operating Conditions
for the appropriate device type.
2. Typical values are at V
CC
= 3.3V, and T
A
= 25°C.
3. These parameters are guaranteed by characterization, but not production tested.
4. Not more than one output should be tested at one time. Duration of test should not exceed one second.
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QUALITY SEMICONDUCTOR, INC.
MDSL-00233-01
FEBRUARY 10, 1998
QS74LCX162827 PRELIMINARY
Table 7. Power Supply Characteristics
Symbol
I
CC
∆I
CC
I
CCD
Parameter
Quiescent Power
Supply Current
Supply Current per
Input @ TTL HIGH
Supply Current per
Input per MHz
(4)
Total Power
Supply Current
(6)
Test Conditions
(1)
V
CC
= 3.6V, Freq = 0
V
IN
= GND or V
CC
V
CC
= 3.6V, V
IN
= V
CC
-0.6V
(3)
V
CC
= 3.6V, Outputs Open
One Bit Toggling @ 50% Duty Cycle
xOE = GND
V
CC
= 3.6V, Outputs Open
One Bit Toggling
@ 50% Duty Cycle
xOE = GND, f = 10MHz
V
CC
= 3.6V, Outputs Open
Twenty Bits Toggling
@ 50% Duty Cycle
xOE = GND, f = 2.5MHz
Typ
(2)
0.1
2.0
65
Max
10
30
100
Unit
µA
µA
µA/
MHz
mA
I
C
V
IN
= V
CC
-0.6V 0.5
(5)
V
IN
= GND
0.8
(5)
V
IN
= V
CC
-0.6V 3.3
(5)
V
IN
= GND
5.4
(5)
Notes:
1. For conditions shown as Min. or Max., use the appropriate values specified under Recommended Operating Conditions
for applicable device type.
2. Typical values are at V
CC
= 3.3V, 25°C ambient.
3. Per TTL driven input. All other inputs at V
CC
or GND.
4. This parameter is not directly testable, but is derived for use in total power supply calculations.
5. Values for these conditions are examples of the I
CC
formula. These limits are guaranteed by design but not tested.
6. I
C
= I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
.
I
C
= I
CCQ
+
∆I
CC
D
H
N
T
+ I
CCD
f N
O
.
I
CCQ
= Quiescent Current (I
CCL
, I
CCH
, and I
CCZ
).
∆I
CC
= Power Supply Current for a TTL-High Input (V
IN
= V
CC
-0.6V).
D
H
= Duty Cycle for TTL High Inputs.
N
T
= Number of TTL High Inputs.
I
CCD
= Dynamic Current Caused by an Input Transition Pair (HLH or LHL).
f = Average Switching Frequency per Output
N
O
= Number of Outputs Switching
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Table 8. Dynamic Switching Characteristics
(1)
V
CC
T
A
= 25
°
C
Symbol Parameter
V
OLP
V
OLV
Quiet Output Dynamic Peak V
OL
Conditions
C
L
= 30pF, V
IH
= 3.3V, V
IL
= 0V
(V)
3.3
3.3
Typical
0.8
0.8
Units
V
V
Quiet Output Dynamic Valley V
OL
C
L
= 30pF, V
IH
= 3.3V, V
IL
= 0V
Note:
1. Characterized but not production tested.
MDSL-00233-01
FEBRUARY 10, 1998
QUALITY SEMICONDUCTOR, INC.
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