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DM7426 Quad 2-Input NAND Gates with High Voltage Open-Collector Outputs
August 1986
Revised July 2001
DM7426
Quad 2-Input NAND Gates with
High Voltage Open-Collector Outputs
General Description
This device contains four independent gates each of which
performs the logic NAND function. The open-collector out-
puts require external pull-up resistors for proper logical
operation.
Pull-Up Resistor Equations
Where:
N
1
(I
OH
)
=
total maximum output high current
for all outputs tied to pull-up resistor
N
2
(I
IH
)
=
total maximum input high current for
all inputs tied to pull-up resistor
N
3
(I
IL
)
=
total maximum input low current for
all inputs tied to pull-up resistor
Ordering Code:
Order Number
DM7426N
Package Number
N14A
Package Description
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide
Connection Diagram
Function Table
Y
=
AB
Inputs
A
L
L
H
H
H
=
HIGH Logic Level
L
=
LOW Logic Level
Output
B
L
H
L
H
Y
H
H
H
L
© 2001 Fairchild Semiconductor Corporation
DS006508
www.fairchildsemi.com
DM7426
Absolute Maximum Ratings
(Note 1)
Supply Voltage
Input Voltage
Output Voltage
Operating Free Air Temperature Range
Storage Temperature Range
7V
5.5V
15V
0
°
C to
+
70
°
C
Note 1:
The “Absolute Maximum Ratings” are those values beyond which
the safety of the device cannot be guaranteed. The device should not be
operated at these limits. The parametric values defined in the Electrical
Characteristics tables are not guaranteed at the absolute maximum ratings.
The “Recommended Operating Conditions” table will define the conditions
for actual device operation.
−
65
°
C to
+
150
°
C
Recommended Operating Conditions
Symbol
V
CC
V
IH
V
IL
V
OH
I
OL
T
A
Parameter
Supply Voltage
HIGH Level Input Voltage
LOW Level Input Voltage
HIGH Level Output Voltage
LOW Level Output Current
Free Air Operating Temperature
0
Min
4.75
2
0.8
15
16
70
Nom
5
Max
5.25
Units
V
V
V
V
mA
°
C
Electrical Characteristics
over recommended operating free air temperature range (unless otherwise noted)
Symbol
V
I
I
CEX
V
OL
I
I
I
IH
I
IL
I
CCH
I
CCL
Parameter
Input Clamp Voltage
HIGH Level
Output Current
LOW Level
Output Voltage
Input Current @ Max
Input Voltage
High Level Input Current
Low Level Input Current
Conditions
V
CC
=
Min, I
I
= −12
mA
V
CC
=
Min
V
IL
=
Max
V
CC
=
Min, I
OL
=
Max
V
IH
=
Min
V
CC
=
Max,
V
I
=
5.5V
V
CC
=
Max, V
I
=
2.4V
V
CC
=
Max, V
I
=
0.4V
4
12
V
O
=
15V
V
O
=
12V
Min
Typ
(Note 2)
Max
−1.5
1000
50
0.4
1
40
−1.6
8
22
Units
V
µA
V
mA
µA
mA
mA
mA
Supply Current with Outputs HIGH V
CC
=
Max
Supply Current with Outputs LOW V
CC
=
Max
Note 2:
All typicals are at V
CC
=
5V, T
A
=
25°C.
Switching Characteristics
at V
CC
=
5V and T
A
=
25°C
Symbol
t
PLH
t
PHL
Parameter
Propagation Delay Time
LOW-to-HIGH Level Output
Propagation Delay Time
HIGH-to-LOW Level Output
C
L
=
15 pF
R
L
=
1 kΩ (t
PLH
)
Conditions
Min
Max
24
17
Units
ns
ns
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2
DM7426 Quad 2-Input NAND Gates with High Voltage Open-Collector Outputs
Physical Dimensions
inches (millimeters) unless otherwise noted
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide
Package Number N14A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be rea-
sonably expected to result in a significant injury to the
user.
3
2. A critical component in any component of a life support
device or system whose failure to perform can be rea-
sonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
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