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BYV54S200FSYHRB

Description
40A, 200V, SILICON, RECTIFIER DIODE, TO-254AA, HERMETIC SEALED, METAL PACKAGE-3
CategoryDiscrete semiconductor    diode   
File Size77KB,8 Pages
ManufacturerSTMicroelectronics
Websitehttp://www.st.com/
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BYV54S200FSYHRB Overview

40A, 200V, SILICON, RECTIFIER DIODE, TO-254AA, HERMETIC SEALED, METAL PACKAGE-3

BYV54S200FSYHRB Parametric

Parameter NameAttribute value
MakerSTMicroelectronics
Parts packaging codeTO-254AA
package instructionHERMETIC SEALED, METAL PACKAGE-3
Contacts3
Reach Compliance Codeunknown
ECCN codeEAR99
Factory Lead Time30 weeks
applicationFAST RECOVERY
ConfigurationSINGLE
Diode component materialsSILICON
Diode typeRECTIFIER DIODE
Maximum forward voltage (VF)0.85 V
JEDEC-95 codeTO-254AA
JESD-30 codeS-MSFM-P3
Maximum non-repetitive peak forward current400 A
Number of components1
Phase1
Number of terminals3
Maximum operating temperature150 °C
Maximum output current40 A
Package body materialMETAL
Package shapeSQUARE
Package formFLANGE MOUNT
Certification statusNot Qualified
Maximum repetitive peak reverse voltage200 V
Maximum reverse recovery time0.06 µs
surface mountNO
Terminal formPIN/PEG
Terminal locationSINGLE

BYV54S200FSYHRB Preview

BYV54HR
Aerospace 40 A - 200 V fast recovery rectifier
Features
Very small conduction losses
Negligible switching losses
High surge current capability
High avalanche energy capability
Hermetic package
Target radiation qualification:
– 150 krad (Si) low dose rate
– 1 Mrad high dose rate
Package mass: 10 g
ESCC qualified
Figure 1.
Device configuration
BYV54S200FSY1
BYV54S200FSYHRB
2
TO-254AA
Description
Packaged in a hermetic TO-254AA, this device is
intended for use in medium voltage, high
frequency switching mode power supplies, high
frequency DC to DC converters, and other
aerospace applications.
The complete ESCC specification for this device
is available from the European space agency web
site. ST guarantees full compliance of qualified
parts with such ESCC detailed specifications.
Table 1.
Device summary
(1)
ESCC detailed
Quality level
specification
-
5103/031/05
Engineering
model
Flight part
Terminal 1: Cathode
Terminal 2: Anode
Terminal 3: Anode
1
3
The case is not connected to any lead
Order code
BYV54S200FSY1
BYV54S200FSYHRB
Lead
finish
Gold
Solder
dip
EPPL
-
I
F(AV)
V
RRM
T
j(max)
V
F (max)
40 A
Y
200 V
150 °C
1.10 V
1. Contact ST sales office for information about the specific conditions for products in die form and QML-Q versions.
July 2010
Doc ID 17416 Rev 1
1/8
www.st.com
8
Characteristics
BYV54HR
1
Characteristics
Table 2.
Symbol
Absolute maximum ratings
Characteristic
Forward surge current
(1)
Repetitive peak reverse voltage
(2)
Average output rectified current (50% duty cycle):
(3)
Forward rms current
Operating case temperature range
(4)
Junction temperature
Storage temperature range
(4)
Soldering temperature
(5)
Value
400
200
40
60
-55 to +150
+150
-55 to +150
+260
Unit
A
V
A
A
°C
°C
°C
°C
I
FSM
V
RRM
I
O
I
F(RMS)
T
OP
T
J
T
STG
T
SOL
1. Sinusoidal pulse of 10 ms duration
2. Pulsed, duration 5 ms, F = 50 Hz
3. For T
case
>
+99 °C, derate linearly to 0 A at +150°C.
4. For devices with hot solder dip lead finish all testing performed at T
amb
> +125 °C are carried out in a 100%
inert atmosphere.
5. Duration 10 seconds maximum at a distance of not less than 1.5 mm from the device body and the same
lead shall not be resoldered until 3 minutes have elapsed.
Table 3.
Symbol
R
th (j-c)
Thermal resistance
Parameter
Junction to case
(1)
Value
1.0
Unit
°C/W
1. Package mounted on infinite heatsink.
2/8
Doc ID 17416 Rev 1
BYV54HR
Table 4.
Symbol
s
Characteristics
Electrical measurements at ambiant temperature (per diode), T
amb
= 22 ±3 °C
Characteristic
Reverse current
Forward voltage
Breakdown voltage
Capacitance
Reverse recovery time
Relative thermal impedance,
junction to case
MIL-STD-750
test method
4016
4011
4021
4001
4031
3101
Test conditions
(1)
DC method, V
R
= 200 V
Pulse method, I
F
= 20 A
Pulse method, I
F
= 30 A
I
R
= 100 µA
V
R
= 10 V, F = 1 MHz
I
F
= 1 A, V
R
= 30 V,
dI
F
/dt = -50 A/µs
I
H
= 15 to 40 A, t
H
= 50 ms
I
M
= 50 mA, t
md
= 100 µs
-
-
-
200
-
-
Limits
Units
Min.
Max.
50
0.95
1.1
-
400
60
µA
V
V
V
pF
ns
°C/W
I
R
V
F1
(2)
V
F2(2)
V
BR
C
t
rr
Z
th(j-c)
(3)
Calculate
ΔV
F(4)
1. Testing performed with both anode terminals 2 and 3 tied ttogehter
2. Pulse width
680 µs, duty cycle
2%
3. Performed only during screening tests parameter drift values (initial measurements for HTRB), go-no-go.
4. The limits for
ΔVF
shall be defined by the manufacturer on every lot in accordance with MIL-STD-750 Method 3101 and
shall guarantee the R
th(j-c)
limits specified in maximum ratings.
Table 5.
Symbol
Electrical measurements at high and low temperatures (per diode)
Characteristic
MIL-STD-750
test method
4016
Test
conditions
(1)
Limits
Units
Min.
T
case
= +125 (+0, -5) °C
DC method, V
R
= 200 V
T
case
= +125 (+0, -5) °C
pulse method, I
F
= 20 A
Forward voltage
4011
T
case
= -55 (+0, -5) °C
pulse method, I
F
= 20 A
T
case
= +125 (+0, -5) °C
pulse method, I
F
= 30 A
-
-
-
Max.
40
0.85
1.15
1.0
mA
V
V
I
R
Reverse current
V
F1
(2)
V
F2
(2)
1. Read and record measurements shall be performed on a sample of 5 components with 0 failures allowed. Alternatively a
100% inspection may be performed.
2. Pulse width
680 µs, duty cycle
2%
To evaluate the conduction losses use the following equation:
P = 0.74 x I
F(AV)
+ 1.00 x I
F2(RMS )
Doc ID 17416 Rev 1
3/8
Package information
BYV54HR
2
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK
®
packages, depending on their level of environmental compliance. ECOPACK
®
specifications, grade definitions and product status are available at:
www.st.com.
ECOPACK
®
is an ST trademark.
Figure 2.
Metal flange mount package (TO-254AA
(a)
), 3 lead dimension definitions
B
R1
H
E
D
ØF
G
C
A
1
R2
2
3
N
ØM
L
K
K
J
ØI
a. The terminal identification is specified by the device configuration. See
Figure 1
for terminal connections
4/8
Doc ID 17416 Rev 1
BYV54HR
Table 6.
Package information
Metal flange mount package (TO-254), 3-lead dimension values
Dimension in millimetres
Reference
Min.
A
B
C
D
E
ØF
G
H
ØI
(1)
J
K
L
ØM
N
R1
(2)
R2
(3)
1. 3 locations
2. Radius of heatsink flange corner - 4 locations
3. Radius of body corner - 4 locations
Dimlension in inches
Min.
0.535
0.535
0.790
0.248
0.039
0.138
0.665
0.270 BSC
Max.
0.545
0.545
0.800
0.264
0.154
0.154
0.685
Max.
13.84
13.84
20.32
6.7
3.9
3.9
17.4
6.86 BSC
13.59
13.59
20.07
6.3
1
3.5
16.89
0.89
3.81 BSC
3.81 BSC
12.95
3.05 Typ.
-
-
1.65 Typ.
1.14
0.035
0.150 BSC
0.150 BSC
0.045
14.5
0.510
0.120 Typ.
0.571
0.71
1
-
-
0.065
0.028
0.039
Doc ID 17416 Rev 1
5/8

BYV54S200FSYHRB Related Products

BYV54S200FSYHRB BYV54S200FSY1
Description 40A, 200V, SILICON, RECTIFIER DIODE, TO-254AA, HERMETIC SEALED, METAL PACKAGE-3 40A, 200V, SILICON, RECTIFIER DIODE, TO-254AA, HERMETIC SEALED, METAL PACKAGE-3
Maker STMicroelectronics STMicroelectronics
Parts packaging code TO-254AA TO-254AA
package instruction HERMETIC SEALED, METAL PACKAGE-3 HERMETIC SEALED, METAL PACKAGE-3
Contacts 3 3
Reach Compliance Code unknown unknown
ECCN code EAR99 EAR99
Factory Lead Time 30 weeks 30 weeks
application FAST RECOVERY FAST RECOVERY
Configuration SINGLE SINGLE
Diode component materials SILICON SILICON
Diode type RECTIFIER DIODE RECTIFIER DIODE
JEDEC-95 code TO-254AA TO-254AA
JESD-30 code S-MSFM-P3 S-MSFM-P3
Maximum non-repetitive peak forward current 400 A 400 A
Number of components 1 1
Phase 1 1
Number of terminals 3 3
Maximum operating temperature 150 °C 150 °C
Maximum output current 40 A 40 A
Package body material METAL METAL
Package shape SQUARE SQUARE
Package form FLANGE MOUNT FLANGE MOUNT
Certification status Not Qualified Not Qualified
Maximum repetitive peak reverse voltage 200 V 200 V
Maximum reverse recovery time 0.06 µs 0.06 µs
surface mount NO NO
Terminal form PIN/PEG PIN/PEG
Terminal location SINGLE SINGLE

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