TC7USB221WBG
CMOS Digital Integrated Circuits Silicon Monolithic
TC7USB221WBG
1. Functional Description
•
Dual SPDT USB Switch
2. General
The TC7USB221WBG is high-speed CMOS dual 1-2 multiplexer/demultiplexer. The low ON-resistance and the
low capacitance of the switch allow connections to USB application.
This device consists of dual individual two-inputs multiplexer/demultiplexer with common select input (S) and
output enable (OE). The D+/D- inputs is connected to the 1D+/1D- or 2D+/2D- outputs determined by the
combination both the select input (S) and output enable (OE). When the output enable (OE) input is held high
level, the switches are open with regardless the state of select inputs and a high-impedance state exists between
the switches.
All inputs are equipped with protection circuits against static discharge.
3. Features
(1)
(2)
(3)
(4)
(5)
(6)
(7)
(8)
Supply voltage: V
CC
= 2.3 to 3.6 V
Switch terminal ON-capacitance: C
I/O
= 7 pF Switch ON (typ.) @V
CC
= 3.3 V
ON-resistance: R
ON
= 6.5
Ω
(typ.) @V
CC
= 3 V, V
IS
= 0 V
R
ON
flatness: R
ON(flat)
= 1.6
Ω
(typ.)@V
CC
= 3 V
Difference of ON-resistance between switches:
∆R
ON
= 0.5
Ω
(typ.)@V
CC
= 3 V
ESD performance: Machine model
≥ ±200
V, Human body model
≥ ±2000
V
Power-down protection provided on all inputs and outputs.
Package: WCSP10B
4. Packaging and Pin Assignment (Top View)
S-UFBGA10-0202-0.40-001
4.1. Pin Assignment
1
A
B
C
D
1D+
1D-
2D+
2D-
2
V
CC
No Ball
No Ball
GND
3
S
D+
D-
OE
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Rev.1.0
TC7USB221WBG
5. Marking
Fig. 5.1 Marking
6. Block Diagram
Fig. 6.1 Block Diagram
7. Principle of Operation
7.1. Truth Table
Input
OE
L
L
H
Input
S
L
H
X
Function
D+ port = 1D+ port, D- Port = 1D- Port
D+ port = 2D+ port, D- Port = 2D- Port
Disconnect
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TC7USB221WBG
8. Absolute Maximum Ratings (Note)
Characteristics
Supply voltage
Input voltage (OE, S)
Switch I/O voltage
Symbol
V
CC
V
IN
V
S
V
CC
= 0 V or Switch OFF
Switch ON
Clamp diode current
I
IK
Control input
Switch
Switch I/O current
Power dissipation
V
CC
/ground current
Storage temperature
I
S
P
D
I
CC
/I
GND
T
stg
Note
Test Condition
Rating
-0.5 to 4.6
-0.5 to 4.6
-0.5 to 4.6
0.5 to V
CC
+0.5
-50
±50
50
150
±100
-65 to 150
mW
mA
mA
Unit
V
Note:
Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even
destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
9. Operating Ranges (Note)
Characteristics
Supply voltage
Input voltage (OE, S)
Switch I/O voltage
Symbol
V
CC
V
IN
V
S
V
CC
= 0 V or Switch OFF
Switch ON
Operating temperature
Input rise time
Input fall time
T
opr
dt/dv
Note
Test Condition
Rating
2.3 to 3.6
0 to 3.6
0 to 3.6
0 to V
CC
-40 to 85
0 to 10
0 to 10
ns/V
Unit
V
Note:
The operating ranges must be maintained to ensure the normal operation of the device.
Unused inputs and bus inputs must be tied to either V
CC
or GND.
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Rev.1.0
TC7USB221WBG
10. Electrical Characteristics
10.1. DC Characteristics (Unless otherwise specified, T
a
= -40 to 85
)
85
Characteristics
High-level input voltage (OE, S)
Low-level input voltage (OE, S)
Input leakage current (OE, S)
Power-OFF leakage current
Switch OFF-state leakage
current
ON-resistance
Symbol
V
IH
V
IL
I
IN
I
OFF
I
SZ
R
ON
Note
V
IN
= 0 to 3.6 V
V
IN
= V
IS
= 0 to 3.6 V
V
IS
= 0 to V
CC
, OE = V
CC
(Note 1), V
IS
= 0 V, I
IS
= 30 mA
(Note 2) V = 0.4 V, I = 30 mA
IS
IS
V
IS
= 3.0 V, I
IS
= 30 mA
Difference of ON-resistance
between switches
ON-resistance flatness
Quiescent supply current
∆R
ON
R
ON(flat)
I
CC
∆I
CC
V
IS
= 0.4 V, 1.0 V,
I
IS
= 30 mA
V
IS
= 0 V to 1.0 V,
I
IS
= 30 mA
V
IN
= V
CC
or GND,
I
OUT
= 0 A
V
IN
= 1.8 V (one input)
Test Condition
V
CC
(V)
2.3 to 3.6
2.3 to 3.6
2.3 to 3.6
0
2.3 to 3.6
3.0
3.0
3.0
3.0
3.0
3.6
3.6
Min
0.46
×
V
CC
Typ.
6.5
7
13
0.5
1.6
Max
0.25
×
V
CC
±1.0
±5.0
±5.0
10
11
19
2.0
10.0
µA
Ω
µA
Unit
V
Note 1: All typical values are at T
a
= 25.
Note 2: Measured by the voltage drop between D+/D- and 1D+/1D-,2D+/2D- pins at the indicated current through the
switch. On-resistance is determined by the lower of the voltages on the two pins.
85
10.2. AC Characteristics (Unless otherwise specified, T
a
= -40 to 85
)
Characteristics
Propagation delay time
Turn-ON time
(S, OE to output)
Turn-OFF time
(S, OE to output)
Break before Make
Skew of opposite transitions of
the same output (t
PHL
- t
PLH
)
Output skew (center port to any
other port)
Symbol
Note
Test Condition
V
CC
(V)
3.3
±
0.3
Min
R
L
= 50
Ω,
C
L
= 5 pF,
See Fig. 11.3
(Note 1) C
L
= 5 pF, See Fig. 11.4
(Note 1) C
L
= 5 pF, See Fig. 11.5
2
Typ.
0.25
7.5
3.3
0.1
0.1
Max
17
10
7.0
Unit
ns
t
PLH
/t
PHL
(Note 1) C
L
= 5 pF, See Fig. 11.1
t
on
t
off
TBBM
t
SK(P)
t
SK(O)
R
L
= 50
Ω,
C
L
= 5 pF,
See Fig. 11.2
Note 1: Parameter guaranteed by design.
10.3. Analog Switch (Note) (Unless otherwise specified, T
a
= -40 to 85
)
85
Characteristics
OFF isolation (non-adjacent)
Crosstalk (non-adjacent)
-3dB Bandwidth
Symbol
OIRR
Xtalk
BW
Note
Test Condition
R
T
= 50
Ω,
f = 240 MHz,
See Fig. 11.6
R
T
= 50
Ω,
f = 240 MHz,
See Fig. 11.7
R
L
= 50
Ω,
CL = 0 pF,
See Fig. 11.8
V
CC
(V)
3.3
±
0.3
Min
Typ.
-36
-36
820
Max
MHz
Unit
dB
Note:
Parameter guaranteed by design.
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2011-07-22
Rev.1.0
TC7USB221WBG
10.4. Capacitive Characteristics (Note) (Unless otherwise specified, T
a
= 25
)
25
Characteristics
Input capacitance
(OE, S)
Switch terminal OFF-capacitance
(D+, D-)
Switch terminal OFF-capacitance
(1D+, 1D-, 2D+, 2D-)
Switch terminal ON-capacitance
OE = GND, V
IS
= 0 V
Symbol
C
IN
C
I/O
Note
V
IN
= 0 V
OE = V
CC
, V
IS
= 0 V
Test Condition
V
CC
(V)
3.3
Typ.
4
4
3
7
Unit
pF
Note:
Parameter guaranteed by design.
11. AC Test Circuits and Waveforms
Fig. 11.1 Propagation Delay Time (t
PLH
, t
PHL
)
5
2011-07-22
Rev.1.0
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