QT8004Z-150.000000- datasheet, PDF

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QT8004Z-150.000000-: DescriptionSine Output Oscillator, 150MHz Nom, HERMETIC SEALED, METAL, DDIP-24/8; CategoryPassive components oscillator; File Size554KB，7 Pages; ManufacturerQ-TECH Corporation

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QT8004Z-150.000000- Overview

Sine Output Oscillator, 150MHz Nom, HERMETIC SEALED, METAL, DDIP-24/8

QT8004Z-150.000000- Parametric

Parameter Name	Attribute value
Maker	Q-TECH Corporation
Reach Compliance Code	compliant
Ageing	5 PPM/FIRST YEAR
Frequency Adjustment - Mechanical	NO
frequency stability	10%
JESD-609 code	e4
Manufacturer's serial number	QT80
Installation features	THROUGH HOLE MOUNT
Nominal operating frequency	150 MHz
Maximum operating temperature	85 °C
Minimum operating temperature	-40 °C
Oscillator type	SINE
Output level	0.893 V
physical size	32.51mm x 20.07mm x 7.62mm
Maximum supply voltage	5.25 V
Minimum supply voltage	4.75 V
Nominal supply voltage	5 V
surface mount	NO
Terminal surface	GOLD

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REVISIONS

REVISION

DESCRIPTION

APPROVED

DATE

Initial release

Luis Vargas

5/28/2008

GENERAL RELEASE DOCUMENT

CONSULT FACTORY FOR CURRENT REVISION

50MHz TCXO ,Vcc=12v,+25ºC

9/17/08

-30

-40

-50

-60

-70

-80

L(f), dBc

-90

-100

-110

-120

-130

-140

-150

-160

-170

-180

100

1000

10000

100000

Frequency Offset, HZ

Example 1 of Temperature Stability

2.0

1.5

Example 2 of Temperature Stability

1.0

freq error, PPM

0.5

0.0

-0.5

-1.0

-1.5

-2.0

-50 -45 -40 -35 -30 -25 -20 -15 -10

-5

temp, deg C

UNLESS OTHERWISE

SPECIFIED, DIMENSIONS

ARE IN INCHES.

SPECIFICATION CONTROL DRAWING

DATE

PREPARED BY:

Luis Vargas

6/5/08

Q-TECH CORPORATION

10150 W. JEFFERSON BLVD.

CULVER CITY, CA 90232-3510

LOW PROFILE 24 PIN DDIP HYBRID CRYSTAL

OSCILLATOR, TCXO, CLASS S,

Standard Design For Sine Wave up to 150MHz

DRAWING NO.:

REVISION

TOLERANCES:

3 PLACE DECIMAL = .005

2 PLACE DECIMAL = .02

1 PLACE DECIMAL = .1

FRACTIONS = ± 1/16

ANGLES = 2 DEGREES

CHECKED BY:

QUALITY

DATE

QT800 DDIP Sine-Wave

RELEASED BY:

DOCUMENT CONTROL

APPROVED BY:

ENGINEERING

DATE

SCALE

SIZE

CAGE

CODE

NONE

51774

SHEET 1 OF 7

3.3.1

All piece parts shall be derived from lots that meet the element evaluation requirements of MIL-PRF-

38534, Class K, with the exception of the following exceptions:

Active elements

a) Visual inspection of silicon on sapphire microcircuits. Semicircular crack(s) or multiple adjacent

cracks, not in the active area, starting and terminating at the edge of the die are acceptable.

Attached (chip in place) sapphire is nonconductive material and shall not be considered as foreign

material and will be considered as nonconductive material for all inspection criteria.

b) Subgroup 4, Scanning Electron Microscope (SEM) inspection. The manufacturer may allow the die

distributor, at his option, to select two (2) dice from a waffle pack (containing a maximum quantity

of 100 die), visually inspect for the worst case metallization of the 2 dice, and take SEM photographs

of the worst case.

c) Subgroup 5 radiation tests. Subgroup 5 radiation tests are not required unless otherwise specified

in the detail purchase order.

3.3.2

Processes - Processes used for manufacturing the TCXO are selected on the basis of their ability to

meet the quality requirements for space High Reliability manufacturing. Travelers or Process Cards are

used in the manufacturing and testing of all of the TCXO Series, and might be available for customer

review. Copies of these Travelers can be provided with the TCXOs at time of shipment if so specified

on the purchase order.

Interchangeability - Each TCXO shall be interchangeable without using a special selection process.

Product Marking - Each unit shall be permanently marked with the manufacturer's name or symbol,

part number, lot date code number, and serial number. The unit shall be marked with the outline of an

equilateral triangle near pin 1 to show that it contains devices which are sensitive to electrostatic

discharge.

Parts Program

Devices delivered to this specification represent the standardized Parts, Materials and Processes (PMP)

Program developed, implemented and certified for advanced applications and extended environments.

3.3.3

3.3.4

3.4

3.4.1

Quartz Crystal Resonator - The crystal resonator used shall be constructed using a 4 point mount

premium synthetic swept Quartz and procured to Q-TECH SCD.

(For

the Engineering models, non-

swept quartz may be used).

Traceability Requirements

Material, element and process traceability requirements shall be as specified by MIL-PRF-38534 for

Class K hybrids.

3.5

3.6

Data

3.6.1. Design Documentation - When required by the purchase order, design, topography, process and flow

charts for all assembly/inspection and test operation for devices to be supplied under this specification

on the initial procurement shall be established and shall be available in-plant for review by the procuring

activity upon request. This design documentation shall be sufficient to depict the physical and electrical

construction of the devices supplied under the specification and shall be traceable to the specific parts,

drawings or part type numbers to which it applies, and to the production lot(s) and inspection lot codes

under which devices are manufactured and tested so that revisions can be identified.

SIZE

CAGE NO.

Q-TECH Corporation

10150 W. Jefferson Blvd.

Culver City, CA 90232

QT800 DDIP Sine-Wave

Sheet

of 7

REV.

51774

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