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QT4105CD-125.000MHZ

Description
HCMOS Output Clock Oscillator, 125MHz Nom
CategoryPassive components    oscillator   
File Size347KB,6 Pages
ManufacturerQ-TECH Corporation
Download Datasheet Parametric View All

QT4105CD-125.000MHZ Overview

HCMOS Output Clock Oscillator, 125MHz Nom

QT4105CD-125.000MHZ Parametric

Parameter NameAttribute value
MakerQ-TECH Corporation
Reach Compliance Codecompli
Other featuresBLACK FOAM
Ageing1.5 PPM/15 YEARS
Frequency Adjustment - MechanicalNO
frequency stability0.02%
Frequency Stability - Voltage0.01 ppm
input power2.7 W
JESD-609 codee4
Manufacturer's serial numberQT410
Installation featuresCHASSIS MOUNT
Nominal operating frequency125 MHz
Maximum operating temperature85 °C
Minimum operating temperature-40 °C
Oscillator typeHCMOS
Output load10 KOHM, 15 pF
Oven power supply voltage5V
Maximum supply voltage5.25 V
Minimum supply voltage4.75 V
Nominal supply voltage5 V
surface mountNO
Terminal surfaceGOLD
Preheating power4.8 W
Maximum warm-up time10 Minute

QT4105CD-125.000MHZ Preview

Q-TECH
CORPORATION
LOW PHASE NOISE, SPACE LEVEL OCXO
3.3 to 15Vdc - 1MHz to 125MHz
Description
Q-Tech’s High Stability Oven Controlled Crystal Oscillator
(OCXO) is a high reliability signal generator that provides Sine
wave or HCMOS output. The OCXO is designed to be used in
Aerospace applications.
It is designed to withstand radiation level up to 100kRad (*)
(total dose), high shock and vibration. The OCXO has very low
phase noise. Low G-Sensitivity SC-Cut Crystal utilized in the
design guarantees 1PPB/G or better. The reliable construction
of this design qualifies it for stringent environmental
applications.
(*) Please contact factory for higher level of radiation
hardness.
Features
Ordering Information
Q T 4
1
0
7
• Made in the USA
• ITAR
• DFARS 252-225-7014 Compliant:
Electronic Component Exemption
• USML Registration # M17677
• Supply voltages 3.3Vdc to 15Vdc
• Wide temperature range (-40ºC to +85ºC)
• SC-Cut crystal
• Low phase noise and jitter
• Choice of output power and load
• Radiation Hardened
• Custom design available tailored to meet customer’s needs
• Q-Tech does not use pure lead or pure tin in its products
QT 41 0 7S DM - 5 5. 0 0 0M H z
(Sample part number)
S D M - 55.000MHz
Output Frequency
Screening Option:
Blank = EM
M = Per MIL-PRF-55310, Level S
Supply Voltage:
3 = +3.3V
5 = +5.0V
6 = +12.0V
7 = +15.0V
Logic:
C = HCMOS
S = Sine Wave
G
H
J
D
Applications
For Non-Standard requirements, contact Q-Tech Corporation at
Sales@Q-Tech.com
Frequency vs. Temperature Code:
= ± 100PPB at -20ºC to +70ºC
= ± 10PPB at -20ºC to +70ºC
= ± 200PPB at -40ºC to +85ºC
= ± 20PPB at -40ºC to +85ºC
• Designed to meet today’s requirements for Space Grade
applications
• Control and measurement
• Signal processing
Packaging Options
• Standard packaging in black foam
Other Options Available For An Additional Charge
• P. I. N. D. test (MIL-STD 883, Method 2020)
• Phase Noise test (Static and under vibration)
• Jitter test
ITAR Controlled
Specifications subject to change without prior notice.
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-te ch.c om
QPDS-0008 (Revision B, April 2013 ) ( CO# 10835)
E
1 of 6
Q-TECH
CORPORATION
LOW PHASE NOISE, SPACE LEVEL OCXO
3.3 to 15Vdc - 1MHz to 125MHz
Package Outline -
Dimensions are in inches
CASE IS WELDED TO .060 PLATE
BRAZE BASEPLATE TO CASE AROUND
ENTIRE PERIMETER PRIOR TO PLATING
4X
.125±.003 THRU
VCC
OUT
1.500
1.000
.500
.500
1.000
.060
1.490
1.560
1.550
.275
.135
2.290
2.560
2.555
GND
.250
1.750
Package Information
• Package Material: CRS
• Weight: 165g typ., 175g max.
• Package Finish: Nickel Plating 500 micro Inches
• SMA Connector: Body = Brass (QQ-B-626), Nickel Plated
Contact Pin = BeCu, Gold Plated
Insulators = Teflon, MIL-P-19468
• Power Connetors: Gold Plated per MIL-G-45204C, Class 00
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-te ch.c om
QPDS-0008 (Revision B, April 2013 ) ( CO# 10835)
E
2 of 6
Q-TECH
CORPORATION
LOW PHASE NOISE, SPACE LEVEL OCXO
3.3 to 15Vdc - 1MHz to 125MHz
Electrical Characteristics
Output Frequency Range (Fo)
Supply Voltage (Vdd)
Initial Tolerance
Temperature Range
Frequency Stability vs. Temperature
Frequency Stability vs. V
oltage V
ariation
Frequency Stability vs. Load V
ariation
Warm-up Power max.
Steady State Power max.
Warm-up Time
Output Waveform
Output Power (See note 1)
Output Power Stability (See note 2)
Duty Cycle
Output Load
Harmonics
Spurious (See note 3)
Aging
G-Sensitivity max.
Parameters
Conditions
±5.0%
@+25ºC
Over Temperature Range
±5.0% Load Variation
@-40ºC
@+25ºC
@+25ºC to ±100PPB (2 hours ref.)
Over Temperature Range
Over Temperature Range
Over Temperature Range
Over Temperature Range
Per Day
15 years
1Hz
10Hz
100Hz
1kHz
10kHz
100kHz
1MHz — 125MHz
+3.3Vdc, +5Vdc, +12Vdc and +15Vdc
±0.2ppm
See Option Codes
See Option Codes
±10PPB
±20PPB
4.8W
2.7W
Sine Wave
+3.0±1.0dBm
±1.0dBm
50Ω
-35dBc
-90dBc
10 min.
HCMOS
50%±5.0%
10kΩ//15pF
1PPB
1.5PPM
1PPB/G
-70dBc/Hz
-102dBc/Hz
-132dBc/Hz
-148dBc/Hz
-155dBc/Hz
-155dBc/Hz
Requirements
Phase Noise for 50MHz OCXO (typ.)
Other Design and Test Options
• Phase Noise and Jitter built to specification
including static and vibration.
• Low supply current
• QCI tests
• Tight frequency stability versus temperature,
supply voltage, and load variations
• Low spurious (see note 3)
• Low frequency aging, Allan Variance
• High-shock resistant
Notes:
1. The output level is determined by the supply
voltage, load, and package size.
2. Typical amplitude stability over temperature is
±10% or less.
3. Typical spurious level is better than -100dBc over
the spectrum of 100kHz to 1GHz.
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-te ch.c om
QPDS-0008 (Revision B, April 2013 ) ( CO# 10835)
E
3 of 6
Q-TECH
CORPORATION
LOW PHASE NOISE, SPACE LEVEL OCXO
3.3 to 15Vdc - 1MHz to 125MHz
Environmental Specifications
Q-Tech Standard Screening similar to (MIL-PRF-55310) is available. Q-Tech can also customize screening and test procedures to meet
your specific requirements. The packages are designed and processed to exceed the following test conditions:
Environmental Test
Initial Accuracy at Reference Temperature
Frequency Warm-up
Initial Frequency-Temperature Accuracy
Frequency-Voltage Tolerance
Frequency-Load Tolerance
Phase Noise Steady-State
Phase Noise Random Vibration
Output Power (Sinusoidal Waveform)
Output Logic Voltage Levels (Square wave )
Rise Time and Fall Time (Square wave )
Duty Cycle (Square wave )
Harmonic and Sub-harmonic Distortion
Spurious Response
Oven Input Current-Power
Temperature Cycling
Constant Acceleration
Seal Fine Leak
Burn-in
Aging
Random Vibration
Shock, Non Operating
Thermal Shock, Non Operating
Ambient Pressure
Resistance to Solder Heat
Terminal Strength
Resistance to Solvents
Solderability
ESD Classification
Non-destructive Bond Pull
Test Conditions
MIL-PRF-55310, Type 4, Class 3
MIL-PRF-55310, Type 4, Class 3
MIL-PRF-55310 (4.8.10.1)
MIL-PRF-55310
MIL-PRF-55310
MIL-PRF-55310
MIL-PRF-55310
MIL-PRF-55310
MIL-PRF-55310
MIL-PRF-55310
MIL-PRF-55310
MIL-PRF-55310
MIL-PRF-55310
MIL-PRF-55310, Type 4, Class 3
MIL-STD-883, Method 1010, Cond. B
MIL-STD-883, Method 2001, Cond. A, Y1
MIL-STD-883, Method 1014, Cond. A & C
240 hours, At highest operating temperature with load
30 days, MIL-PRF-55310, Type 4, Class 3
MIL-STD-883, Method 2026
MIL-STD-883, Method 2002
MIL-STD-202, Method 107, Cond. B
MIL-STD-202, 105, Cond. G, 5 minutes dwell time minimum
MIL-STD-202, Method 210, Cond. C
MIL-STD-202, Method 211, Cond. C
MIL-STD-202, Method 215
MIL-STD-202, Method 208
MIL-STD-883, Method 3015, Class 1HBM 0 to 1,999V
MIL-STD-883, Method 2023
Please contact Q-Tech for higher shock requirements
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-te ch.c om
QPDS-0008 (Revision B, April 2013 ) ( CO# 10835)
E
4 of 6
Q-TECH
CORPORATION
LOW PHASE NOISE, SPACE LEVEL OCXO
3.3 to 15Vdc - 1MHz to 125MHz
Design and Construction
The design and construction of the crystal oscillator shall be as specified herein. As a minimum, the oscillators shall meet the design and
construction requirements of MIL-PRF-55310.
Element De-rating
All active and passive elements shall be derated in accordance with the applicable hybrid microcircuit element requirements of
MIL-STD-975. Elements shall not operate in excess of de-rated values.
Worst Case Circuit Analysis
Worst case analysis shall be based on:
a. Maximum rated value
b. The worst case design value
c. Derating factor for each element
d. Temperature variation
e. Radiation
MTBF
Mean Time between Failure analysis shall be done based on MIL-HDBK-217
Element Evaluation
All piece parts shall be derived from lots that meet the element evaluation requirements of MIL-PRF-38534, Class K except for
the following exceptions:
Active Elements
a) Visual inspection of silicon on sapphire microcircuits. Semicircular crack(s) or multiple adjacent cracks, not in the active
area, starting and terminating at the edge of the die are acceptable. Attached (chip in place) sapphire is nonconductive
material and shall not be considered as foreign material and will be considered as nonconductive material for all
inspection criteria.
b) Subgroup 4, Scanning Electron Microscope (SEM) inspection. The manufacturer may allow the die distributor, at his
option, select two (2) dice from a waffle pack (containing a maximum quantity of 100 die), visually inspect for the worst
case metallization of the 2 dice, and take SEM photographs of the worst case.
c) Subgroup 5 radiation tests. Subgroup 5 radiation tests are not required unless otherwise specified in the detail
specification.
Package Elements
a) Salt spray. Salt spray testing is not required.
Quartz Crystal Material
Unless otherwise specified by the detail specification, the quartz Crystal material shall be swept synthetic, grade 2.2 or better.
Crystal Mounting
The crystal element shall be four-point mounted in such a manner as to assure adequate crystal performance when the oscillator
is subjected to the environmental conditions specified herein.
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-te ch.c om
QPDS-0008 (Revision B, April 2013 ) ( CO# 10835)
E
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