The documentation and process conversion
measures necessary to comply with this
revision shall be completed by 8 October 1997
INCH-POUND
MIL-PRF-19500/500C
8 July 1997
SUPERSEDING
MIL-S-19500/500B
19 January 1993
PERFORMANCE SPECIFICATION
SEMICONDUCTOR DEVICE, DIODE, SILICON, TRANSIENT VOLTAGE SUPPRESSOR
UNIPOLAR TYPES 1N5555 THROUGH 1N5558, 1N5907, 1N5629A THROUGH 1N5665A
JAN, JANTX, JANTXV, AND JANS
This specification is approved for use by all Depart-
ments and Agencies of the Department of Defense.
1. SCOPE
1.1 Scope. This specification covers the performance requirements for 1500 watt, peak, pulse power, silicon, transient, voltage
suppressor diodes. Four levels of product assurance are provided for each device as specified in MIL-PRF-19500.
1.2 Physical dimensions. See figure 1.
1.3 Maximum ratings. Maximum ratings are as shown in columns 5 through 8 of table III herein, and as follows:
P
PP
= 1500 W (see figure 3) at t
p
= 1.0 ms.
P
M(AV)
= 1.0 W (derate at 6.67 mW/°C above T
A
= +25°C) (see 6.3).
I
FSM
= 200 A (pk) at t
p
= 8.3 ms (T
A
= +25°C).
-55°C
≤
T
J
≤
+175°C (ambient), -55°C
≤
T
STG
≤
+175°C (ambient).
1.4 Primary electrical characteristics at T
A
= +25°. Primary electrical characteristics are shown in columns 2 and 4 of table III herein.
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3 and 4 of this specification. This section does not include
documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has
been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements
documents cited in sections 3 and 4 of this specification, whether or not they are listed.
Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving this document
should be addressed to: Commander, Defense Supply Center Columbus, ATTN: DSCC-VAT, 3990 East Broad Street, Columbus, OH
43216-5000, by using the Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this document or
by letter.
AMSC N/A
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
FSC 5961
MIL-PRF-19500/500C
2.1.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document
to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department
of Defense Index of Specifications and Standards (DODISS) and supplement thereto, cited in the solicitation (see 6.2).
SPECIFICATION
MILITARY
MIL-PRF-19500 - Semiconductor Devices, General Specification for.
STANDARDS
MILITARY
MIL-STD-750 - Test Methods for Semiconductor Devices.
(Unless otherwise indicated, copies of federal and military specifications, standards, and handbooks are available from the
Standardization Documents Order Desk, Building 4D, 700 Robbins Avenue, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this specification and the references cited herein, the text of this
document shall take precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific
exemption has been obtained.
3. REQUIREMENTS
3.1 Qualification. Devices furnished under this specification shall be products that are authorized by the qualifying activity for listing
on the applicable qualified products list before contract award (see 4.2 and 6.3).
3.2 Associated detail specification. The individual item requirements shall be in accordance with MIL-PRF-19500 and as specified
herein.
3.3 Abbreviations, symbols, and definitions. Abbreviations, symbols, and definitions used herein shall be as specified in
MIL-PRF-19500 and as follows:
V
C
- - - - - - - - - - - - Clamping voltage. The maximum peak voltage appearing across the device when subjected to the peak
pulse current I
PP
.
I
PP
- - - - - - - - - - - - -Peak pulse current at a specified condition.
I
(BR)
- - - - - - - - - - - -Reverse breakdown current at a specified condition.
P
PP
- - - - - - - - - - - - Repetitive peak pulse power.
αV
(BR)
- - - - - - - - - Temperature coefficient of V
(BR)
.
3.4 Design, construction, and physical dimensions. The design, construction, and physical dimensions for the purpose of
interchangeability shall be as specified on figure 1 herein.
3.4.1 Metallurgical bond construction. Metallurgically bonded construction is required. The bonding metal shall have flow points
above 260°C.
3.4.2 Lead finish. Lead finish shall be solderable in accordance with MIL-STD-750 and MIL-PRF-19500. Where a choice of lead
finish is desired, it shall be specified in the acquisition document (see 6.2).
3.5 Marking. Marking shall be in accordance with MIL-PRF-19500.
2
MIL-PRF-19500/500C
Dimensions
Symbol
Min
BD
BL
BLT
CD
LD
LL
LU
.215
.293
---
.045
.025
1.000
---
Inches
Max
.235
.357
.570
.100
.035
1.625
.188
Millimeters
Min
5.46
7.44
---
1.14
0.64
25.40
---
Max
5.97
9.07
14.48
2.54
0.89
41.28
4.78
4
2
5
1
3
Notes
NOTES:
1. Dimensions are in inches.
2. Metric equivalents are given for general information only.
3. The major diameter is essentially constant along its length.
4. Within this zone, diameter may vary to allow for lead finishes and irregularities.
5. Dimension to allow for pinch or seal deformation anywhere along tubulation.
6. Cathode lead shall be electrically connected to the case. If tubulation is used, it shall be on the anode end.
7. Symbol for internal construction of unipolar transient suppressor.
FIGURE 1. Physical dimensions, type 1N5555 through 1N5558, 1N5907, 1N5629A through 1N5665A (DO-13).
3
MIL-PRF-19500/500C
4. QUALITY ASSURANCE PROVISIONS
4.1 Classification of Inspection. The inspection requirements specified herein are classified as follows:
a. Qualification inspection (see 4.2).
b. Screening (see 4.3).
c. Conformance inspection (see 4.3)
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500.
4.3 Screening (JANS, JANTX, AND JANTXV levels only). Screening shall be in accordance with MIL-PRF-19500, (Appendix E, table
IV) and as specified herein. The following measurements shall be made in accordance with table I herein. Devices that exceed the limits
of table I herein shall not be acceptable.
Screen (see
appendix E,
table II of
MIL-PRF-19500)
3
9
10
11
12
13
Measurement
JANS level
T
(high)
= +175°C
Not applicable
Not applicable
Not applicable
See 4.5.1
Interim electrical, delta, and
group A, subgroup 2 and 3 electrical
parameters not applicable for this
screen (performed in screen 12).
Subgroup 3 of table I herein.
JANTX and JANTXV levels
T
(high)
= +175°C
Not applicable
Not applicable
Not applicable
See 4.5.1
Interim electrical, delta, and group A,
subgroup 2 and 3 electrical parameters not
applicable for this screen (performed
in screen 12).
4.4 Conformance inspection. Quality conformance inspection shall be in accordance with MIL-PRF-19500.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500, appendix E, table V, and table
I herein. End-point electrical measurements shall be in accordance with the applicable steps of table II herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for subgroup testing in
appendix E, table VIa (JANS) and table VIb (JAN, JANTX, and JANTXV) of MIL-PRF-19500. Electrical measurements (end-points) and
delta requirements shall be in accordance with the applicable steps of table II herein.
4.4.2.1 Group B inspection, table VIa (JANS) of MIL-PRF-19500.
Subgroup
B3
B5
Method
4066
1027
Conditions
Condition for surge, 1 cycle, see 4.5.3b.
Condition for accelerated steady-state operation life are as follows: See 4.5.2,
T
A
= +100°C (min); T
J
= +225°C (min); t = 168 hours minimum.
Not applicable.
B4 and 6
4
MIL-PRF-19500/500C
4.4.2.2 Group B inspection, table VIb (JAN, JANTX and JANTXV) of MIL-PRF-19500.
Subgroup
B2
B3
B5
Method
4066
1027
Conditions
1 cycle, see 4.5.3b.
See 4.5.1, 1 ms pulse only (see 4.5.3b).
Not applicable.
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for subgroup testing in
appendix E, table VII of MIL-PRF-19500. Electrical measurements (end-points) and delta requirements shall be in accordance with the
applicable steps of table II herein.
4.4.3.1 Group C inspection, table VII of MIL-PRF-19500.
Subgroup
C2
Method
2036
Conditions
Lead tension: Test condition A; weight = 5 pounds; t = 15 ±3 s. Lead fatigue:
Test condition E; weight = 8 ounces.
See 4.5.1, 1 ms pulse only (see 4.5.3b).
Condition for temperature coefficient of breakdown voltage are as follows:
I
(BR)
= column 3 of table III, T
1
= +25°C ±3°C, T
2
= T
1
+100°C.
Condition for maximum peak pulse current are as follow: See 4.5.3a,
(20
µs
pulse only) 10 pulses.
C6
C7
1026
C8
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables as follows.
4.5.1 Power burn-in (HTRB) and steady-state operation life test conditions. The test conditions and order of events shall be as
follows:
a.
b.
c.
d.
Read and record I
D
and V
(BR)
at T
A
= +25°C.
Pulse in accordance with 4.5.3b, 20 times (screening and Group B) and 100 times (group C) at T
A
= +25°C.
Read I
D
at T
A
= +25°C, remove defective devices and record the number of failures.
Apply the working peak reverse voltage (V
WM
) (column 4 of table III) at an ambient temperature of +125°C as
follows:
(1) 96 hours (JANTX and JANTXV) and 240 hours (JANS) for the screening test.
(2) 340 hours (JAN, JANTX, and JANTXV) for group B steady-state operation life test.
(3) 1,000 hours for group C steady-state operation life test.
e.
Read and record I
R
and V
(BR)
at T
A
= +25°C. Devices with
∆I
R
> 50 percent (100 percent for steady-state operation life)
of the initial reading or 1
µA
dc, whichever is greater, or
∆V
(BR)
> ±2 percent (±5 percent for steady-state operation life)
initial value shall be considered defective. Remove defective devices and record the number of failures. (For steady-
state operation life, I
R
maximum limit shall be two times the group A limit).
5
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