SPECIFICATION
•
Supplier : Samsung electro-mechanics
•
Product : Multi-layer Ceramic Capacitor
A. Samsung Part Number
CL
①
①
Series
②
Size
③
Dielectric
④
Capacitance
⑤
Capacitance
tolerance
⑥
Rated Voltage
⑦
Thickness
21
②
C
③
181
④
F
⑤
B
⑥
A
⑦
N
⑧
N
⑨
N
⑩
C
⑪
•
Part Number :
•
Description :
CL21C181FBANNNC
CAP, 180㎊, 50V, ±1%, C0G, 0805
Samsung Multi-layer Ceramic Capacitor
0805 (inch code)
L: 2.0 ± 0.1
C0G
180
㎊
±1
%
50 V
0.65 ± 0.1
mm
W:
1.25 ± 0.1 mm
Ni
Cu
Sn 100%
Normal
Reserved for future use
Cardboard Type, 7" reel
⑧
Inner electrode
Termination
Plating
⑨
Product
mm
⑩
Special
⑪
Packaging
(Pb Free)
B. Samsung Reliablility Test and Judgement condition
Capacitance
Q
Insulation
Resistance
Appearance
Withstanding
Voltage
Temperature
Characterisitcs
Adhesive Strength
of Termination
Bending Strength
Solderability
Performance
Within specified tolerance
1000 min
10,000Mohm or 500Mohm⋅㎌
Whichever is Smaller
No abnormal exterior appearance
No dielectric breakdown or
mechanical breakdown
C0G
(From -55℃ to 125℃, Capacitance change shoud be within ±30PPM/℃)
No peeling shall be occur on the
500g⋅F, for 10±1 sec.
terminal electrode
Capacitance change :
Bending to the limit (1mm)
with 1.0mm/sec.
within ±5% or ±0.5㎊ whichever is larger
More than 95% of terminal surface
1) Sn63Pb37 solder
is to be soldered newly
235±5℃, 5±0.5sec.
2) SnAg3.0Cu0.5 solder
245±5℃, 3±0.3sec.
(preheating : 80~120℃ for 10~30sec.)
Resistance to
Soldering heat
Capacitance change :
within ±2.5% or ±0.25㎊ whichever is larger
Tan
δ,
IR : initial spec.
Solder pot : 270±5℃, 10±1sec.
1㎒±10%
Rated Voltage
Test condition
0.5~5Vrms
60~120 sec.
Microscope (×10)
300% of the rated voltage
Vibration Test
Humidity
Performance
Capacitance change :
within ±2.5% or ±0.25㎊ whichever is larger
Tan
δ,
IR : initial spec.
Capacitance change :
within ±5% or ±0.5㎊ whichever is larger
Q:
350 min
IR :
1000Mohm or 50Mohm
⋅
㎌
Whichever is Smaller
Test condition
Amplitude : 1.5mm
From 10Hz to 55Hz (return : 1min.)
2hours
×
3 direction (x, y, z)
40±2℃, 90~95%RH, 500+12/-0hrs
Moisture
Resistance
Capacitance change :
With rated voltage
High Temperature
Resistance
within ±7.5% or ±0.75㎊ whichever is larger 40±2℃, 90~95%RH, 500+12/-0hrs
Q:
200 min
IR :
500Mohm or 25Mohm
⋅
㎌
Whichever is Smaller
Capacitance change :
With 200% of the rated voltage
within ±3% or ±0.3㎊ whichever is larger
Q:
350 min
IR :
1000Mohm or 50Mohm
⋅
㎌
Whichever is Smaller
Capacitance change :
Max. operating temperature
1000+48/-0hrs
Temperature
Cycling
1 cycle condition
25℃
within ±2.5% or ±0.25㎊ whichever is larger Min. operating temperatur
→
Tan
δ,
IR : initial spec.
→
Max. operating temperature
→
25℃
5 cycle test
C. Recommended Soldering method :
Reflow ( Reflow Peak Temperature : 250±5℃, 6sec. Max )
* For the more detail Specification, Please refer to the Samsung MLCC catalogue.
stm32/stm8
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