The UT54ACTS00E is a quadruple, two-input NAND gate.
The circuit performs the Boolean functions Y = AB or Y = A
+ B in positive logic.
The device is characterized over full military temperature range
of -55C to +125C.
FUNCTION TABLE
INPUTS
A
H
L
X
B
H
X
L
OUTPUT
Y
L
H
H
LOGIC DIAGRAM
A1
B1
A2
B2
A3
B3
A4
B4
Y4
Y3
Y1
Y2
LOGIC SYMBOL
(1)
(2)
(4)
(5)
(9)
(10)
(12)
(13)
(11)
(6)
(8)
Y2
Y3
Y4
A1
B1
A2
B2
A3
B3
A4
B4
&
(3)
Y1
Note:
1. Logic symbol in accordance with ANSI/IEEE standard 91-1984 and IEC
Publication 617-12.
1
OPERATIONAL ENVIRONMENT
1
PARAMETER
Total Dose
SEU Threshold
2
SEL Threshold
Neutron Fluence
LIMIT
1.0E6
108
120
1.0E14
UNITS
rads(Si)
MeV-cm
2
/mg
MeV-cm
2
/mg
n/cm
2
Notes:
1. Logic will not latchup during radiation exposure within the limits defined in the table.
2. Device storage elements are immune to SEU affects.
ABSOLUTE MAXIMUM RATINGS
SYMBOL
V
DD
V
I/O
T
STG
T
J
T
LS
JC
I
I
P
D2
PARAMETER
Supply voltage
Voltage any pin
Storage Temperature range
Maximum junction temperature
Lead temperature (soldering 5 seconds)
Thermal resistance junction to case
DC input current
Maximum power dissipation permitted @ Tc=125
o
C
LIMIT
-0.3 to 7.0
-.3 to V
DD
+.3
-65 to +150
+175
+300
15.5
10
3.2
UNITS
V
V
C
C
C
C/W
mA
W
Note:
1.Stresses outside the listed absolute maximum ratings may cause permanent damage to the device. This is a stress rating only, functional operation of the device at
these or any other conditions beyond limits indicated in the operational sections is not recommended. Exposure to absolute maximum rating conditions for extended
periods may affect device reliability.
2. Per MIL-STD-883, method 1012.1, Section 3.4.1, P
D
= (T
j(max)
- T
c(max)
) /
jc
RECOMMENDED OPERATING CONDITIONS
SYMBOL
V
DD
V
IN
T
C
PARAMETER
Supply voltage
Input voltage any pin
Temperature range
LIMIT
3.0 to 5.5
0 to V
DD
-55 to + 125
UNITS
V
V
C
2
DC ELECTRICAL CHARACTERISTICS
(Pre and Post-Radiation)*
(V
DD
= 5.0V
10%; V
SS
= 0V
6
, -55C < T
C
< +125C)
;
Unless otherwise noted, Tc is per the temperature range ordered
SYMBOL
V
IL1
V
IL2
V
IH1
V
IH2
I
IN
V
OL1
DESCRIPTION
Low-level input voltage
1
Low-level input voltage
1
High-level input voltage
1
High-level input voltage
1
Input leakage current
Low-level output voltage
3
CONDITION
V
DD
from 4.5V to 5.5V
V
DD
from 3.0V to 3.6V
V
DD
from 4.5V to 5.5V
V
DD
from 3.0V to 3.6V
V
IN
= V
DD
or V
SS
I
OL
= 8mA
V
DD
= 4.5V to 5.5V
V
OL2
Low-level output voltage
3
I
OL
= 6mA
V
DD
= 3.0V to 3.6V
V
OH1
High-level output voltage
3
I
OH
= -8mA
V
DD
from 4.5V to 5.5V
V
OH2
High-level output voltage
3
I
OH
= -6mA
V
DD
from 3.0V to 3.6V
I
OS1
Short-circuit output current
2 ,4
V
O
= V
DD
and V
SS
V
DD
from 4.5V to 5.5V
I
OS2
Short-circuit output current
2 ,4
V
O
= V
DD
and V
SS
V
DD
from 3.0V to 3.6V
I
OL1
Low level output current
8
V
IN
= V
DD
or V
SS
V
OL
= 0.4V
V
DD
from 4.5V to 5.5V
I
OL2
Low level output current
8
V
IN
= V
DD
or V
SS
V
OL
= 0.4V
V
DD
from 3.0V to 3.6V
I
OH1
High level output current
8
V
IN
= V
DD
or V
SS
V
OH
= V
DD
-0.4V
V
DD
from 4.5V to 5.5V
I
OH2
High level output current
8
V
IN
= V
DD
or V
SS
V
OH
= V
DD
-0.4V
V
DD
from 3.0V to 3.6V
P
total1
Power dissipation
2, 7
C
L
= 50pF
V
DD
= 4.5V to 5.5V
3
MIN
MAX
0.8
0.8
UNIT
V
V
V
V
0.5 V
DD
2.0
-1
1
0.4
A
V
0.4
V
0.7 V
DD
V
2.4
V
-200
200
mA
-100
100
mA
8
mA
6
mA
-8
mA
-6
mA
1
mW/
MHz
P
total2
Power dissipation
2, 7
C
L
= 50pF
V
DD
= 3.0V to 3.6V
0.5
mW/
MHz
A
I
DDQ
I
DDQ
Quiescent Supply Current
V
IN
= V
DD
or V
SS
V
DD
from 3.6V to 5.5V
10
Quiescent Supply Current Delta
For input under test
V
IN
= V
DD
- 2.1V
For all other inputs
V
IN
= V
DD
or V
SS
V
DD
= 5.5V
= 1MHz
V
DD
= 0V
= 1MHz
V
DD
= 0V
1.6
mA
C
IN
Input capacitance
5
Output capacitance
5
15
pF
C
OUT
15
pF
Notes:
* For devices procured with a total ionizing dose tolerance guarantee, the post-irradiation performance is guaranteed at 25
o
C per MIL-STD-883 Method 1019, Condition
A up to the maximum TID level procured.
1. Functional tests are conducted in accordance with MIL-STD-883 with the following input test conditions: V
IH
= V
IH
(min) + 20%, - 0%; V
IL
= V
IL
(max) + 0%, -
50%, as specified herein, for TTL, CMOS, or Schmitt compatible inputs. Devices may be tested using any input voltage within the above specified range, but are
guaranteed to V
IH
(min) and V
IL
(max).
2. Supplied as a design limit but not guaranteed or tested.
3. Per MIL-PRF-38535, for current density
5.0E5
amps/cm
2
, the maximum product of load capacitance (per output buffer) times frequency should not exceed 3,765pF/
MHz.
4. Not more than one output may be shorted at a time for maximum duration of one second.
5. Capacitance measured for initial qualification and when design changes may affect the value. Capacitance is measured between the designated terminal and V
SS
at
frequency of 1MHz and a signal amplitude of 50mV rms maximum.
6. Maximum allowable relative shift equals 50mV.
7. Power dissipation specified per switching output.
8. Parameter guaranteed by design and characterization, but is not tested.
AC ELECTRICAL CHARACTERISTICS
(Pre and Post-Radiation)*
(V
DD
= 3.0V to 5.5V; V
SS
= 0V
1
, -55C < T
C
< +125C); Unless otherwise noted, Tc is per the temperature range ordered
SYMBOL
t
PLH
PARAMETER
Input to Yn
CONDITION
C
L
= 50pF
V
DD
3.0V to 3.6V
4.5V to 5.5V
t
PHL
Input to Yn
C
L
= 50pF
3.0V to 3.6V
4.5V to 5.5V
MINIMUM
2
1
2
1
MAXIMUM
12
6
11
7
ns
UNIT
ns
Notes:
* For devices procured with a total ionizing dose tolerance guarantee, the post-irradiation performance is guaranteed at 25×C per MIL-STD-883 Method 1019, Condition
A up to the maximum TID level procured.
1. Maximum allowable relative shift equals 50mV.
4
Packaging
1. All exposed metallized areas are gold plated over
[size=6]Bit[/size]: Bit comes from the English word bit, which is transliterated as "bit" and represents a binary bit. Bit is the smallest unit of data storage in a computer. In digital circuits and c...
I want to use msp430f149+mlx90614 to make a temperature measuring device for my graduation project, but I don't know why I can't get the ack of mlx90614 after testing it on the experimental board for ...
It really fits the old saying that time goes faster as you get older. In elementary school, time passed by days, in middle school, in school, in semesters, and now that I’m working, time passes by yea...
I searched for tornado and it seems there is a codetest, but I can't find it in tornado. Do I need to download the installation package there? I also didn't find the right tool under workbench? I'm so...
After ARM launched the Cortex-M0+ core, its 32-bit MCU cores increased to 4. Not long ago, NXP also announced that it had obtained the Cortex-M0+ processor license, becoming the only semiconductor man...
First, here is a pictureThis is a linear voltage-regulated power supply with adjustable output voltage and adjustable current limit. The specific performance has not been tested....
A ventilator is an instrument that can replace or assist a person's respiratory function. It is suitable for artificial respiration of patients with respiratory failure or even respiratory arrest. I...[Details]
introduction
Oxygen is an important substance for human metabolism. Brain tissue has a high metabolic rate and consumes about 20% of the total oxygen in the body. In the clinical rescue and ...[Details]
Digital-to-analog converters (ADCs) provide the critical conversion of analog signals to digital signals in many systems. They perform amplitude quantization of an analog input signal to a binary fini...[Details]
At present, the global medical electronics industry is gradually showing attractive development prospects, and the speed of product replacement is constantly increasing. At the same time, due to the p...[Details]
Implantable Cardivoerter Defibrillators (ICDs) have been in common use for several years. ICDs apply a high voltage pulse between two electrodes connected to the heart, which detects cardiac fibrillat...[Details]
To ensure the success of China's TD-SCDMA network commercialization, operators and equipment suppliers need to conduct a large number of tests on networked equipment, among which RF testing is...[Details]
Lithium-ion batteries have a high energy-to-weight and energy-to-volume ratio, no memory effect, can be recharged many times, have a long service life, and are becoming increasingly cheaper. A good...[Details]
Wireless personal area networks (or WPANs) are particularly useful for sensing, monitoring, and control applications. Cost-effective WPANs have the unique potential to implement wireless connectivi...[Details]
MOSFETs are widely used as power switching elements in regulators and motor controllers. They are available as discrete devices or integrated into ICs in various H-bridge configurations.
A hig...[Details]
In the issue of ensuring the safety of drivers and pedestrians, the proportion of electronic technology has increased. According to the survey, 80% to 90% of traffic accidents are caused by driver...[Details]
1 Introduction
Reliability research originated from weapon systems. After nearly half a century of development, it has become an engineering discipline that covers all disciplines and industri...[Details]
introduction
Every friend who has been in contact with PC since the 286 era must have deeply experienced the convenience brought to our lives and work by the leaps and bounds of comput...[Details]
Introduction: Generally speaking, the power supplies used to drive today's high-resolution analog/digital converters have AC or DC loads of hundreds of ohms or more. Therefore, an operational ampli...[Details]
Abstract:
QT1101 is a QTouch charge transfer (QT) device, a complete digital controller that can detect signals when approaching or touching up to 10 independent keys. It can be widely used i...[Details]
AD8205 is a single-power high-performance differential amplifier launched by Analog Devices, Inc., USA. The typical single-power supply voltage is 5V, and its common-mode voltage input r...[Details]
Microcontroller MCU
京公网安备 11010802033920号
EEWORLD
