The UT54ACS74 and the UT54ACTS74 contain two indepen-
dent D-type positive triggered flip-flops. A low level at the
Preset or Clear inputs sets or resets the outputs regardless of the
levels of the other inputs. When Preset and Clear are inactive
(high), data at the D input meeting the setup time requirement
is transferred to the outputs on the positive-going edge of the
clock pulse. Following the hold time interval, data at the D
input may be changed without affecting the levels at the outputs.
The devices are characterized over full military temperature
range of -55°C to +125°C.
FUNCTION TABLE
INPUTS
PRE
L
H
L
H
H
H
CLR
H
L
L
H
H
H
CLK
X
X
X
↑
↑
L
D
X
X
X
H
L
X
OUTPUT
Q
H
L
H
1
PINOUTS
14-Pin DIP
Top View
CLR1
D1
CLK1
PRE1
Q1
Q1
V
SS
1
2
3
4
5
6
7
14
13
12
11
10
9
8
V
DD
CLR2
D2
CLK2
PRE2
Q2
Q2
14-Lead Flatpack
Top View
CLR1
D1
CLK1
PRE1
Q1
Q1
V
SS
1
2
3
4
5
6
7
14
13
12
11
10
9
8
V
DD
CLR2
D2
CLK2
PRE2
Q2
Q2
LOGIC SYMBOL
PRE1
CLK1
D1
CLR1
PRE2
CLK2
D2
CLR2
(4)
(3)
(2)
(1)
(10)
(11)
(12)
(13)
(9)
(8)
Q2
Q2
S
C1
D1
R
(5)
(6)
Q1
Q1
Q
L
H
H
L
H
Q
o
1
H
L
Q
o
Note:
1. The output levels in this configuration are not guaranteed to meet the minimum
levels for V
OH
if the lows at preset and clear are near V
IL
maximum. In
addition, this configuration is nonstable; that is, it will not persist when either
preset or clear returns to its inactive (high) level.
Note:
1. Logic symbol in accordance with ANSI/IEEE standard 91-1984 and IEC
Publication 617-12.
1
LOGIC DIAGRAM
PRE
CLR
Q
CLK
Q
D
2
OPERATIONAL ENVIRONMENT
1
PARAMETER
Total Dose
SEU Threshold
2
SEL Threshold
Neutron Fluence
LIMIT
1.0E6
80
120
1.0E14
UNITS
rads(Si)
MeV-cm
2
/mg
MeV-cm
2
/mg
n/cm
2
Notes:
1. Logic will not latchup during radiation exposure within the limits defined in the table.
2. Device storage elements are immune to SEU affects.
ABSOLUTE MAXIMUM RATINGS
SYMBOL
V
DD
V
I/O
T
STG
T
J
T
LS
Θ
JC
I
I
P
D
PARAMETER
Supply voltage
Voltage any pin
Storage Temperature range
Maximum junction temperature
Lead temperature (soldering 5 seconds)
Thermal resistance junction to case
DC input current
Maximum power dissipation
LIMIT
-0.3 to 7.0
-.3 to V
DD
+.3
-65 to +150
+175
+300
20
±10
1
UNITS
V
V
°C
°C
°C
°C/W
mA
W
Note:
1. Stresses outside the listed absolute maximum ratings may cause permanent damage to the device. This is a stress rating only, functional operation of the device at
these or any other conditions beyond limits indicated in the operational sections is not recommended. Exposure to absolute maximum rating conditions for extended
periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS
SYMBOL
V
DD
V
IN
T
C
PARAMETER
Supply voltage
Input voltage any pin
Temperature range
LIMIT
4.5 to 5.5
0 to V
DD
-55 to + 125
UNITS
V
V
°C
3
DC ELECTRICAL CHARACTERISTICS
7
(V
DD
= 5.0V
±
10%; V
SS
= 0V
6
, -55°C < T
C
< +125°C); Unless otherwise noted, Tc is per the temperature range ordered.
SYMBOL
V
IL
PARAMETER
Low-level input voltage
1
ACTS
ACS
High-level input voltage
1
ACTS
ACS
Input leakage current
ACTS/ACS
Low-level output voltage
3
ACTS
ACS
High-level output voltage
3
ACTS
ACS
Short-circuit output current
2 ,4
ACTS/ACS
Output current
10
(Sink)
I
OH
Output current
10
(Source)
P
total
I
DDQ
ΔI
DDQ
Power dissipation
2, 8, 9
Quiescent Supply Current
Quiescent Supply Current Delta
ACTS
V
IN
= V
DD
or V
SS
I
OL
= 8.0mA
I
OL
= 100μA
I
OH
= -8.0mA
I
OH
= -100μA
V
O
= V
DD
and V
SS
V
IN
= V
DD
or V
SS
V
OL
= 0.4V
V
IN
= V
DD
or V
SS
V
OH
= V
DD
- 0.4V
C
L
= 50pF
V
DD
= 5.5V
For input under test
V
IN
= V
DD
- 2.1V
For all other inputs
V
IN
= V
DD
or V
SS
V
DD
= 5.5V
C
IN
C
OUT
Input capacitance
5
Output capacitance
5
ƒ
= 1MHz @ 0V
ƒ
= 1MHz @ 0V
15
15
pF
pF
1.9
10
1.6
mW/
MHz
μA
mA
-8
mA
.7V
DD
V
DD
- 0.25
-200
8
200
.5V
DD
.7V
DD
-1
1
CONDITION
MIN
MAX
0.8
.3V
DD
UNIT
V
V
IH
V
I
IN
V
OL
μA
0.40
0.25
V
V
OH
V
I
OS
I
OL
mA
mA
4
Notes:
1. Functional tests are conducted in accordance with MIL-STD-883 with the following input test conditions: V
IH
= V
IH
(min) + 20%, - 0%; V
IL
= V
IL
(max) + 0%, -
50%, as specified herein, for TTL, CMOS, or Schmitt compatible inputs. Devices may be tested using any input voltage within the above specified range, but are
guaranteed to V
IH
(min) and V
IL
(max).
2. Supplied as a design limit but not guaranteed or tested.
3. Per MIL-PRF-38535, for current density
≤
5.0E5 amps/cm
2
, the maximum product of load capacitance (per output buffer) times frequency should not exceed 3,765
pF/MHz.
4. Not more than one output may be shorted at a time for maximum duration of one second.
5. Capacitance measured for initial qualification and when design changes may affect the value. Capacitance is measured between the designated terminal and V
SS
at
a frequency of 1MHz and a signal amplitude of 50mV rms maximum.
6. Maximum allowable relative shift equals 50mV.
7. All specifications valid for radiation dose
≤
1E6 rads(Si).
8. Power does not include power contribution of any TTL output sink current.
9. Power dissipation specified per switching output.
10. This value is guaranteed based on characterization data, but not tested.
Product design comes from demand, which either comes from customers or from market research. These two sources also determine the design concept of the product, either the product leads the industry a...
Why is the anti-interference ability of field effect tube stronger than that of transistor? Is it because of the large input resistance or some other structural characteristics?...
[i=s]This post was last edited by lb8820265 on 2020-9-13 20:07[/i]Raspberry Pi 4 supports camera, the interface is called SCI (Camera Serial Interface). Raspberry Pi has camera accessories, using Sony...
I defined ZTOOL_P1 and ZAPP_P2 in the compilation options. By default, serial port 0 uses DMA mode and serial port 1 uses interrupt mode. But I found that two functions were not implemented at all. I ...
I participated in the forum's grabbing event a while ago, [url=https://bbs.eeworld.com.cn/thread-440397-1-1.html]ZRtech Embedded and EEWORLD are giving out benefits! [/url] I was lucky enough to grab ...
The function I implemented with microblaze in EDK is good, and it is also correct when downloaded to the board. However, after using EDK as a submodule of ISE, it does not respond. That is to say, whe...
If the ultimate form of a car is a silicon-based life form, then in
the field of
intelligent driving
, it has gradually taken on the appearance of a "veteran driver." In
the field of
the ...[Details]
Most of the houses we live in now are elevator buildings, mainly because it is more convenient to go up and down the stairs! It can also make life more comfortable. It even helps to increase the ad...[Details]
On August 22, according to the Ministry of Industry and Information Technology's official website, my country's first mandatory national standard for the control of hazardous substances in electric...[Details]
Tires are a very important component for cars. They are related to the driving experience of the vehicle. We are almost inseparable from cars in our daily lives. For tires, according to the role of...[Details]
A patent disclosed by Ford proposes replacing traditional segmented side curtain airbags with integrated full-width side curtain airbags that span the side of the vehicle and can be deployed simult...[Details]
Inverter power supplies on the market can generally be divided into two categories: sine wave inverters and square wave inverters. Some engineers also like to categorize pure sine wave inverters as...[Details]
Civilian internal combustion engines operate in the range of approximately 1000-4000 rpm. This results in the engine's kinetic energy being ineffective at low or high rpm, making starting difficult...[Details]
AI distributed rendering architecture improves mobile phone rendering capabilities, and game performance tests can check frame generation indicators in real time
Shanghai, China, Aug...[Details]
With the prevalence of online conferencing, live streaming, and voice communication in gaming, high-quality audio input devices are becoming increasingly important. To this end, XMOS, an expert in ...[Details]
Since the beginning of the 21st century, with the rapid development of my country's urban and rural economies and the improvement of people's living standards, more and more people have begun to ow...[Details]
Today, the voltage of electronic products continues to rise to 400V, 600V and even 1000V, so there are few electronic load models that can handle such high voltages. Many people consider connecting...[Details]
With rapid economic development, the types of pollution sources are increasing, especially in chemical and industrial zones and their surroundings. The patterns of pollution and the types of ecolog...[Details]
Servo motors, also known as actuator motors, serve as actuators in automatic control systems, converting received electrical signals into angular displacement or angular velocity output on the moto...[Details]
Shock absorbers, as the name implies, are responsible for cushioning and absorbing shocks in a car. So how much do you know about shock absorbers and how to replace them in electric cars?
...[Details]
Function (FC) parameters
Functions do not have data memory in which to store the values of block parameters. Therefore, when calling a function, all formal parameters must be assigned actual p...[Details]
Analogue and Mixed Signal
京公网安备 11010802033920号
EEWORLD
