EEWORLDEEWORLDEEWORLD

Part Number

Search

307URA250P2

Description
300 A, 2500 V, SILICON, RECTIFIER DIODE, DO-205AB
CategoryDiscrete semiconductor    diode   
File Size101KB,8 Pages
ManufacturerInternational Rectifier ( Infineon )
Websitehttp://www.irf.com/
Download Datasheet Parametric View All

307URA250P2 Overview

300 A, 2500 V, SILICON, RECTIFIER DIODE, DO-205AB

307URA250P2 Parametric

Parameter NameAttribute value
Is it lead-free?Contains lead
Is it Rohs certified?incompatible
MakerInternational Rectifier ( Infineon )
package instructionO-MUPM-H1
Reach Compliance Codecompliant
ECCN codeEAR99
applicationGENERAL PURPOSE
Shell connectionANODE
ConfigurationSINGLE
Diode component materialsSILICON
Diode typeRECTIFIER DIODE
JEDEC-95 codeDO-205AB
JESD-30 codeO-MUPM-H1
JESD-609 codee0
Maximum non-repetitive peak forward current5330 A
Number of components1
Phase1
Number of terminals1
Maximum operating temperature180 °C
Minimum operating temperature-40 °C
Maximum output current300 A
Package body materialMETAL
Package shapeROUND
Package formPOST/STUD MOUNT
Peak Reflow Temperature (Celsius)NOT SPECIFIED
Certification statusNot Qualified
Maximum repetitive peak reverse voltage2500 V
surface mountNO
Terminal surfaceTIN LEAD
Terminal formHIGH CURRENT CABLE
Terminal locationUPPER
Maximum time at peak reflow temperatureNOT SPECIFIED
Base Number Matches1
Bulletin I2032/A
301U(R) SERIES
STANDARD RECOVERY DIODES
Stud Version
Features
Wide current range
High voltage ratings up to 2500V
High surge current capabilities
Stud cathode and stud anode version
300A
Typical Applications
Converters
Power supplies
Machine tool controls
High power drives
Medium traction applications
Major Ratings and Characteristics
301U(R)
Parameters
I
F(AV)
@ T
C
I
F(RMS)
I
FSM
@ 50Hz
@ 60Hz
I
2
t
@ 50Hz
@ 60Hz
V
RRM
range
T
J
80 to 200
330
120
520
8250
8640
340
311
800 to 2000
- 40 to 180
250
300
120
470
6050
6335
183
167
2500
- 40 to 180
Units
A
°C
A
A
A
KA
2
s
KA
2
s
V
°C
case style
DO-205AB (DO-9)
Accelerate FPGA design timing closure using graph-based physical synthesis
Traditional synthesis techniques are increasingly unable to meet the needs of today's very large and complex FPGA designs implemented in 90nm and below process nodes. The problem is that traditional F...
songrisi FPGA/CPLD
Reliability Analysis Using Six Sigma Software JMP
Time: 2010-07-05 10:15:35 Source: EEPW Author: Reliability is a problem that exists in every link of product design, manufacturing and use. Simply put, reliability is the degree to which a product is ...
安_然 Test/Measurement
Those who are familiar with fat32 please come in--waiting online
I am currently developing a USB flash drive using K9F2G08X0 flash memory. The flash memory is 256M in size, with a total of 2048 blocks, each with 64 pages. This means each block is 128K. However, the...
hconfeng Embedded System
What are the main contents of the chip DATASHEET?
What are the main contents of the chip DATASHEET?...
beyondaymk Embedded System
AVR AD conversion program
I just learned AVR, and many programs I downloaded always have compilation errors and cannot be used. This AD conversion program is corrected by me. Share it with friends who are just learning AVR lik...
gina Microchip MCU
Answer the questions to win prizes! ADI Application Tour - Smoke Detection
Smart building technology is evolving to transform static buildings into dynamic and efficient entities, the so-called smart buildings. Under the influence of mega trends such as green buildings, zero...
EEWORLD社区 Sensor

EEWorld
subscription
account

EEWorld
service
account

Automotive
development
circle

Robot
development
community

Index Files: 2053  1169  884  96  2112  42  24  18  2  43 
Datasheet   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Room 1530, 15th Floor, Building B, No. 18 Zhongguancun Street, Haidian District, Beijing Telephone: (010) 82350740 Postal Code: 100190
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved 京ICP证060456号 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号