without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to
obtain the latest version of this device specification before relying on any published information and before placing orders for products.
Integrated Silicon Solution, Inc. does not recommend the use of any of its products in life support applications where the failure or malfunction of the product can
reasonably be expected to cause failure of the life support system or to significantly affect its safety or effectiveness. Products are not authorized for use in such
applications unless Integrated Silicon Solution, Inc. receives written assurance to its satisfaction, that:
a.) the risk of injury or damage has been minimized;
b.) the user assume all such risks; and
c.) potential liability of Integrated Silicon Solution, Inc is adequately protected under the circumstances
Integrated Silicon Solution, Inc.-
www.issi.com
Rev. A
11/20/2016
1
IS61/64WV102416EDALL
IS61/64WV102416EDBLL
PIN CONFIGURATIONS
48-Pin mini BGA(6mm x 8mm), A19 on G2
(Package Code : B)
1
2
3
4
5
6
48-Pin mini BGA (6mm x 8mm) , A19 on G2, ERR1/2
(Package Code : B2)
1
2
3
4
5
6
A
LB#
OE#
A0
A1
A2
NC
A
LB#
OE#
A0
A1
A2
NC
B
I/O8
UB#
A3
A4
CS#
I/O0
B
I/O8
UB#
A3
A4
CS#
I/O0
C
D
I/O9
I/O10
A5
A6
I/O1
I/O2
C
D
I/O9
I/O10
A5
A6
I/O1
I/O2
VSS
I/O11
A17
A7
I/O3
VDD
VSS
I/O11
A17
A7
I/O3
VDD
E
VDD
I/O12
NC
A16
I/O4
VSS
E
VDD
I/O12
ERR1
A16
I/O4
VSS
F
I/O14
I/O13
A14
A15
I/O5
I/O6
F
I/O14
I/O13
A14
A15
I/O5
I/O6
G
I/O15
A19
A12
A13
WE#
I/O7
G
I/O15
A19
A12
A13
WE#
I/O7
H
A18
A8
A9
A10
A11
NC
H
A18
A8
A9
A10
A11
ERR2
48-Pin mini BGA(6mm x 8mm), A19 on H6
(Package Code : B3)
1
2
3
4
5
6
48-Pin mini BGA (6mm x 8mm) , A19 on H6, ERR1/2
(Package Code : B4)
1
2
3
4
5
6
A
LB#
OE#
A0
A1
A2
NC
A
LB#
OE#
A0
A1
A2
NC
B
I/O8
UB#
A3
A4
CS#
I/O0
B
I/O8
UB#
A3
A4
CS#
I/O0
C
I/O9
I/O10
A5
A6
I/O1
I/O2
C
I/O9
I/O10
A5
A6
I/O1
I/O2
D
VSS
I/O11
A17
A7
I/O3
VDD
D
VSS
I/O11
A17
A7
I/O3
VDD
E
VDD
I/O12
NC
A16
I/O4
VSS
E
VDD
I/O12
ERR1
A16
I/O4
VSS
F
I/O14
I/O13
A14
A15
I/O5
I/O6
F
I/O14
I/O13
A14
A15
I/O5
I/O6
G
I/O15
NC
A12
A13
WE#
I/O7
G
I/O15
ERR2
A12
A13
WE#
I/O7
H
A18
A8
A9
A10
A11
A19
H
A18
A8
A9
A10
A11
A19
Integrated Silicon Solution, Inc.-
www.issi.com
Rev. A
11/20/2016
2
IS61/64WV102416EDALL
IS61/64WV102416EDBLL
48-Pin TSOP-I
48-Pin TSOP-I with ERR1/ERR2
A4
A3
A2
1
48
A5
A6
A7
A8
OE#
A4
A3
A2
1
2
3
4
48
A5
A6
A7
A8
OE#
2
3
4
47
46
47
46
A1
A0
NC
45
44
43
42
A1
A0
ERR1
45
44
43
42
41
5
6
7
5
6
CS#
I/O0
I/O1
I/ O2
UB#
LB#
I/O15
8
9
41
40
CS#
I/O0
I/O1
I/O2
I/O3
VDD
7
8
UB#
LB#
I/O15
I/O14
I/O13
I/O12
VSS
I/O14
I/O13
I/O12
VSS
9
10
11
40
39
I/O3
VDD
10
11
12
13
14
15
39
38
37
36
35
12
13
14
15
16
17
38
37
36
35
34
33
32
VSS
I/O4
I/O5
I/O6
VDD
I/O11
VSS
I/O4
I/O5
I/O6
I/O7
VDD
I/O11
I/O10
34
33
32
31
30
I/O10
I/O9
16
17
18
19
20
21
22
23
24
I/O9
I/O8
I/O7
WE#
NC
I/O8
NC
A9
A10
A11
WE#
ERR2
A19
18
19
20
21
22
23
24
31
30
29
28
27
26
25
NC
A9
A10
A11
A12
A13
A14
A19
A18
A17
A16
A15
29
28
27
26
25
A12
A13
A14
A18
A17
A16
A15
PIN DESCRIPTIONS
A0-A19
I/O0-I/O15
CS#
OE#
WE#
LB#
UB#
ERR1
ERR2
NC
V
DD
VSS
Address Inputs
Data Inputs/Outputs
Chip Enable Input
Output Enable Input
Write Enable Input
Lower-byte Control
(I/O0-I/O7)
Upper-byte Control
(I/O8-I/O15)
1-bit Error Detection and
Correction Signal
2-bit ERR Detection Signal
No Connection
Power
Ground
Integrated Silicon Solution, Inc.-
www.issi.com
Rev. A
11/20/2016
3
IS61/64WV102416EDALL
IS61/64WV102416EDBLL
FUNCTION DESCRIPTION
SRAM is one of random access memories. Each byte or word has an address and can be accessed randomly. SRAM
has three different modes supported. Each function is described below with Truth Table.
STANDBY MODE
Device enters standby mode when deselected (CS# HIGH). The input and output pins (I/O0-15) are placed in a high
impedance state. CMOS input in this mode will maximize saving power.
WRITE MODE
Write operation issues with Chip selected (CS#) and Write Enable (WE#) input LOW. The input and output pins (I/O0-
15) are in data input mode. Output buffers are closed during this time even if OE# is LOW. UB# and LB# enables a
byte write feature. By enabling LB# LOW, data from I/O pins (I/O0 through I/O7) are written into the location specified
on the address pins. And with UB# being LOW, data from I/O pins (I/O8 through I/O15) are written into the location.
READ MODE
Read operation issues with Chip selected (CS# LOW) and Write Enable (WE#) input HIGH. When OE# is LOW, output
buffer turns on to make data output. Any input to I/O pins during READ mode is not permitted. UB# and LB# enables a
byte read feature. By enabling LB# LOW, data from memory appears on I/O0-7. And with UB# being LOW, data from
memory appears on I/O8-15.
In the READ mode, output buffers can be turned off by pulling OE# HIGH. In this mode, internal device operates as
READ but I/Os are in a high impedance state. Since device is in READ mode, active current is used.
ERROR DETECTION AND ERROR CORRECTION
Independent ECC per each byte
-
detect and correct one bit error per byte or detect 2-bit error per byte
Optional ERR1 output signal indicates 1-bit error detection and correction
Optional ERR2 output signal indicates 2-bit error detection.
Controller can use either ERR1 or ERR2 to monitor ECC event. Unused pins (ERR1 or ERR2) can be left
floating.
Better reliability than parity code schemes which can only detect an error but not correct an error
Backward Compatible: Drop in replacement to current in industry standard devices (without ECC)
ERR1, ERR2 OUTPUT SIGNAL BEHAVIOR
ERR1
0
1
0
1
High-Z
ERR2
0
0
1
1
High-Z
DQ pin
Status
Remark
Valid Q No Error
Valid Q 1-Bit Error only
In-Valid Q 2-Bit Error only
1-bit error per byte detected and corrected
No 1-bit error. 2-bit error per byte detected (out of 2 bytes)
In-Valid Q 1-bit & 2-bit error 1-bit error detected and corrected at one byte, and 2-bit error detected at another byte.
Valid D Non-Read
Write operation or Output Disabled
Integrated Silicon Solution, Inc.-
www.issi.com
Rev. A
11/20/2016
4
IS61/64WV102416EDALL
IS61/64WV102416EDBLL
TRUTH TABLE
Mode
Not Selected
Output Disabled
L
L
Read
L
L
L
Write
L
L
H
H
H
H
L
L
L
H
L
L
L
X
X
X
H
L
H
L
L
H
L
L
H
L
L
H
L
L
High-Z
DOUT
High-Z
DOUT
DIN
High-Z
DIN
High-Z
High-Z
DOUT
DOUT
High-Z
DIN
DIN
ICC
ICC
CS#
H
L
WE#
X
H
OE#
X
H
LB#
X
L
UB#
X
L
I/O0-I/O7
High-Z
High-Z
I/O8-I/O15
High-Z
High-Z
ICC
VDD Current
I
SB1,
I
SB2
POWER UP INITIALIZATION
The device includes on-chip voltage sensor used to launch POWER-UP initialization process.
When VDD reaches stable level, the device requires 150us of tPU (Power-Up Time) to complete its self-initialization
process.
When initialization is complete, the device is ready for normal operation.
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