1 Mbit (64K x16) Multi-Purpose Flash
SST39LF100 / SST39VF100
SST39LF/VF1003.0 & 2.7V 1 Mb (x16) MPF memories
Data Sheet
FEATURES:
• Organized as 64K x16
• Single Voltage Read and Write Operations
– 3.0-3.6V for SST39LF100
– 2.7-3.6V for SST39VF100
• Superior Reliability
– Endurance: 100,000 Cycles (typical)
– Greater than 100 years Data Retention
• Low Power Consumption
– Active Current: 20 mA (typical)
– Standby Current: 3 µA (typical)
• Sector-Erase Capability
– Uniform 2 KWord sectors
• Fast Read Access Time
– 45 ns for SST39LF100
– 70 ns for SST39VF100
• Latched Address and Data
• Fast Erase and Word-Program
– Sector-Erase Time: 18 ms (typical)
– Chip-Erase Time: 70 ms (typical)
– Word-Program Time: 14 µs (typical)
– Chip Rewrite Time: 1 second (typical)
• Automatic Write Timing
– Internal V
PP
Generation
• End-of-Write Detection
– Toggle Bit
– Data# Polling
• CMOS I/O Compatibility
• JEDEC Standard Command Sets
• Packages Available
– 40-lead TSOP (10mm x 14mm)
– 48-ball TFBGA (6mm x 8mm)
PRODUCT DESCRIPTION
The SST39LF/VF100 devices are 64K x16 CMOS Multi-
Purpose Flash (MPF) manufactured with SST’s proprietary,
high performance CMOS SuperFlash technology. The
split-gate cell design and thick oxide tunneling injector
attain better reliability and manufacturability compared with
alternate
approaches.
The
SST39LF100
and
SST39VF100 write (Program or Erase) with a single volt-
age power supply of 3.0-3.6V and 2.7-3.6V, respectively.
Featuring high performance Word-Program, the SST39LF/
VF100 devices provide a typical Word-Program time of 14
µsec. The devices use Toggle Bit or Data# Polling to detect
the completion of the Program or Erase operation. To pro-
tect against inadvertent write, the SST39LF/VF100 have
on-chip hardware and software data protection schemes.
Designed, manufactured, and tested for a wide spectrum of
applications, the SST39LF/VF100 are offered with a guar-
anteed endurance of 10,000 cycles. Data retention is rated
at greater than 100 years.
The SST39LF/VF100 devices are suited for applications
that require convenient and economical updating of pro-
gram, configuration, or data memory. For all system appli-
cations, the SST39LF/VF100 significantly improve
performance and reliability, while lowering power consump-
tion. The SST39LF/VF100 inherently use less energy dur-
ing Erase and Program than alternative flash technologies.
The total energy consumed is a function of the applied volt-
age, current, and time of application. Since for any given
voltage range, the SuperFlash technology uses less cur-
rent to program and has a shorter erase time, the total
©2001 Silicon Storage Technology, Inc.
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363
1
energy consumed during any Erase or Program operation
is less than alternative flash technologies. The SST39LF/
VF100 also improve flexibility while lowering the cost for
program, data, and configuration storage applications.
The SuperFlash technology provides fixed Erase and Pro-
gram times, independent of the number of Erase/Program
cycles that have occurred. Therefore the system software
or hardware does not have to be modified or de-rated as is
necessary with alternative flash technologies, whose Erase
and Program times increase with accumulated Erase/Pro-
gram cycles.
To meet surface mount requirements, the SST39LF/VF100
are offered in 40-lead TSOP and 48-ball TFBGA packages.
See Figure 1 for pinout.
Device Operation
Commands are used to initiate the memory operation func-
tions of the device. Commands are written to the device
using standard microprocessor write sequences. A com-
mand is written by asserting WE# low while keeping CE#
low. The address bus is latched on the falling edge of WE#
or CE#, whichever occurs last. The data bus is latched on
the rising edge of WE# or CE#, whichever occurs first.
The SST logo and SuperFlash are registered trademarks of Silicon Storage Technology, Inc.
MPF is a trademark of Silicon Storage Technology, Inc.
These specifications are subject to change without notice.
1 Mbit Multi-Purpose Flash
SST39LF100 / SST39VF100
Data Sheet
Read
The Read operation of the SST39LF/VF100 is controlled
by CE# and OE#, both have to be low for the system to
obtain data from the outputs. CE# is used for device selec-
tion. When CE# is high, the chip is deselected and only
standby power is consumed. OE# is the output control and
is used to gate data from the output pins. The data bus is in
high impedance state when either CE# or OE# is high.
Refer to the Read cycle timing diagram for further details
(Figure 2).
Chip-Erase Operation
The SST39LF/VF100 provide a Chip-Erase operation,
which allows the user to erase the entire memory array to
the “1” state. This is useful when the entire device must be
quickly erased.
The Chip-Erase operation is initiated by executing a six-
byte command sequence with Chip-Erase command (10H)
at address 5555H in the last byte sequence. The Erase
operation begins with the rising edge of the sixth WE# or
CE#, whichever occurs first. During the Erase operation,
the only valid read is Toggle Bit or Data# Polling. See Table
4 for the command sequence, Figure 7 for timing diagram,
and Figure 16 for the flowchart. Any commands issued dur-
ing the Chip-Erase operation are ignored.
Word-Program Operation
The SST39LF/VF100 are programmed on a word-by-word
basis. Before programming, one must ensure that the sec-
tor in which the word is programmed is erased. The Pro-
gram operation consists of three steps. The first step is the
three-byte load sequence for Software Data Protection.
The second step is to load word address and word data.
During the Word-Program operation, the addresses are
latched on the falling edge of either CE# or WE#, which-
ever occurs last. The data is latched on the rising edge of
either CE# or WE#, whichever occurs first. The third step is
the internal Program operation which is initiated after the
rising edge of the fourth WE# or CE#, whichever occurs
first. The Program operation, once initiated, will be com-
pleted within 20 µs. See Figures 3 and 4 for WE# and CE#
controlled Program operation timing diagrams and Figure
13 for flowcharts. During the Program operation, the only
valid reads are Data# Polling and Toggle Bit. During the
internal Program operation, the host is free to perform addi-
tional tasks. Any commands issued during the internal Pro-
gram operation are ignored.
Write Operation Status Detection
The SST39LF/VF100 provide two software means to
detect the completion of a Write (Program or Erase) cycle,
in order to optimize the system write cycle time. The soft-
ware detection includes two status bits: Data# Polling
(DQ
7
) and Toggle Bit (DQ
6
). The End-of-Write detection
mode is enabled after the rising edge of WE#, which ini-
tiates the internal program or erase operation.
The actual completion of the nonvolatile write is asynchro-
nous with the system; therefore, either a Data# Polling or
Toggle Bit read may be simultaneous with the completion
of the write cycle. If this occurs, the system may possibly
get an erroneous result, i.e., valid data may appear to con-
flict with either DQ
7
or DQ
6
. In order to prevent spurious
rejection, if an erroneous result occurs, the software routine
should include a loop to read the accessed location an
additional two (2) times. If both reads are valid, then the
device has completed the Write cycle, otherwise the rejec-
tion is valid.
Sector-Erase Operation
The Sector-Erase operation allows the system to erase the
device on a sector-by-sector basis. The sector architecture
is based on uniform sector size of 2 KWord. The Sector-
Erase operation is initiated by executing a six-byte com-
mand sequence with Sector-Erase command (30H) and
sector address (SA) in the last bus cycle. The address lines
A
11
-A
15
are used to determine the sector address. The
sector address is latched on the falling edge of the sixth
WE# pulse, while the command (30H) is latched on the ris-
ing edge of the sixth WE# pulse. The internal Erase opera-
tion begins after the sixth WE# pulse. The End-of-Erase
operation can be determined using either Data# Polling or
Toggle Bit methods. See Figure 8 for timing waveforms.
Any commands issued during the Sector-Erase operation
are ignored.
Data# Polling (DQ
7
)
When the SST39LF/VF100 are in the internal Program
operation, any attempt to read DQ
7
will produce the com-
plement of the true data. Once the Program operation is
completed, DQ
7
will produce true data. The device is then
ready for the next operation. During internal Erase opera-
tion, any attempt to read DQ
7
will produce a ‘0’. Once the
internal Erase operation is completed, DQ
7
will produce a
‘1’. The Data# Polling is valid after the rising edge of fourth
WE# (or CE#) pulse for Program operation. For Sector- or
Chip-Erase, the Data# Polling is valid after the rising edge
of sixth WE# (or CE#) pulse. See Figure 5 for Data# Polling
timing diagram and Figure 14 for a flowchart.
©2001 Silicon Storage Technology, Inc.
S71129-02-000 6/01
363
2
1 Mbit Multi-Purpose Flash
SST39LF100 / SST39VF100
Data Sheet
Toggle Bit (DQ
6
)
During the internal Program or Erase operation, any con-
secutive attempts to read DQ
6
will produce alternating 1s
and 0s, i.e., toggling between 1 and 0. When the internal
Program or Erase operation is completed, the DQ
6
bit will
stop toggling. The device is then ready for the next opera-
tion. The Toggle Bit is valid after the rising edge of fourth
WE# (or CE#) pulse for Program operation. For Sector- or
Chip-Erase, the Toggle Bit is valid after the rising edge of
sixth WE# (or CE#) pulse. See Figure 6 for Toggle Bit tim-
ing diagram and Figure 14 for a flowchart.
Table 4 for software operation, Figure 9 for the Software ID
Entry and Read timing diagram, and Figure 15 for the Soft-
ware ID Entry command sequence flowchart.
TABLE 1: P
RODUCT
I
DENTIFICATION
Address
Manufacturer’s ID
Device ID
SST39LF/VF100
0001H
2788H
T1.3 363
Data
00BFH
0000H
Data Protection
The SST39LF/VF100 provide both hardware and software
features to protect nonvolatile data from inadvertent writes.
Product Identification Mode Exit/
CFI Mode Exit
In order to return to the standard Read mode, the Software
Product Identification mode must be exited. Exit is accom-
plished by issuing the Software ID Exit command
sequence, which returns the device to the Read mode.
This command may also be used to reset the device to the
Read mode after any inadvertent transient condition that
apparently causes the device to behave abnormally, e.g.,
not read correctly. Please note that the Software ID Exit/
CFI Exit command is ignored during an internal Program or
Erase operation. See Table 4 for software command
codes, Figure 10 for timing waveform and Figure 15 for a
flowchart.
Hardware Data Protection
Noise/Glitch Protection: A WE# or CE# pulse of less than 5
ns will not initiate a Write cycle.
V
DD
Power Up/Down Detection: The Write operation is
inhibited when V
DD
is less than 1.5V.
Write Inhibit Mode: Forcing OE# low, CE# high, or WE#
high will inhibit the Write operation. This prevents inadvert-
ent Writes during power-up or power-down.
Software Data Protection (SDP)
The SST39LF/VF100 provide the JEDEC approved Soft-
ware Data Protection scheme for all data alteration opera-
tions, i.e., Program and Erase. Any Program operation
requires the inclusion of the three-byte sequence. The
three-byte load sequence is used to initiate the Program
operation, providing optimal protection from inadvertent
Write operations, e.g., during the system power-up or
power-down. Any Erase operation requires the inclusion of
six-byte sequence. The SST39LF/VF100 devices are
shipped with the Software Data Protection permanently
enabled. See Table 4 for the specific software command
codes. During SDP command sequence, invalid com-
mands will abort the device to Read mode within T
RC
. The
contents of DQ
15
-DQ
8
are “Don’t Care” during any SDP
command sequence.
Product Identification
The Product Identification mode identifies the devices as
SST39LF100 and SST39VF100 and manufacturer as SST.
This mode may be accessed by software operations.
Users may use the Software Product Identification opera-
tion to identify the part (i.e., using the device ID) when using
multiple manufacturers in the same socket. For details, see
©2001 Silicon Storage Technology, Inc.
S71129-02-000 6/01
363
3
1 Mbit Multi-Purpose Flash
SST39LF100 / SST39VF100
Data Sheet
F
UNCTIONAL
B
LOCK
D
IAGRAM
X-Decoder
SuperFlash
Memory
A0-A15
Address Buffer & Latches
Y-Decoder
CE#
OE#
WE#
DQ15 - DQ0
363 ILL B1.2
Control Logic
I/O Buffers and Data Latches
A9
A10
A11
A12
A13
A14
A15
NC
WE#
VDD
NC
CE#
DQ15
DQ14
DQ13
DQ12
DQ11
DQ10
DQ9
DQ8
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
Standard Pinout
Top View
Die Up
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
21
VSS
A8
A7
A6
A5
A4
A3
A2
A1
A0
OE#
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
VSS
SST39LF100/SST39VF100
363 ILL F01.3
TOP VIEW (balls facing down)
SST39LF/VF100
6
5
4
3
2
1
A13 A12 A14
A9
A8
A10
NC
NC
A6
A2
A15
NC
NC DQ15 VSS
A11 DQ7 DQ14 DQ13 DQ6
NC DQ5 DQ12 VDD DQ4
NC DQ2 DQ10 DQ11 DQ3
A5
A1
DQ0 DQ8 DQ9 DQ1
A0 CE# OE# VSS
363 ILL F02b.1
WE# NC
NC
A7
A3
NC
NC
A4
A
B
C
D
E
F
G
H
FIGURE 1: P
IN
A
SSIGNMENTS FOR
40-
LEAD
TSOP
AND
48-
BALL
TFBGA
©2001 Silicon Storage Technology, Inc.
S71129-02-000 6/01
363
4
1 Mbit Multi-Purpose Flash
SST39LF100 / SST39VF100
Data Sheet
TABLE 2: P
IN
D
ESCRIPTION
Symbol
A
15
-A
0
DQ
15
-DQ
0
Pin Name
Address Inputs
Data Input/output
Functions
To provide memory addresses.
During Sector-Erase A
15
-A
11
address lines will select the sector.
To output data during Read cycles and receive input data during Write cycles.
Data is internally latched during a Write cycle.
The outputs are in tri-state when OE# or CE# is high.
To activate the device when CE# is low.
To gate the data output buffers.
To control the Write operations.
To provide power supply voltage:
3.0-3.6V for SST39LF100
2.7-3.6V for SST39VF100
CE#
OE#
WE#
V
DD
V
SS
NC
Chip Enable
Output Enable
Write Enable
Power Supply
Ground
No Connection
Unconnected pins.
T2.2 363
TABLE 3: O
PERATION
M
ODES
S
ELECTION
Mode
Read
Program
Erase
Standby
Write Inhibit
Product Identification
Software Mode
V
IL
V
IL
V
IH
See Table 4
T3.2 363
CE#
V
IL
V
IL
V
IL
V
IH
X
X
OE#
V
IL
V
IH
V
IH
X
V
IL
X
WE#
V
IH
V
IL
V
IL
X
X
V
IH
DQ
D
OUT
D
IN
X
1
High Z
High Z/ D
OUT
High Z/ D
OUT
Address
A
IN
A
IN
Sector or Block address,
XXH for Chip-Erase
X
X
X
1. X can be V
IL
or V
IH
, but no other value.
©2001 Silicon Storage Technology, Inc.
S71129-02-000 6/01
363
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